Ultramicroscopy

Article	Citations
Corrigendum to “Electron crystallography of chiral and non-chiral small molecules” [Ultramicroscopy 232 (2022) 113417]	66
On central focusing for contrast optimization in direct electron ptychography of thick samples	46
Editorial Board	39
Quantitative composition determination by ADF-STEM at a low-angular regime: a combination of EFSTEM and 4DSTEM	31
Uncovering polar vortex structures by inversion of multiple scattering with a stacked Bloch wave model	31
Nano1D: An accurate computer vision software for analysis and segmentation of low-dimensional nanostructures	29
Non-contact non-resonant atomic force microscopy method for measurements of highly mobile molecules and nanoparticles	26
Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guide	25
Characterization of the mechanical properties of the cortex region of human hair fibers by multiparametric atomic force microscopy mapping	24
Unraveling van der Waals epitaxy: A real-time in-situ study of MoSe2 growth on graphene/Ru(0001)	24
espm: A Python library for the simulation of STEM-EDXS datasets	23
In search of best automated model: Explaining nanoparticle TEM image segmentation	22
Methodology and implementation of a tunable deep-ultraviolet laser source for photoemission electron microscopy	22
Gun energy filter for a low energy electron microscope	22
L-shell ionization of Cd: Structure of the x-ray emission spectrum	21
Editorial Board	19
Editorial Board	18
A sorter for electrons based on magnetic elements	17
Prospect for measuring two-dimensional van der Waals magnets by electron magnetic chiral dichroism	17
Perimeter procedure to produce average equivalent area grain size	17
Positioning and atomic imaging of micron-size graphene sheets by a scanning tunneling microscope	16
Edge-induced excitations in Bi2	16
Imaging biological macromolecules in thick specimens: The role of inelastic scattering in cryoEM	15
Improving the accuracy of temperature measurement on TEM samples using plasmon energy expansion thermometry (PEET): Addressing sample thickness effects	15
Mapping of lattice distortion in martensitic steel—Comparison of different evaluation methods of EBSD patterns	15

Development of a liquid-helium free cryogenic sample holder with mK temperature control for autonomous electron microscopy	15
A simple circularity-based approach for nanoparticle size histograms beyond the spherical approximation	15
Direct investigations of interactions between nucleolins and aptamers on pancreatic cancer and normal cells by atomic force microscopy	15
Weld-free mounting of lamellae for electrical biasing operando TEM	15
Optimized detector configurations for the reconstruction of phase-contrast images in scanning transmission electron microscopy	14
Exploring deep learning models for 4D-STEM-DPC data processing	14
Standardizing resolution definition in scanning helium microscopy	14
Accurate magnification determination for cryoEM using gold	14
The reference window for reduced perturbation of the reference wave in electrical biasing off-axis electron holography	14
Site-specific plan-view TEM lamella preparation of pristine surfaces with a large field of view	13
Editorial Board	13
Impact of beam size and diffraction effects in the measurement of long-range electric fields in crystalline samples via 4DSTEM	13
Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization	12
The characterisation of dental enamel using transmission Kikuchi diffraction in the scanning electron microscope combined with dynamic template matching	12
Editorial Board	12
The impact of electric field strength on the accuracy of boron dopant quantification in silicon using atom probe tomography	12
Regularization techniques for 3D surface reconstruction from four quadrant backscattered electron detector images	12
Controlling the parameters of focused ion beam for ultra-precise fabrication of nanostructures	12
Minimum-dose phase-contrast tomography by successive numerical optical sectioning employing the aberration-corrected STEM and a pixelated detector	12
Editorial Board	12
Commonsense and common nonsense opinions: PROSPECTS for further reducing beam damage in electron microscopy of radiation-sensitive specimens	12
Quantitative three-dimensional characterization of critical sizes of non-spherical TiO2 nanoparticles by using atomic force microscopy	12
Editorial Board	12
Editorial Board	12
Design of electrostatic lenses through genetic algorithm and particle swarm optimisation methods integrated with differential algebra	11
Analysis of Local Charges at Hetero-interfaces by Electron Holography – A Comparative Study of Different Techniques	11
