Ultramicroscopy

Papers
(The median citation count of Ultramicroscopy is 2. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-06-01 to 2025-06-01.)
ArticleCitations
Corrigendum to “Electron crystallography of chiral and non-chiral small molecules” [Ultramicroscopy 232 (2022) 113417]58
On central focusing for contrast optimization in direct electron ptychography of thick samples40
Editorial Board36
Uncovering polar vortex structures by inversion of multiple scattering with a stacked Bloch wave model30
Quantitative composition determination by ADF-STEM at a low-angular regime: a combination of EFSTEM and 4DSTEM30
Methodology and implementation of a tunable deep-ultraviolet laser source for photoemission electron microscopy28
Nano1D: An accurate computer vision software for analysis and segmentation of low-dimensional nanostructures24
Non-contact non-resonant atomic force microscopy method for measurements of highly mobile molecules and nanoparticles23
Unraveling van der Waals epitaxy: A real-time in-situ study of MoSe2 growth on graphene/Ru(0001)22
Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guide22
In search of best automated model: Explaining nanoparticle TEM image segmentation21
Characterization of the mechanical properties of the cortex region of human hair fibers by multiparametric atomic force microscopy mapping21
Momentum Microscopy with Combined Hemispherical and Time-of-Flight Electron Analyzers at the Soft X-ray Beamline I09 of the Diamond Light Source20
espm: A Python library for the simulation of STEM-EDXS datasets20
A simple circularity-based approach for nanoparticle size histograms beyond the spherical approximation19
Gun energy filter for a low energy electron microscope18
Development of a liquid-helium free cryogenic sample holder with mK temperature control for autonomous electron microscopy18
L-shell ionization of Cd: Structure of the x-ray emission spectrum18
Improving the accuracy of temperature measurement on TEM samples using plasmon energy expansion thermometry (PEET): Addressing sample thickness effects17
Editorial Board17
Editorial Board16
Prospect for measuring two-dimensional van der Waals magnets by electron magnetic chiral dichroism15
Imaging biological macromolecules in thick specimens: The role of inelastic scattering in cryoEM15
A sorter for electrons based on magnetic elements15
Positioning and atomic imaging of micron-size graphene sheets by a scanning tunneling microscope14
Mapping of lattice distortion in martensitic steel—Comparison of different evaluation methods of EBSD patterns14
Edge-induced excitations in Bi214
Direct investigations of interactions between nucleolins and aptamers on pancreatic cancer and normal cells by atomic force microscopy14
Perimeter procedure to produce average equivalent area grain size14
Accurate magnification determination for cryoEM using gold13
Weld-free mounting of lamellae for electrical biasing operando TEM13
Controlling the parameters of focused ion beam for ultra-precise fabrication of nanostructures13
Multimode Objective Lens for Momentum Microscopy and XPEEM: Theory13
Standardizing resolution definition in scanning helium microscopy13
The characterisation of dental enamel using transmission Kikuchi diffraction in the scanning electron microscope combined with dynamic template matching12
Optimized detector configurations for the reconstruction of phase-contrast images in scanning transmission electron microscopy12
Impact of beam size and diffraction effects in the measurement of long-range electric fields in crystalline samples via 4DSTEM12
Site-specific plan-view TEM lamella preparation of pristine surfaces with a large field of view12
Exploring deep learning models for 4D-STEM-DPC data processing12
Quantitative three-dimensional characterization of critical sizes of non-spherical TiO2 nanoparticles by using atomic force microscopy12
Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization12
Commonsense and common nonsense opinions: PROSPECTS for further reducing beam damage in electron microscopy of radiation-sensitive specimens12
The reference window for reduced perturbation of the reference wave in electrical biasing off-axis electron holography12
Editorial Board12
The impact of electric field strength on the accuracy of boron dopant quantification in silicon using atom probe tomography11
Editorial Board11
Regularization techniques for 3D surface reconstruction from four quadrant backscattered electron detector images11
Editorial Board11
Editorial Board11
Minimum-dose phase-contrast tomography by successive numerical optical sectioning employing the aberration-corrected STEM and a pixelated detector11
Editorial Board11
A new method for estimating nanoparticle deposition coverage from a set of weak-contrast SEM images10
Effect of the surrounding environment on electron beam irradiation damage of enhanced green fluorescent protein10
Angstrom-scale imaging of magnetization in antiferromagnetic Fe2As via 4D-STEM10
Evaluation of electron radiation damage to green fluorescent protein10
Role of slice thickness quantification in the 3D reconstruction of FIB tomography data of nanoporous materials10
Data synchronization in operando gas and heating TEM10
Angular dynamics of small nanoparticles induced by non-vortex electron beams10
Analysis of Local Charges at Hetero-interfaces by Electron Holography – A Comparative Study of Different Techniques10
