OOIR: Observatory of International Research

Papers

(The H4-Index of IEEE Transactions on Electron Devices is 41. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-06-01 to 2025-06-01.)

Article	Citations
SiC Trench MOSFET With Embedded Schottky Super Barrier Rectifier for High Temperature Ruggedness	104
Utilizing Valley–Spin Hall Effect in Monolayer WSe₂ for Designing Low Power Nonvolatile Spintronic Devices and Flip-Flops	97
Effect of Microwave Leakage on Backward Current in an X-Band Dual-Mode RBWO Packaged With Permanent Magnet	89
Characterization of Trapping Effects Related to Carbon Doping Level in AlGaN Back-Barriers for AlGaN/GaN HEMTs	84
Influence of BCB Protection on Irradiation Response of InP-Based HEMTs: A Comparative Study	80
Compact Modeling of Impact Ionization and Conductivity Modulation in LDMOS Transistors	79
Capacitance Modeling With Charge Partitions Covering Full-Region Operations of TFETs	76
Demonstration of Reconfigurable FET and Logic Gates on Epitaxial Lateral Overgrowth Silicon Platform	76
Pd/Ge/Ti/Pt/Au Metal Stack on Semi-Insulating Gallium Arsenide: Ohmic Contact and Temperature Dependence	71
A High Voltage Gain Inverter Integrated With Enhancement- and Depletion-Mode a-InGaZnO Thin-Film Transistors	60
Investigation on Robust Avalanche Capacity of Super-Junction IGBT Under UIS Stress	60
The Regime of the Efficiency Increase by Use of Long Circuits in the THz Cherenkov Oscillator	59
Effect of Biaxial Bending Strains on the Electrical Characteristics of Flexible Low-Temperature Polysilicon Thin-Film Transistors	58
Changes in the Editorial Board	53
Study of the Input Cavity Characteristics With Two-Beam Loading for Developing a Compact and High-Power Ka-Band Klystron	53
IEEE Transactions on Electron Devices publication information	52
2021 EDS Education Award call for nominations	51
IEEE Transactions on Electron Devices information for authors	50
Performance Analysis of the Direct-Charge β-Radiation Energy-Harvesting Method	49
Compensating Nonuniform OLED Pixel Brightness in a Vertical Blanking Interval by Learning TFT Characteristics	49
Accurate and Efficient Algorithm for Computing Structure Functions From the Spatial Distribution of Thermal Properties in Electronic Devices	49
Design of Novel InP/InGaAs Photodetectors With NiO Transparent p-Region and Electrode	48
Effect of Source/Drain Electrode Materials on the Electrical Performance and Stability of Amorphous Indium-Tin-Zinc-Oxide FETs	47
Tight-Binding Device Modeling of 2-D Topological Insulator Field-Effect Transistors With Gate-Induced Phase Transition	47
Suppression of Circularly Polarized Microwave Dielectric Multipactor by Normal Gyromagnetic Field	46

Analysis of the Avalanche Operation of a GaN Photoconductive Semiconductor Switch	46
Compact Numerical Modeling of Indirect Time-of-Flight CMOS Image Sensors	46
Three-Dimensional Design of a 4H-SiC NPN Lateral Phototransistor for Micro-Pixel in Ultraviolet Optoelectronic Integration	45
Mitigation of Parasitic Light Sensitivity in Global Shutter CMOS Image Sensors Through Use of Correction Frame	45
Improved Performance of MoS₂ Negative-Capacitance Field-Effect Transistors by Optimizing Gate-Stack of Al-Doped HfO₂/Al₂O₃	45
Design and Characterization of n/p-well CMOS SPAD With Low Dark Count Rate and High Photon Detection Efficiency	45
Model of Finite Velocity Injection Into Coaxial Cylindrical Diode Based on Ramo-Shockley Theory	45
Orientation Polarization Effect in Al₂O₃/Hydrogen-Terminated Diamond MISFETs	44
Gate Oxide Instability of 4H-SiC p-Channel MOSFET Induced by AC Stress at 200 °C	44
A 0.35-THz Extended Interaction Oscillator Based on Overmoded and Bi-Periodic Structure	43
Cyclotron Resonance Maser With Zigzag Quasi-Optical Transmission Line: Concept and Modeling	43
Investigation of Bending-Induced Degradation of Flexible AlGaN/GaN HEMTs	42
Roles of Trap States in the Dynamic Degradation of Polycrystalline Silicon Thin-Film Transistors Under AC Gate Bias Stress	42
Mobility Enhancement Induced by Oxygen Gettering of TiAl for Metal Gated NMOSFETs	42
Numerical Analysis for a P-Drift Region N-IGBT With Enhanced Dynamic Electric Field Modulation Effect	41
A True Random Number Generator Based on High-Speed Ag/a-Si/Pt Memristor	41
The Reliability and Noise Investigation of Boron Diffusion Under Positive Bias Temperature Instability in 16 nm Node High Voltage FinFETs	41
Design and Testing of Metal Photocathode X-Ray Source Based on Microchannel Plate	41
A Physics-Based Compact Model for Silicon Cold-Source Transistors	41