Ultramicroscopy

Article	Citations
An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps	39
Non-contact non-resonant atomic force microscopy method for measurements of highly mobile molecules and nanoparticles	38
Nano1D: An accurate computer vision software for analysis and segmentation of low-dimensional nanostructures	36
Methodology and implementation of a tunable deep-ultraviolet laser source for photoemission electron microscopy	31
Uncovering polar vortex structures by inversion of multiple scattering with a stacked Bloch wave model	29
Corrigendum to “Electron crystallography of chiral and non-chiral small molecules” [Ultramicroscopy 232 (2022) 113417]	28
Can low energy (1–20 eV) electron microscopy produce damage-free images of biological samples?	26
Characterization of the mechanical properties of the cortex region of human hair fibers by multiparametric atomic force microscopy mapping	25
Quantitative composition determination by ADF-STEM at a low-angular regime: a combination of EFSTEM and 4DSTEM	23
Momentum microscopy with combined hemispherical and time-of-flight electron analyzers at the soft X-ray beamline I09 of the diamond light source	22
Unraveling van der Waals epitaxy: A real-time in-situ study of MoSe2 growth on graphene/Ru(0001)	22
Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guide	22
Editorial Board	22
espm: A Python library for the simulation of STEM-EDXS datasets	22
Development of precession Lorentz transmission electron microscopy	21
On central focusing for contrast optimization in direct electron ptychography of thick samples	21
Multimode objective lens for momentum microscopy and XPEEM: Theory	21
Weld-free mounting of lamellae for electrical biasing operando TEM	20
Evaluating atomic counts in metal nanoclusters via scanning transmission electron microscopy	20
Editorial Board	19
Positioning and atomic imaging of micron-size graphene sheets by a scanning tunneling microscope	18
Mapping of lattice distortion in martensitic steel—Comparison of different evaluation methods of EBSD patterns	18
Direct investigations of interactions between nucleolins and aptamers on pancreatic cancer and normal cells by atomic force microscopy	17
Development of a liquid-helium free cryogenic sample holder with mK temperature control for autonomous electron microscopy	16
Calibration-sample free distortion correction of electron diffraction patterns using deep learning	16

Gun energy filter for a low energy electron microscope	16
Suppression of secondary recoil cascade damage in high-Z/low-Z heterostructures: a mechanism-driven FIB strategy	16
FIB-induced gallium contamination as a tool to access aluminium crystallographic information from atom probe tomography data	15
A simple circularity-based approach for nanoparticle size histograms beyond the spherical approximation	15
Improving the accuracy of temperature measurement on TEM samples using plasmon energy expansion thermometry (PEET): Addressing sample thickness effects	15
Dose constraints for high-resolution imaging of biological specimens with extreme ultraviolet and soft X-ray radiation	15
Commonsense and common nonsense opinions: PROSPECTS for further reducing beam damage in electron microscopy of radiation-sensitive specimens	14
Imaging biological macromolecules in thick specimens: The role of inelastic scattering in cryoEM	14
On the Edge: In situ Kelvin probe AFM on InP nanowire arrays	14
Perimeter procedure to produce average equivalent area grain size	14
Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization	14
The reference window for reduced perturbation of the reference wave in electrical biasing off-axis electron holography	14
Edge-induced excitations in Bi2	14
Impact of beam size and diffraction effects in the measurement of long-range electric fields in crystalline samples via 4DSTEM	13
Exploring deep learning models for 4D-STEM-DPC data processing	13
Regularization techniques for 3D surface reconstruction from four quadrant backscattered electron detector images	13
Optimized detector configurations for the reconstruction of phase-contrast images in scanning transmission electron microscopy	13
Atomic-scale observation of vacancy ordering in magnetite nanoparticles	13
Editorial Board	12
Editorial Board	12
Minimum-dose phase-contrast tomography by successive numerical optical sectioning employing the aberration-corrected STEM and a pixelated detector	12
Accurate magnification determination for cryoEM using gold	12
Data synchronization in operando gas and heating TEM	12
A new method for estimating nanoparticle deposition coverage from a set of weak-contrast SEM images	12
The characterisation of dental enamel using transmission Kikuchi diffraction in the scanning electron microscope combined with dynamic template matching	12
