Ultramicroscopy

Article	Citations
Reaction-diffusion study of electron-beam-induced contamination growth	57
Semicircular-aperture illumination scanning transmission electron microscopy	37
Accurate post-mortem alignment for Focused Ion Beam and Scanning Electron Microscopy (FIB-SEM) tomography	32
Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings	28
A semi-classical theory of magnetic inelastic scattering in transmission electron energy loss spectroscopy	27
Fast detection of micro-objects using scanning electrochemical microscopy based on visual recognition and machine learning	26
Spectromicroscopic study of the transformation with low energy ions of a hematite thin film into a magnetite/hematite epitaxial bilayer	21
Quantitative comparison of excitation modes of tuning forks for shear force in probe microscopy	21
Characterization of the mechanical properties of the cortex region of human hair fibers by multiparametric atomic force microscopy mapping	20
Editorial Board	19
Accurate and fast localization of EBSD pattern centers for screen moving technology	19
Tuneable in-situ nanoCT workflow using FIB/SEM	18
Editorial Board	17
Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Wolfgang Baumeister, Colin Humphreys, John Spence and Knut Urban on the occasion of their 75th, 80	17
Editorial Board	16
The influence of residual plural scattering after deconvolution in electron magnetic chiral dichroism	16
Editorial Board	16
Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guide	15
Influence of magnetic field on electron beam-induced Coulomb explosion of gold microparticles in transmission electron microscopy	15
Enhancing subsurface imaging in ultrasonic atomic force microscopy with optimized contact force	15
Editorial Board	14
Atomic layer deposited Al2O3 as a protective overlayer for focused ion beam preparation of plan-view STEM samples	14
Editorial Board	14
Analysis and improvement of positioning reliability and accuracy of theta pipette configuration for scanning ion conductance microscopy	13
In my Good Books	13

Optimization of imaging conditions for composition determination by annular dark field STEM	13
Correction of artefacts associated with large area EBSD	13
Directly correlated microscopy of trench defects in InGaN quantum wells	13
Hystorian: A processing tool for scanning probe microscopy and other n-dimensional datasets	12
Four-dimensional electron energy-loss spectroscopy	12
In-situ characterization of discharge products of lithium-oxygen battery using Flow Electrochemical Atomic Force Microscopy	12
Comparison of detection limits of direct-counting CMOS and CCD cameras in EELS experiments	12
A precision dimple grinder-polisher produced by 3D printing	12
Field dependent study on the impact of co-evaporated multihits and ion pile-up for the apparent stoichiometric quantification of GaN and AlN	12
Methodology and implementation of a tunable deep-ultraviolet laser source for photoemission electron microscopy	12
Low energy electron microscopy at cryogenic temperatures	11
A reference-area-free strain mapping method using precession electron diffraction data	11
Computer vision AC-STEM automated image analysis for 2D nanopore applications	11
Breaking the 10 nm barrier using molecular ions in nuclear microprobes	11
Strategy for optimizing experimental settings for studying low atomic number colloidal assemblies using liquid phase scanning transmission electron microscopy	11
High-quality TEM specimen preparation for lithium-ion conducting solid electrolytes by low-energy ion milling	11
Signal detection and imaging methods for MEMS electron microscope	11
Application of electron tomography for comprehensive determination of III-V interface properties	11
Investigating the effects of solution viscosity on the stability and success rate of SECCM imaging	11
Haptic sensation-based scanning probe microscopy: Exploring perceived forces for optimal intuition-driven control	10
Atomic resolution scanning transmission electron microscopy at liquid helium temperatures for quantum materials	10
Non-contact non-resonant atomic force microscopy method for measurements of highly mobile molecules and nanoparticles	10
Momentum transfer resolved electron correlation microscopy	10
Aberration calculation of microlens array using differential algebraic method	10
Focused ion beam milling and MicroED structure determination of metal-organic framework crystals	10
Quantitative atomic cross section analysis by 4D-STEM and EELS	10