Effect of the surrounding environment on electron beam irradiation damage of enhanced green fluorescent protein	11
Role of slice thickness quantification in the 3D reconstruction of FIB tomography data of nanoporous materials	11
A new method for estimating nanoparticle deposition coverage from a set of weak-contrast SEM images	11
Dose measurement in the TEM and STEM	10
Data synchronization in operando gas and heating TEM	10
Crystal lattice image reconstruction from Moiré sampling scanning transmission electron microscopy	10
Parameter dependence of depth and lateral resolution of transmission Kikuchi diffraction	10
Fiber-optic sample illuminator design for the observation of light induced phenomena with transmission electron microscopy in situ: Antimicrobial photodynamic therapy	10
Temporal coherence envelope function of field emission in electron microscopy	10
Angstrom-scale imaging of magnetization in antiferromagnetic Fe2As via 4D-STEM	10
Preface to special section on imaging, diffraction and crystallography – John Spence's legacy	10
Clustering characteristic diffraction vectors in 4-D STEM data sets from overlapping structures in nanocrystalline and amorphous materials	10
Automated classification of nanoparticles with various ultrastructures and sizes via deep learning	10
Photovoltaic and photothermal effects induced by visible laser radiation in atomic force microscopy probes	10
Gold nanoparticles and tilt pairs to assess protein flexibility by cryo-electron microscopy	10
Dynamical diffraction effects of inhomogeneous strain fields investigated by scanning convergent electron beam diffraction and dark field electron holography	10
Reflection imaging with a helium zone plate microscope	9
Theoretical study on sixth-order geometrical aberration correction	9
High-precision atomic imaging using an innovative vibration-isolated scanning tunneling microscope	9
An improved method assigning three-dimensional atomic potentials to multiple slices in exit-wave simulations of Transmission Electron Microscopy	9
Electron ptychography dose reduction using Moiré sampling on periodic structures	9
The influence of chromatic aberration on the dose-limited spatial resolution of transmission electron microscopy	9
High-resolution compositional mapping of surfaces in non-contact atomic force microscopy by a new multi-frequency excitation	9
Editorial Board	9

In multi electron beam systems, “Neighbours Matter”	9
Orientation, pattern center refinement and deformation state extraction through global optimization algorithms	9
Dose symmetric electron diffraction tomography (DS-EDT): Implementation of a dose-symmetric tomography scheme in 3D electron diffraction	9
In situ STEM analysis of electron beam induced chemical etching of an ultra-thin amorphous carbon foil by oxygen during high resolution scanning	9
Phase offset method of ptychographic contrast reversal correction	9
Workflow automation of SEM acquisitions and feature tracking	8
Generational assessment of EBSD detectors for cross-correlation-based analysis: From scintillators to direct detection	8
Exploiting the full potential of the advanced two-hexapole corrector for STEM exemplified at 60kV	8
Accuracy and precision of position determination in ISTEM imaging of BaTiO	8
A semi-classical theory of magnetic inelastic scattering in transmission electron energy loss spectroscopy	8
Strategy for optimizing experimental settings for studying low atomic number colloidal assemblies using liquid phase scanning transmission electron microscopy	8
In my Good Books	8
Directly correlated microscopy of trench defects in InGaN quantum wells	8
Influence of magnetic field on electron beam-induced Coulomb explosion of gold microparticles in transmission electron microscopy	8
Numerical simulations of field emission characteristics of open CNT	8
High-precision atomic-scale strain mapping of nanoparticles from STEM images	8
Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential	8
Semicircular-aperture illumination scanning transmission electron microscopy	8
In-situ characterization of discharge products of lithium-oxygen battery using Flow Electrochemical Atomic Force Microscopy	8
Editorial Board	8
Stroboscopic ultrafast imaging using RF strip-lines in a commercial transmission electron microscope	8
Inter-Bragg crystallographic phase retrieval from shape transforms, stacking faults and substitutional disorder	8
Differential phase contrast STEM image calculation software – Magnifier	8
Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Wolfgang Baumeister, Colin Humphreys, John Spence and Knut Urban on the occasion of their 75th, 80	8