Design of electrostatic lenses through genetic algorithm and particle swarm optimisation methods integrated with differential algebra10
Ultrastructure of antennal sensilla of Anastatus orientalis (Hymenoptera: Eupelmidae), an egg parasitoid of the invasive spotted lanternfly, Lycorma delicatula (Hemiptera: Fulgoridae)10
Photovoltaic and photothermal effects induced by visible laser radiation in atomic force microscopy probes10
Crystal lattice image reconstruction from Moiré sampling scanning transmission electron microscopy9
Preface to special section on imaging, diffraction and crystallography – John Spence's legacy9
Clustering characteristic diffraction vectors in 4-D STEM data sets from overlapping structures in nanocrystalline and amorphous materials9
Gold nanoparticles and tilt pairs to assess protein flexibility by cryo-electron microscopy9
Temporal coherence envelope function of field emission in electron microscopy9
Manganese Migration in Li1-xMn2O4 Cathode Materials9
Parameter dependence of depth and lateral resolution of transmission Kikuchi diffraction9
Editorial Board9
Dynamical diffraction effects of inhomogeneous strain fields investigated by scanning convergent electron beam diffraction and dark field electron holography9
Orientation, pattern center refinement and deformation state extraction through global optimization algorithms9
High-resolution compositional mapping of surfaces in non-contact atomic force microscopy by a new multi-frequency excitation8
Dose measurement in the TEM and STEM8
In situ STEM analysis of electron beam induced chemical etching of an ultra-thin amorphous carbon foil by oxygen during high resolution scanning8
Phase offset method of ptychographic contrast reversal correction8
Reflection imaging with a helium zone plate microscope8
Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential8
The influence of chromatic aberration on the dose-limited spatial resolution of transmission electron microscopy8
Dose symmetric electron diffraction tomography (DS-EDT): Implementation of a dose-symmetric tomography scheme in 3D electron diffraction8
Exploiting the full potential of the advanced two-hexapole corrector for STEM exemplified at 60kV8
An improved method assigning three-dimensional atomic potentials to multiple slices in exit-wave simulations of Transmission Electron Microscopy8
Accuracy and precision of position determination in ISTEM imaging of BaTiO8
Electron ptychography dose reduction using Moiré sampling on periodic structures8
Fiber-optic sample illuminator design for the observation of light induced phenomena with transmission electron microscopy in situ: Antimicrobial photodynamic therapy8
Automated classification of nanoparticles with various ultrastructures and sizes via deep learning8
Theoretical study on sixth-order geometrical aberration correction8
In multi electron beam systems, “Neighbours Matter”8
Editorial Board8
Numerical simulations of field emission characteristics of open CNT8
Workflow automation of SEM acquisitions and feature tracking7
Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Wolfgang Baumeister, Colin Humphreys, John Spence and Knut Urban on the occasion of their 75th, 807
Semicircular-aperture illumination scanning transmission electron microscopy7
Differential phase contrast STEM image calculation software – Magnifier7
Computer vision AC-STEM automated image analysis for 2D nanopore applications7
Coherent and incoherent imaging of biological specimens with electrons and X-rays7
Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy7
Generational assessment of EBSD detectors for cross-correlation-based analysis: From scintillators to direct detection7
Stroboscopic ultrafast imaging using RF strip-lines in a commercial transmission electron microscope7
High-precision atomic-scale strain mapping of nanoparticles from STEM images7
Editorial Board7
Signal detection and imaging methods for MEMS electron microscope7
Strategy for optimizing experimental settings for studying low atomic number colloidal assemblies using liquid phase scanning transmission electron microscopy7
Editorial Board7
Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by scanning precession electron diffraction tomography7
Reaction-diffusion study of electron-beam-induced contamination growth7
Interfacial excess of solutes across phase boundaries using atom probe microscopy7
Inter-Bragg crystallographic phase retrieval from shape transforms, stacking faults and substitutional disorder7
A semi-classical theory of magnetic inelastic scattering in transmission electron energy loss spectroscopy7
In my Good Books7
Directly correlated microscopy of trench defects in InGaN quantum wells7
In-situ characterization of discharge products of lithium-oxygen battery using Flow Electrochemical Atomic Force Microscopy7
Accurate and fast localization of EBSD pattern centers for screen moving technology7
Editorial Board7
Influence of magnetic field on electron beam-induced Coulomb explosion of gold microparticles in transmission electron microscopy7
Near-real-time diagnosis of electron optical phase aberrations in scanning transmission electron microscopy using an artificial neural network6
Real-time electron clustering in an event-driven hybrid pixel detector6
A method for a column-by-column EELS quantification of barium lanthanum ferrate6
Symmetry of diffraction patterns of two-dimensional crystal structures6
