Ultramicroscopy

Papers
(The H4-Index of Ultramicroscopy is 18. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2022-06-01 to 2026-06-01.)
ArticleCitations
Methodology and implementation of a tunable deep-ultraviolet laser source for photoemission electron microscopy39
An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps39
Editorial Board36
Nano1D: An accurate computer vision software for analysis and segmentation of low-dimensional nanostructures34
Non-contact non-resonant atomic force microscopy method for measurements of highly mobile molecules and nanoparticles32
Unraveling van der Waals epitaxy: A real-time in-situ study of MoSe2 growth on graphene/Ru(0001)28
Uncovering polar vortex structures by inversion of multiple scattering with a stacked Bloch wave model25
On central focusing for contrast optimization in direct electron ptychography of thick samples23
espm: A Python library for the simulation of STEM-EDXS datasets23
Development of precession Lorentz transmission electron microscopy23
Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guide23
Characterization of the mechanical properties of the cortex region of human hair fibers by multiparametric atomic force microscopy mapping22
Quantitative composition determination by ADF-STEM at a low-angular regime: a combination of EFSTEM and 4DSTEM21
Can low energy (1–20 eV) electron microscopy produce damage-free images of biological samples?21
Momentum microscopy with combined hemispherical and time-of-flight electron analyzers at the soft X-ray beamline I09 of the diamond light source21
Improving the accuracy of temperature measurement on TEM samples using plasmon energy expansion thermometry (PEET): Addressing sample thickness effects20
Suppression of secondary recoil cascade damage in high-Z/low-Z heterostructures: a mechanism-driven FIB strategy18
Editorial Board18
Calibration-sample free distortion correction of electron diffraction patterns using deep learning18
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