CNT-PVP field electron source formed by thermo-mechanical pulling of carbon nanotubes	11
Temporal coherence envelope function of field emission in electron microscopy	11
Photovoltaic and photothermal effects induced by visible laser radiation in atomic force microscopy probes	11
Role of slice thickness quantification in the 3D reconstruction of FIB tomography data of nanoporous materials	11
Ultrastructure of antennal sensilla of Anastatus orientalis (Hymenoptera: Eupelmidae), an egg parasitoid of the invasive spotted lanternfly, Lycorma delicatula (Hemiptera: Fulgoridae)	11
A new EBSD indexing method with enhanced grain boundary indexing performance using a three-dimensional parameter space	11
Data-efficient 4D-STEM in SEM: Beyond 2D materials to metallic materials	11
Effect of the surrounding environment on electron beam irradiation damage of enhanced green fluorescent protein	11
Design of electrostatic lenses through genetic algorithm and particle swarm optimisation methods integrated with differential algebra	11
Angstrom-scale imaging of magnetization in antiferromagnetic Fe2As via 4D-STEM	11
Dynamical diffraction effects of inhomogeneous strain fields investigated by scanning convergent electron beam diffraction and dark field electron holography	11
Dose symmetric electron diffraction tomography (DS-EDT): Implementation of a dose-symmetric tomography scheme in 3D electron diffraction	11
Editorial Board	11
Resonant scattering in low energy electron diffraction: Bi/Ni(111)	11
The impact of electric field strength on the accuracy of boron dopant quantification in silicon using atom probe tomography	11
Theoretical study on sixth-order geometrical aberration correction	10
Parameter dependence of depth and lateral resolution of transmission Kikuchi diffraction	10
Simulation-based super-resolution EBSD for measurements of relative deformation gradient tensors	10
Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential	10
Reflection imaging with a helium zone plate microscope	10
Automated classification of nanoparticles with various ultrastructures and sizes via deep learning	10
Development of a 100 MHz scan controller for the electron microscope	10
Data-driven control in atomic force microscopy using a genetic algorithm	10
Editorial Board	10
Preface to special section on imaging, diffraction and crystallography – John Spence's legacy	10

Clustering characteristic diffraction vectors in 4-D STEM data sets from overlapping structures in nanocrystalline and amorphous materials	10
High-precision atomic imaging using an innovative vibration-isolated scanning tunneling microscope	10
Differential phase contrast STEM image calculation software – Magnifier	10
Electron ptychography dose reduction using Moiré sampling on periodic structures	10
In situ STEM analysis of electron beam induced chemical etching of an ultra-thin amorphous carbon foil by oxygen during high resolution scanning	9
Laser-induced electron beam emission from titanium dioxide on silicon photocathodes treated with cesium and barium oxide	9
In multi electron beam systems, “Neighbours Matter”	9
Inter-Bragg crystallographic phase retrieval from shape transforms, stacking faults and substitutional disorder	9
Growth and oxidation of ultra-thin Pt-Sn layers on Pt(111) by molecular and atomic oxygen	9
Multiscale characterization of nanomechanical behavior and dislocation mechanisms in Cantor CrMnFeCoNi HEA using 3D EBSD and atomistic modeling	9
Phase offset method of ptychographic contrast reversal correction	9
Breakdown and polarization contrasts in ferroelectric devices observed by operando laser-based photoemission electron microscopy with the AC/DC electrical characterization system	9
High-precision atomic-scale strain mapping of nanoparticles from STEM images	9
Reaction-diffusion study of electron-beam-induced contamination growth	8
Optimizing laboratory X-ray diffraction contrast tomography: Effects of detector binning	8
Stroboscopic ultrafast imaging using RF strip-lines in a commercial transmission electron microscope	8
Open gas-cell transmission electron microscopy at 0.5 Å information limit	8
Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by scanning precession electron diffraction tomography	8
Editorial Board	8
Strategy for optimizing experimental settings for studying low atomic number colloidal assemblies using liquid phase scanning transmission electron microscopy	8
Minimizing Off-Axis Aberrations in Multi-Beam Electron Optical Systems: An Analytical Approach	8
A calculation approach for the virtual source spatial distribution of sub-beams in single-emitter multi-electron-beam systems	8
Interfacial excess of solutes across phase boundaries using atom probe microscopy	8