High precision orientation mapping from 4D-STEM precession electron diffraction data through quantitative analysis of diffracted intensities6
Spectrum imaging measurements with semi-parallel detection using an AES apparatus6
WRAP: A wavelet-regularised reconstruction algorithm for magnetic vector electron tomography6
Recovery of spatial frequencies in coherent diffraction imaging in the presence of a central obscuration6
A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learning6
Unitary two-state quantum operators realized by quadrupole fields in the electron microscope6
Enhancing classification in correlative microscopy using multiple classifier systems with dynamic selection6
New Poisson denoising method for pulse-count STEM imaging6
Fluctuation cepstral scanning transmission electron microscopy of mixed-phase amorphous materials6
Brightness evaluation of pulsed electron gun using negative electron affinity photocathode developed for time-resolved measurement using scanning electron microscope6
A method for estimating magnetic field of TEM objective lens6
Direct investigations of the electrical conductivity of normal and cancer breast cells by conductive atomic force microscopy6
Editorial Board6
Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy6
Theoretical study on the effect of temperature gradient on contact-free scanning for scanning ion conductance microscopy6
Editorial Board6
Corrigendum to “Structure-preserving Gaussian denoising of FIB-SEM volumes” [Ultramicroscopy Volume 246, 113674]5
TEMGYM Advanced: Software for electron lens aberrations and parallelised electron ray tracing5
A precision manual grinding tool for sample preparation5
Calibrating cryogenic temperature of TEM specimens using EELS5
Interpretability of high-resolution transmission electron microscopy images5
Atom probe specimen preparation methods for nanoparticles5
Site-specific plan-view (S)TEM sample preparation from thin films using a dual-beam FIB-SEM5
Editorial Board5
Parameter retrieval of small particles in dark-field Fourier ptychography and a rectangle in real-space ptychography5
Detecting minute amounts of nitrogen in GaNAs thin films using STEM and CBED5
Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural network5
Extracting transverse electron mean free paths in graphene at low energy5
Editorial Board5
Effective removal of global tilt from atomically-resolved topography images of vicinal surfaces with narrow terraces5
Machine learning based de-noising of electron back scatter patterns of various crystallographic metallic materials fabricated using laser directed energy deposition5
On the instrument-dependent appearance of ion dissociation events in atom probe tomography mass spectra5
Editorial Board5
Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM5
Editorial Board5
Stress effect on the resonance properties of single-crystal diamond cantilever resonators for microscopy applications5
GHz sample excitation at the ALBA-PEEM5
Optimizing image contrast of second phases in metal alloys5
Editorial Board5
A Denoising Autoencoder for Improved Kikuchi Pattern Quality and Indexing in Electron Backscatter Diffraction5
Splicing dual-range EELS spectra: Identifying and correcting artefacts5
WhatEELS. A python-based interactive software solution for ELNES analysis combining clustering and NLLS5
Exploration of fs-laser ablation parameter space for 2D/3D imaging of soft and hard materials by tri-beam microscopy5
Process optimization of broad ion beam milling for preparation of coating cross-sections5
Non-negative matrix factorization-aided phase unmixing and trace element quantification of STEM-EDXS data5
A versatile sample fabrication method for ultrafast electron diffraction5
Atom-by-atom chemical identification from scanning transmission electron microscopy images in presence of noise and residual aberrations5
Three-dimensional stacked filter: A non-linear filter for series images obtained using a transmission electron microscope4
Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors4
A quantitative method for in situ pump-beam metrology in 4D ultrafast electron microscopy4
A precision core drill for transmission electron microscopy sample preparation produced by 3D printing4
Investigation on the precipitate morphology and fraction characterization by atomic force microscopy4
Dimensionality reduction and unsupervised clustering for EELS-SI4
Investigation of thermal effects of laser micromachining for APT and TEM specimen preparation: A modeling and experimental study4
Towards atom counting from first moment STEM images: Methodology and possibilities4
Hystorian: A processing tool for scanning probe microscopy and other n-dimensional datasets4
Accurate post-mortem alignment for Focused Ion Beam and Scanning Electron Microscopy (FIB-SEM) tomography4
Quantifying noise limitations of neural network segmentations in high-resolution transmission electron microscopy4
Identifying and imaging polymer functionality at high spatial resolution with core-loss EELS4
Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN4
Alignment of electron optical beam shaping elements using a convolutional neural network4
Phase imaging in scanning transmission electron microscopy using bright-field balanced divergency method4
Editorial Board4
Single scan STEM-EMCD in 3-beam orientation using a quadruple aperture4
Quantitative STEM: A method for measuring temperature and thickness effects on thermal diffuse scattering using STEM/EELS, and for testing electron scattering models4