The target region focused imaging method for scanning ion conductance microscopy	10
Nano1D: An accurate computer vision software for analysis and segmentation of low-dimensional nanostructures	9
Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by scanning precession electron diffraction tomography	9
Field Assisted Reactive Gas Etching of Multiple Tips Observed using FIM	9
Uncovering polar vortex structures by inversion of multiple scattering with a stacked Bloch wave model	9
Workflow automation of SEM acquisitions and feature tracking	9
Interfacial excess of solutes across phase boundaries using atom probe microscopy	9
State-of-the-art electron beams for compact tools of ultrafast science	9
Single scan STEM-EMCD in 3-beam orientation using a quadruple aperture	8
Unraveling van der Waals epitaxy: A real-time in-situ study of MoSe2 growth on graphene/Ru(0001)	8
Computer-readable Image Markers for Automated Registration in Correlative Microscopy – “autoCRIM”	8
Quantitative composition determination by ADF-STEM at a low-angular regime: a combination of EFSTEM and 4DSTEM	8
Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination	8
A new TCAD simulation method for direct CMOS electron detectors optimization	8
Reprint of: Automated geometric aberration correction for large-angle illumination STEM	8
Particle encapsulation techniques for atom probe tomography of precipitates in microalloyed steels	8
Thermal characterization of morphologically diverse copper phthalocyanine thin layers by scanning thermal microscopy	8
Probing the interaction range of electron beam-induced etching in STEM by a non-contact electron beam	8
Phase imaging in scanning transmission electron microscopy using bright-field balanced divergency method	8
Relative roles of multiple scattering and Fresnel diffraction in the imaging of small molecules using electrons, Part II: Differential Holographic Tomography	8
Dimensionality reduction and unsupervised clustering for EELS-SI	8
espm: A Python library for the simulation of STEM-EDXS datasets	7
Efficient large field of view electron phase imaging using near-field electron ptychography with a diffuser	7
Correction of AFM data artifacts using a convolutional neural network trained with synthetically generated data	7

Investigation on the precipitate morphology and fraction characterization by atomic force microscopy	7
Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy	7
Generational assessment of EBSD detectors for cross-correlation-based analysis: From scintillators to direct detection	7
Corrigendum to “Electron crystallography of chiral and non-chiral small molecules” [Ultramicroscopy 232 (2022) 113417]	7
In search of best automated model: Explaining nanoparticle TEM image segmentation	7
On central focusing for contrast optimization in direct electron ptychography of thick samples	7
Improving the accuracy of temperature measurement on TEM samples using plasmon energy expansion thermometry (PEET): Addressing sample thickness effects	7
Multi-exposure microscopic image fusion-based detail enhancement algorithm	7
Coherent and incoherent imaging of biological specimens with electrons and X-rays	7
Measuring scattering distributions in scanning helium microscopy	7
Elastic strain mapping of plastically deformed materials by TEM	7
Coherent light emission in cathodoluminescence when using GaAs in a scanning (transmission) electron microscope	7
Editorial Board	6
Direct investigations of interactions between nucleolins and aptamers on pancreatic cancer and normal cells by atomic force microscopy	6
Extraction of acceptor concentration map from EBIC experiments	6
2D imaging spin-filter for NanoESCA based on Au/Ir(001) or Fe(001)-p(1×1)O	6
Editorial Board	6
Application of Murphy – Good Plot Parameters Extraction Method on Electron Emission from Carbon Fibers	6
Positioning and atomic imaging of micron-size graphene sheets by a scanning tunneling microscope	6
Editorial Board	6
Editorial Board	6
Portable low-cost and highly accurate programmable triggering controller for confocal spinning disk image scanning microscope	6
Editorial Board	6
Perimeter procedure to produce average equivalent area grain size	6
Editorial Board	6
Relativistic EELS scattering cross-sections for microanalysis based on Dirac solutions	6
Morphology measurements by AFM tapping without causing surface damage: A phase shift characterization	6
The effect of post-acquisition data misalignments on the performance of STEM tomography	6
Editorial Board	6
A brief peek at the cyclotron in our microscope	6