Single photon emitters in hBN: Limitations of atomic resolution imaging and potential sources of error	8
Semicircular-aperture illumination scanning transmission electron microscopy	8
Studying the effect of EDAI passivation on surface defects in triple cation mixed halide perovskite with PEEM	8
Accurate and fast localization of EBSD pattern centers for screen moving technology	8
Fabrication and characterization of boron-terminated tetravacancies in monolayer hBN using STEM, EELS and electron ptychography	8
Generational assessment of EBSD detectors for cross-correlation-based analysis: From scintillators to direct detection	8
Influence of magnetic field on electron beam-induced Coulomb explosion of gold microparticles in transmission electron microscopy	8
Signal detection and imaging methods for MEMS electron microscope	8
Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy	8
Workflow automation of SEM acquisitions and feature tracking	8
Fast tapping mode atomic force microscopy based on fuzzy PI controller	7
Editorial Board	7
Real-time electron clustering in an event-driven hybrid pixel detector	7
Editorial Board	7
Editorial Board	7
New Poisson denoising method for pulse-count STEM imaging	7
Process optimization of broad ion beam milling for preparation of coating cross-sections	7
Cryogen-free low-temperature photoemission electron microscopy for high-resolution nondestructive imaging of electronic phases	7
Direct investigations of the electrical conductivity of normal and cancer breast cells by conductive atomic force microscopy	7
Recovery of spatial frequencies in coherent diffraction imaging in the presence of a central obscuration	7
Theoretical study on the effect of temperature gradient on contact-free scanning for scanning ion conductance microscopy	7
WRAP: A wavelet-regularised reconstruction algorithm for magnetic vector electron tomography	7
Fluctuation cepstral scanning transmission electron microscopy of mixed-phase amorphous materials	7
A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learning	7
Near-real-time diagnosis of electron optical phase aberrations in scanning transmission electron microscopy using an artificial neural network	7
A method for estimating magnetic field of TEM objective lens	7
Non-negative matrix factorization-aided phase unmixing and trace element quantification of STEM-EDXS data	7
Enhancing classification in correlative microscopy using multiple classifier systems with dynamic selection	7
Emittance minimization for aberration correction I: Aberration correction of an electron microscope without knowing the aberration coefficients	6
Improving the elemental and imaging accuracy in atom probe tomography of (Ti,Si)N single and multilayer coatings using isotopic substitution of N	6
Editorial Board	6
Automated atomic site determination by four-dimensional scanning transmission electron microscopy data analytics	6
Composition fluctuations at interfaces in Mg-Al-Ca alloys revealed by quantitative three-dimensional X-ray energy dispersive spectroscopy	6
Editorial Board	6
Site-specific plan-view (S)TEM sample preparation from thin films using a dual-beam FIB-SEM	6
High precision orientation mapping from 4D-STEM precession electron diffraction data through quantitative analysis of diffracted intensities	6
On the instrument-dependent appearance of ion dissociation events in atom probe tomography mass spectra	6
Room-temperature focused ion beam preparation of sensitive organic-inorganic hybrid perovskites	6
Exploration of fs-laser ablation parameter space for 2D/3D imaging of soft and hard materials by tri-beam microscopy	6
Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural network	6
Effective removal of global tilt from atomically-resolved topography images of vicinal surfaces with narrow terraces	6
Workflows for multimodal electron tomography using EELS and EDX and their application to a spinodally decomposed CuNiFe alloy	6
Editorial Board	6
Interpretability of high-resolution transmission electron microscopy images	6
Quantitative comparison of long-range electric field measurements using off-axis electron holography and 4D-STEM via differential phase contrast	6
Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy	6
Machine learning based de-noising of electron back scatter patterns of various crystallographic metallic materials fabricated using laser directed energy deposition	6
Editorial Board	6
Extracting transverse electron mean free paths in graphene at low energy	6
Splicing dual-range EELS spectra: Identifying and correcting artefacts	6
Editorial Board	6
Prediction of the morphology of nano particles based solely on atom counting data	6
Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM	6