Negative stain TEM imaging of native spider silk protein superstructures4
Quantitative amplitude-modulation scanning Kelvin probe microscopy via the second eigenmode excitation4
Haptic sensation-based scanning probe microscopy: Exploring perceived forces for optimal intuition-driven control4
Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings4
Atomically resolved low-temperature scanning tunneling microscope operating in a 22 T water-cooled magnet4
Continuous illumination picosecond imaging using a delay line detector in a transmission electron microscope4
Editorial Board4
Elemental quantification using electron energy-loss spectroscopy with a low voltage scanning transmission electron microscope (STEM-EELS)4
Atomic resolution HOLZ-STEM imaging of atom position modulation in oxide heterostructures4
A high-performance reconstruction method for partially coherent ptychography4
Fabrication and characterization of a miniaturized octupole deflection system for the MEMS electron microscope4
Spectromicroscopic study of the transformation with low energy ions of a hematite thin film into a magnetite/hematite epitaxial bilayer4
Maximizing the notional area in single tip field emitters4
First step toward complex observations by 4D-STEM with phase plate4
Correction of step size dependency in local misorientation obtained by EBSD measurements: Introducing equidistant local misorientation4
The influence of residual plural scattering after deconvolution in electron magnetic chiral dichroism4
A brief peek at the cyclotron in our microscope4
Point field emission electron source with a magnetically focused electron beam3
Visualization of molecular stacking using low-energy electron microscopy3
Programmable comprehensive controller for multi-color 3D confocal spinning-disk image scanning microscope3
Discrimination of coherent and incoherent cathodoluminescence using temporal photon correlations3
Beam shaping and probe characterization in the scanning electron microscope3
Isolated scan unit and scanning tunneling microscope for stable imaging in ultra-high magnetic fields3
Collection of propagating electromagnetic fields by uncoated probe3
Fifth-order asymptotic geometric aberrations of electron lenses3
Measurement of the pattern shifts for HR-EBSD with larger lattice rotations3
Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications3
High-speed multiparametric imaging through off-resonance tapping AFM with active probe3
Origin of giant enhancement of phase contrast in electron holography of modulation-doped 3
Advancing analytical electron microscopy methodologies to characterise microstructural features in superalloys3
The studies on wet chemical etching via in situ liquid cell TEM3
Image based evaluation of textured 3DSEM models3
Computational models of amorphous ice for accurate simulation of cryo-EM images of biological samples3
Removal of silicon-containing contaminants from TEM specimens3
Influence of electron landing energy on the measurement of the dimensional properties of nanoparticle populations imaged by SEM3
Sub-Kelvin thermometry for evaluating the local temperature stability within in situ TEM gas cells3
SIM-STEM Lab: Incorporating Compressed Sensing Theory for Fast STEM Simulation3
Electron-beam-induced charging of an Al23
Ghostbuster: A phase retrieval diffraction tomography algorithm for cryo-EM3
Chemical and cryo-collection of muscle samples for transmission electron microscopy using Methacarn and dimethyl sulfoxide✰3
Neutral helium atom microscopy3
EBSD and TKD analyses using inverted contrast Kikuchi diffraction patterns and alternative measurement geometries3
Quantifying the data quality of focal series for inline electron holography3
An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)3
Integrated wafer-scale manufacturing of electron cryomicroscopy specimen supports3
Strain visualization using large-angle convergent-beam electron diffraction3
Editorial Board3
Editorial Board3
Back illuminated photo emission electron microscopy (BIPEEM)3
Editorial Board3
Editorial Board3
Editorial Board3
Fast reconstruction of scanning transmission electron microscopy images using Markov random field model3
Experimental realization of a π/2 vortex mode converter for electron3
The effect of secondary electrons on radiolysis as observed by in liquid TEM: The role of window material and electrical bias3
Evaluating direct detection detectors for short-range order characterization of amorphous materials by electron scattering3
Optimizing experimental parameters of integrated differential phase contrast (iDPC) for atomic resolution imaging3
Direct measurement of the PSF for Coulomb delocalization – a reconsideration3
Editorial Board3
A mini vibrational polishing machine produced by 3D printing3
Calibrate the non-orthogonal error of AFM with two-dimensional self-traceable grating3
Correlating local chemical and structural order using Geographic Information Systems-based spatial statistics3
High-resolution scanning tunneling microscope and its adaptation for local thermopower measurements in 2D materials3
A versatile machine learning workflow for high-throughput analysis of supported metal catalyst particles3
Reprint of: Inversion of dynamical Bragg intensities to complex structure factors by iterated projections. For Ultramic. 2020. (“Pico” Festschrift, May 2021)3
Properties of blade-like field emitters3
0.17894506454468