Preparation and stability of the hexagonal phase of samarium oxide on Ru(0001)	6
Continuous illumination picosecond imaging using a delay line detector in a transmission electron microscope	6
Editorial Board	6
Edge-induced excitations in Bi2	6
Preface to the twelfth international workshop on low energy microscopy and photoemission electron microscopy (LEEM/PEEM 12)	6
UEMtomaton: A Source-Available Platform to Aid in Start-up of Ultrafast Electron Microscopy Labs	5
Near-real-time diagnosis of electron optical phase aberrations in scanning transmission electron microscopy using an artificial neural network	5
Principles of electron wave front modulation with two miniature electron mirrors	5
Prospect for measuring two-dimensional van der Waals magnets by electron magnetic chiral dichroism	5
A user-friendly FIB lift-out technique to prepare plan-view TEM sample of 2D thin film materials	5
Sampling theory perspective on tomographic tilt increment schemes	5
Electron crystallography of chiral and non-chiral small molecules	5
Quantitative mapping of strain and displacement fields over HR-TEM and HR-STEM images of crystals with reference to a virtual lattice	5
Dislocations at coalescence boundaries in heteroepitaxial GaN/sapphire studied after the epitaxial layer has completely coalesced	5
Effect of specimen processing for transmission electron microscopy on lattice spacing variation in Si specimens	5
Large volume tomography using plasma FIB-SEM: A comprehensive case study on black silicon	5
Weld-free mounting of lamellae for electrical biasing operando TEM	5
Atomically resolved low-temperature scanning tunneling microscope operating in a 22 T water-cooled magnet	5
A novel ground-potential monochromator design	5
Data-driven dynamics-based optimal filtering of acoustic noise at arbitrary location in atomic force microscope imaging	5
A sorter for electrons based on magnetic elements	5
L-shell ionization of Cd: Structure of the x-ray emission spectrum	5
Cepstral scanning transmission electron microscopy imaging of severe lattice distortions	5
A Fast Frozen Phonon Algorithm Using Mixed Static Potentials	5
Scanning precession electron diffraction data analysis approaches for phase mapping of precipitates in aluminium alloys	5
Editorial Board	5
Resistivity contrast imaging in semiconductor structures using ultra-low energy scanning electron microscopy	5
Characterisation of engineered defects in extreme ultraviolet mirror substrates using lab-scale extreme ultraviolet reflection ptychography	5
Direct investigations of the electrical conductivity of normal and cancer breast cells by conductive atomic force microscopy	5
Spectrum imaging measurements with semi-parallel detection using an AES apparatus	4
Atomic resolution HOLZ-STEM imaging of atom position modulation in oxide heterostructures	4
4D-STEM at interfaces to GaN: Centre-of-mass approach & NBED-disc detection	4
Recovery of spatial frequencies in coherent diffraction imaging in the presence of a central obscuration	4
Quantifying noise limitations of neural network segmentations in high-resolution transmission electron microscopy	4
Point field emission electron source with a magnetically focused electron beam	4
Characterization of strongly coupled quartz tuning fork sensors for precision force measurement in atomic force microscopy	4
Real-time electron clustering in an event-driven hybrid pixel detector	4
A simple circularity-based approach for nanoparticle size histograms beyond the spherical approximation	4
A quantitative method for in situ pump-beam metrology in 4D ultrafast electron microscopy	4
Phase differentiation based on x-ray energy spectrum correlation with an energy dispersive spectrometer (EDS)	4
High precision orientation mapping from 4D-STEM precession electron diffraction data through quantitative analysis of diffracted intensities	4
Prediction of primary knock-on damage during electron microscopy characterization of lithium-containing materials	4
A comparison of molecular dynamics potentials used to account for thermal diffuse scattering in multislice simulations	4
Trajectory displacement in a multi beam scanning electron microscope	4
Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications	4
Wavelength-multiplexed single-shot ptychography	4
Imaging biological macromolecules in thick specimens: The role of inelastic scattering in cryoEM	4
A method for estimating magnetic field of TEM objective lens	4
Development of a liquid-helium free cryogenic sample holder with mK temperature control for autonomous electron microscopy	4