Computer vision AC-STEM automated image analysis for 2D nanopore applications	7
Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy	7
Brightness evaluation of pulsed electron gun using negative electron affinity photocathode developed for time-resolved measurement using scanning electron microscope	7
Direct investigations of the electrical conductivity of normal and cancer breast cells by conductive atomic force microscopy	7
Recovery of spatial frequencies in coherent diffraction imaging in the presence of a central obscuration	7
Editorial Board	7
Coherent and incoherent imaging of biological specimens with electrons and X-rays	7
Signal detection and imaging methods for MEMS electron microscope	7
Editorial Board	7
Real-time electron clustering in an event-driven hybrid pixel detector	7
Near-real-time diagnosis of electron optical phase aberrations in scanning transmission electron microscopy using an artificial neural network	7
A method for a column-by-column EELS quantification of barium lanthanum ferrate	7
Reaction-diffusion study of electron-beam-induced contamination growth	7
Accurate and fast localization of EBSD pattern centers for screen moving technology	7
Interfacial excess of solutes across phase boundaries using atom probe microscopy	7
Editorial Board	7
A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learning	7
A method for estimating magnetic field of TEM objective lens	7
Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by scanning precession electron diffraction tomography	7
Quantitative comparison of long-range electric field measurements using off-axis electron holography and 4D-STEM via differential phase contrast	6
Enhancing classification in correlative microscopy using multiple classifier systems with dynamic selection	6
Editorial Board	6
Emittance minimization for aberration correction I: Aberration correction of an electron microscope without knowing the aberration coefficients	6
Unitary two-state quantum operators realized by quadrupole fields in the electron microscope	6
Atom probe specimen preparation methods for nanoparticles	6
Exploration of fs-laser ablation parameter space for 2D/3D imaging of soft and hard materials by tri-beam microscopy	6
Editorial Board	6
Process optimization of broad ion beam milling for preparation of coating cross-sections	6
Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM	6
High precision orientation mapping from 4D-STEM precession electron diffraction data through quantitative analysis of diffracted intensities	6
Spectrum imaging measurements with semi-parallel detection using an AES apparatus	6
New Poisson denoising method for pulse-count STEM imaging	6
Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy	6
A versatile sample fabrication method for ultrafast electron diffraction	6
Splicing dual-range EELS spectra: Identifying and correcting artefacts	6
Editorial Board	6
Fluctuation cepstral scanning transmission electron microscopy of mixed-phase amorphous materials	6
Non-negative matrix factorization-aided phase unmixing and trace element quantification of STEM-EDXS data	6
WRAP: A wavelet-regularised reconstruction algorithm for magnetic vector electron tomography	6
Theoretical study on the effect of temperature gradient on contact-free scanning for scanning ion conductance microscopy	6
Symmetry of diffraction patterns of two-dimensional crystal structures	6
WhatEELS. A python-based interactive software solution for ELNES analysis combining clustering and NLLS	6
Site-specific plan-view (S)TEM sample preparation from thin films using a dual-beam FIB-SEM	6
Parameter retrieval of small particles in dark-field Fourier ptychography and a rectangle in real-space ptychography	6
On the instrument-dependent appearance of ion dissociation events in atom probe tomography mass spectra	6
Maximizing the notional area in single tip field emitters	5
Corrigendum to “Structure-preserving Gaussian denoising of FIB-SEM volumes” [Ultramicroscopy Volume 246, 113674]	5
Editorial Board	5
A Denoising Autoencoder for Improved Kikuchi Pattern Quality and Indexing in Electron Backscatter Diffraction	5
TEMGYM Advanced: Software for electron lens aberrations and parallelised electron ray tracing	5
Stress effect on the resonance properties of single-crystal diamond cantilever resonators for microscopy applications	5
Detecting minute amounts of nitrogen in GaNAs thin films using STEM and CBED	5
Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors	5
Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN	5