An electrostatic aberration corrector for improved Low-Voltage SEM imaging	6
ETDMS: Efficient two-stage diffusion model for accelerated SEM image super-resolution	5
Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors	5
The influence of residual plural scattering after deconvolution in electron magnetic chiral dichroism	5

Impact of electron beam propagation on high-resolution quantitative chemical analysis of 1-nm-wide GaN/AlGaN quantum wells	5
Spectromicroscopic study of the transformation with low energy ions of a hematite thin film into a magnetite/hematite epitaxial bilayer	5
Editorial Board	5
Investigation of thermal effects of laser micromachining for APT and TEM specimen preparation: A modeling and experimental study	5
Three-dimensional stacked filter: A non-linear filter for series images obtained using a transmission electron microscope	5
Towards atom counting from first moment STEM images: Methodology and possibilities	5
Corrigendum to “Structure-preserving Gaussian denoising of FIB-SEM volumes” [Ultramicroscopy Volume 246, 113674]	5
Exploring 4D-STEM in SEM with an event-driven direct electron detector: Low-dose, high-speed, and sparse data	5
A Denoising Autoencoder for Improved Kikuchi Pattern Quality and Indexing in Electron Backscatter Diffraction	5
A Fourier-optical approach for segmentation of ion microprobe images into tissue and non-tissue covered areas	5
Haptic sensation-based scanning probe microscopy: Exploring perceived forces for optimal intuition-driven control	5
EstimateNoiseSEM: A novel framework for deep learning based noise estimation of scanning electron microscopy images	5
Chromatic aberration (Cc) corrected cryo-EM: The structure of pseudorabies virus (PRV) using both zero-loss and energy loss electrons	5
Elemental quantification using electron energy-loss spectroscopy with a low voltage scanning transmission electron microscope (STEM-EELS)	5
A precision core drill for transmission electron microscopy sample preparation produced by 3D printing	5
A high-performance reconstruction method for partially coherent ptychography	5
Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN	5
GHz sample excitation at the ALBA-PEEM	5
Calibrating cryogenic temperature of TEM specimens using EELS	5
Identifying and imaging polymer functionality at high spatial resolution with core-loss EELS	5
Quantitative STEM: A method for measuring temperature and thickness effects on thermal diffuse scattering using STEM/EELS, and for testing electron scattering models	5
Phase imaging in scanning transmission electron microscopy using bright-field balanced divergency method	5
A spatial-spectral feature fusion attention residual network for automated bacterial classification via atomic force microscopy	5
Correction of step size dependency in local misorientation obtained by EBSD measurements: Introducing equidistant local misorientation	5
Single scan STEM-EMCD in 3-beam orientation using a quadruple aperture	5
First step toward complex observations by 4D-STEM with phase plate	5
Maximizing the notional area in single tip field emitters	5
TEMGYM Advanced: Software for electron lens aberrations and parallelised electron ray tracing	5
Femtosecond-laser-assisted focused ion beam method for the fabrication of tip specimens for atom probe tomography	4
Evaluation of electron threshold energy for predicting radiation damage in transmission electron microscopy	4
Image based evaluation of textured 3DSEM models	4
Exploration of atom probe tomography at sub-10K	4
Experimental evaluation of usable specimen thickness of Si for lattice imaging by transmission electron microscopy at 300 kV	4
The effect of secondary electrons on radiolysis as observed by in liquid TEM: The role of window material and electrical bias	4
Origin of giant enhancement of phase contrast in electron holography of modulation-doped	4
A versatile machine learning workflow for high-throughput analysis of supported metal catalyst particles	4
Investigation on the precipitate morphology and fraction characterization by atomic force microscopy	4
Substrate matters: Coupled phonon modes of a spherical particle on a substrate probed with EELS	4
Electron backscattering coefficient, material contrast and response function of BSE- detectors in scanning electron microscopy	4
Editorial Board	4
Imaging domain boundaries of rubrene thin crystallites by photoemission electron microscopy	4
Exploring the potential of simultaneous resonance in multi-frequency atomic force microscopy	4
Calibrate the non-orthogonal error of AFM with two-dimensional self-traceable grating	4
Improving the low-dose performance of aberration correction in single sideband ptychography	4
Electron-beam-induced charging of an Al2	4