Event-based hyperspectral EELS: towards nanosecond temporal resolution	4

Modeling scanning near-field optical photons scattered from an atomic force microscope for quantum metrology	4
Does the order of elastic and inelastic scattering affect an image or is there a top bottom effect from inelastic scattering?	4
2D calculation of parasitic fields in misaligned multipole electron-optical systems	4
Toward accurate measurement of electromagnetic field by retrieving and refining the center position of non-uniform diffraction disks in Lorentz 4D-STEM	4
Coherent imaging with low-energy electrons, quantitative analysis	4
Extracting weak magnetic contrast from complex background contrast in plan-view FeGe thin films	4
Regularization techniques for 3D surface reconstruction from four quadrant backscattered electron detector images	4
Optical STEM detection for scanning electron microscopy	4
The effect of nanochannel length on in situ loading times of diffusion-propelled nanoparticles in liquid cell electron microscopy	4
Non-negative matrix factorization-aided phase unmixing and trace element quantification of STEM-EDXS data	4
An integrated constrained gradient descent (iCGD) protocol to correct scan-positional errors for electron ptychography with high accuracy and precision	4
Comparative of machine learning classification strategies for electron energy loss spectroscopy: Support vector machines and artificial neural networks	4
Alignment of electron optical beam shaping elements using a convolutional neural network	4
Fabrication and characterization of a miniaturized octupole deflection system for the MEMS electron microscope	4
“Depo-all-around”: A novel FIB-based TEM specimen preparation technique for solid state battery composites and other loosely bound samples	4
Correlative atomic force microscopy and scanning electron microscopy of bacteria-diamond-metal nanocomposites	4
A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learning	4
Low terahertz-band scanning near-field microscope with 155-nm resolution	4
Gun energy filter for a low energy electron microscope	4
Effects of atom probe analysis parameters on composition measurement of precipitates in an Al-Mg-Si-Cu alloy	4
Mapping of lattice distortion in martensitic steel—Comparison of different evaluation methods of EBSD patterns	4
Design and optimization of a conical electrostatic objective lens of a low-voltage scanning electron microscope for surface imaging and analysis in ultra-high-vacuum environment	4
Brightness evaluation of pulsed electron gun using negative electron affinity photocathode developed for time-resolved measurement using scanning electron microscope	4
Anisotropic wet-chemical etching for preparation of freestanding films on Si substrates for atom probe tomography: A simple yet effective approach	4
Dynamic evolution mechanism of scanning moiré fringes	4
Reconstructing the exit wave of 2D materials in high-resolution transmission electron microscopy using machine learning	4
Focused light introduction into transmission electron microscope via parabolic mirror	4
A Crystallography-Mediated Reconstruction (CMR) Approach for Atom Probe Tomography: Solution for a Singleton Pole	4
The Performance of EDXS at Elevated Sample Temperatures Using a MEMS-Based In Situ TEM Heating System	4
AutoDisk: Automated diffraction processing and strain mapping in 4D-STEM	3
Secondary electron count imaging in SEM	3
On 2D-FTIR-XRF microscopy – A step forward correlative tissue studies by infrared and hard X-ray radiation	3
Properties of blade-like field emitters	3
Quantitative nanoscale imaging using transmission He ion channelling contrast: Proof-of-concept and application to study isolated crystalline defects	3
Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM	3
Impact of beam size and diffraction effects in the measurement of long-range electric fields in crystalline samples via 4DSTEM	3
Decomposition of CrN induced by laser-assisted atom probe tomography	3
Symmetry of diffraction patterns of two-dimensional crystal structures	3
Elmar Zeitler (1927–2020)	3
Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization	3
Toward quantitative thermoelectric characterization of (nano)materials by in-situ transmission electron microscopy	3
New probes based on carbon nano-cones for scanning probe microscopies	3
Image based evaluation of textured 3DSEM models	3
The interaction of proanthocyanidins with DNA molecules studied by atomic force microscopy and spectroscopic method	3
Plasmon energy losses in shear bands of metallic glass	3
High order phase contrast and source divergence in low energy electron microscopy	3
Site-specific plan-view TEM lamella preparation of pristine surfaces with a large field of view	3
The reference window for reduced perturbation of the reference wave in electrical biasing off-axis electron holography	3
New Poisson denoising method for pulse-count STEM imaging	3
Accurate magnification determination for cryoEM using gold	3
Atomic imaging with a 12 T magnetic field perpendicular or parallel to the sample surface by an ultra-stable scanning tunneling microscope	3
Advanced processing of differential phase contrast data: Distinction between different causes of electron phase shifts	3
Scattering angle dependence of temperature susceptivity of electron scattering in scanning transmission electron microscopy	3
Optimized detector configurations for the reconstruction of phase-contrast images in scanning transmission electron microscopy	3
WRAP: A wavelet-regularised reconstruction algorithm for magnetic vector electron tomography	3
Resolution of non-destructive imaging by controlled acceleration voltage in scanning electron microscopy	3
Controlling the parameters of focused ion beam for ultra-precise fabrication of nanostructures	3
Editorial Board	3
Fluctuation cepstral scanning transmission electron microscopy of mixed-phase amorphous materials	3
Quantitative three-dimensional characterization of critical sizes of non-spherical TiO2 nanoparticles by using atomic force microscopy	3
Precise measurement of the electron beam current in a TEM	3
Strain visualization using large-angle convergent-beam electron diffraction	3
Editorial Board	3
Training artificial neural networks for precision orientation and strain mapping using 4D electron diffraction datasets	3
Enhancing classification in correlative microscopy using multiple classifier systems with dynamic selection	3
Assessment of the strain depth sensitivity of Moiré sampling Scanning Transmission Electron Microscopy Geometrical Phase Analysis through a comparison with Dark-Field Electron Holography	3
Identification of ultra-thin molecular layers atop monolayer terraces in sub-monolayer organic films with scanning probe microscopy	3
Effect of electron beam irradiation on the temperature of single AuGe nanoparticles in a TEM	3
Observation of grain boundary plasmon and associated deconvolution techniques for low-loss electron energy-loss (EEL) spectra acquired from grain boundaries	3
Multi-scale time-resolved electron diffraction: A case study in moiré materials	3
Angular momentum transfer from swift electrons to non-spherical nanoparticles within the dipolar approximation	3
Automated calculations for computing the sample-limited spatial resolution in (scanning) transmission electron microscopy	3
Image difference metrics for high-resolution electron microscopy	3
Process optimization of broad ion beam milling for preparation of coating cross-sections	3
Characterization of transverse electron pulse trains using RF powered traveling wave metallic comb striplines	3
The EBSD spatial resolution of a Timepix-based detector in a tilt-free geometry	3
Correcting for probe wandering by precession path segmentation	3
An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)	3
Volume imaging by tracking sparse topological features in electron micrograph tilt series	3
Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy	3
Calibrate the non-orthogonal error of AFM with two-dimensional self-traceable grating	3
Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tilt	3
Editorial Board	3
Unitary two-state quantum operators realized by quadrupole fields in the electron microscope	3
Editorial Board	3
A new type of nanoscale reference grating manufactured by combined laser-focused atomic deposition and x-ray interference lithography and its use for calibrating a scanning electron microscope	3
Standard deviation of microscopy images used as indicator for growth stages	3
Origin of giant enhancement of phase contrast in electron holography of modulation-doped	3
A method for a column-by-column EELS quantification of barium lanthanum ferrate	3
Editorial Board	2
Solving the crystallographic phase problem using dynamical scattering in electron diffraction	2
Editorial Board	2
Voltage modulation efficiency in scanning capacitance microscopy	2
Editorial Board	2
Segmentability evaluation of back-scattered SEM images of multiphase materials	2