An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)	4
Back illuminated photo emission electron microscopy (BIPEEM)	4
Computational models of amorphous ice for accurate simulation of cryo-EM images of biological samples	4
Point field emission electron source with a magnetically focused electron beam	4
Quantifying noise limitations of neural network segmentations in high-resolution transmission electron microscopy	4
Atomically resolved low-temperature scanning tunneling microscope operating in a 22 T water-cooled magnet	4
A brief peek at the cyclotron in our microscope	4
Strain visualization using large-angle convergent-beam electron diffraction	4
Removal of silicon-containing contaminants from TEM specimens	4
Fifth-order asymptotic geometric aberrations of electron lenses	4
A refined plan-view specimen preparation technique for high-quality electron microscopy studies of epitaxially grown atomically thin 2D layers	4
Visualization of molecular stacking using low-energy electron microscopy	4
Influence of experimental conditions on apparent AFM tip-surface contact in air	4
SEM characterization technique for air-sensitive all-solid-state lithium battery materials	4
Simulation study of the performance of neural network-enhanced PACBED for characterizing atomic-scale deformations in 2D van der Waals materials	4
Negative stain TEM imaging of native spider silk protein superstructures	4
Compact design, construction, and evaluation of an in situ ±90° rotatable magnetic force microscope in a 12 T superconducting magnet	4
Design and simulation of ellipsoidal single-bounce mono-capillary condensers for a laboratory X-Ray nano-imaging system	4
Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination	3
High-quality TEM specimen preparation for lithium-ion conducting solid electrolytes by low-energy ion milling	3
Using non-parametric statistical testing to quantify solute clustering in atom probe reconstructions	3
Reliable phase quantification in focused probe electron ptychography of thin materials	3
Neural field enhanced phase retrieval of atomic-scale structural dynamics in radiation sensitive materials	3
Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process	3
Cryogenic spectroscopic imaging scanning tunnelling microscope in a water-cooled magnet down to 1.7 K	3
Editorial Board	3
Evaluating direct detection detectors for short-range order characterization of amorphous materials by electron scattering	3
Preface to the twelfth international workshop on low energy microscopy and photoemission electron microscopy (LEEM/PEEM 12)	3
An integrated constrained gradient descent (iCGD) protocol to correct scan-positional errors for electron ptychography with high accuracy and precision	3
Correction of AFM data artifacts using a convolutional neural network trained with synthetically generated data	3
Preface to the Proceedings of the Thirteenth International Workshop on Low Energy Electron Microscopy and Photoemission Electron Microscopy (LEEM/PEEM 13)	3
Discrimination of coherent and incoherent cathodoluminescence using temporal photon correlations	3
Ghostbuster: A phase retrieval diffraction tomography algorithm for cryo-EM	3
Measurement of the pattern shifts for HR-EBSD with larger lattice rotations	3
Programmable comprehensive controller for multi-color 3D confocal spinning-disk image scanning microscope	3
EBSD and TKD analyses using inverted contrast Kikuchi diffraction patterns and alternative measurement geometries	3
Collection of propagating electromagnetic fields by uncoated probe	3
Modeling scanning near-field optical photons scattered from an atomic force microscope for quantum metrology	3
Does the order of elastic and inelastic scattering affect an image or is there a top bottom effect from inelastic scattering?	3
Large-angle convergent-beam electron diffraction patterns via conditional generative adversarial networks	3
Enhancing subsurface imaging in ultrasonic atomic force microscopy with optimized contact force	3
Quantitative comparison of excitation modes of tuning forks for shear force in probe microscopy	3
Fast reconstruction of scanning transmission electron microscopy images using Markov random field model	3
A novel STM for quality atomic resolution with piezoelectric motor of high compactness and simplicity	3
High-Resolution EELS in an aberration-corrected LEEM: Design of electrostatic transfer lenses for hemispherical filters	3
Sub-Kelvin thermometry for evaluating the local temperature stability within in situ TEM gas cells	3
SIM-STEM Lab: Incorporating Compressed Sensing Theory for Fast STEM Simulation	3
Neutral helium atom microscopy	3
Editorial Board	3
Enhancing atomic force microscopy stability through second harmonic optical fibre cavity control	3