First step toward complex observations by 4D-STEM with phase plate	5
Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural network	5

Extracting transverse electron mean free paths in graphene at low energy	5
Effective removal of global tilt from atomically-resolved topography images of vicinal surfaces with narrow terraces	5
Editorial Board	5
Interpretability of high-resolution transmission electron microscopy images	5
Atom-by-atom chemical identification from scanning transmission electron microscopy images in presence of noise and residual aberrations	5
Investigation of thermal effects of laser micromachining for APT and TEM specimen preparation: A modeling and experimental study	5
Quantitative STEM: A method for measuring temperature and thickness effects on thermal diffuse scattering using STEM/EELS, and for testing electron scattering models	5
A precision core drill for transmission electron microscopy sample preparation produced by 3D printing	5
Towards atom counting from first moment STEM images: Methodology and possibilities	5
GHz sample excitation at the ALBA-PEEM	5
Optimizing image contrast of second phases in metal alloys	5
A precision manual grinding tool for sample preparation	5
Machine learning based de-noising of electron back scatter patterns of various crystallographic metallic materials fabricated using laser directed energy deposition	5
Editorial Board	5
Calibrating cryogenic temperature of TEM specimens using EELS	5
Three-dimensional stacked filter: A non-linear filter for series images obtained using a transmission electron microscope	5
A high-performance reconstruction method for partially coherent ptychography	5
Quantitative amplitude-modulation scanning Kelvin probe microscopy via the second eigenmode excitation	5
Accurate post-mortem alignment for Focused Ion Beam and Scanning Electron Microscopy (FIB-SEM) tomography	4
Negative stain TEM imaging of native spider silk protein superstructures	4
Investigation on the precipitate morphology and fraction characterization by atomic force microscopy	4
Back illuminated photo emission electron microscopy (BIPEEM)	4
A quantitative method for in situ pump-beam metrology in 4D ultrafast electron microscopy	4
Single scan STEM-EMCD in 3-beam orientation using a quadruple aperture	4
Editorial Board	4
Quantifying noise limitations of neural network segmentations in high-resolution transmission electron microscopy	4
Phase imaging in scanning transmission electron microscopy using bright-field balanced divergency method	4
Strain visualization using large-angle convergent-beam electron diffraction	4
Calibrate the non-orthogonal error of AFM with two-dimensional self-traceable grating	4
Image based evaluation of textured 3DSEM models	4
Computational models of amorphous ice for accurate simulation of cryo-EM images of biological samples	4
Continuous illumination picosecond imaging using a delay line detector in a transmission electron microscope	4
Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications	4
Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings	4
Hystorian: A processing tool for scanning probe microscopy and other n-dimensional datasets	4
Dimensionality reduction and unsupervised clustering for EELS-SI	4
Correction of step size dependency in local misorientation obtained by EBSD measurements: Introducing equidistant local misorientation	4
Haptic sensation-based scanning probe microscopy: Exploring perceived forces for optimal intuition-driven control	4
Atomically resolved low-temperature scanning tunneling microscope operating in a 22 T water-cooled magnet	4
An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)	4
Origin of giant enhancement of phase contrast in electron holography of modulation-doped	4
Removal of silicon-containing contaminants from TEM specimens	4
Alignment of electron optical beam shaping elements using a convolutional neural network	4
Editorial Board	4
Point field emission electron source with a magnetically focused electron beam	4
The influence of residual plural scattering after deconvolution in electron magnetic chiral dichroism	4
Elemental quantification using electron energy-loss spectroscopy with a low voltage scanning transmission electron microscope (STEM-EELS)	4
Spectromicroscopic study of the transformation with low energy ions of a hematite thin film into a magnetite/hematite epitaxial bilayer	4
Identifying and imaging polymer functionality at high spatial resolution with core-loss EELS	4
A brief peek at the cyclotron in our microscope	4
Compact design, construction, and evaluation of an in situ ±90° rotatable magnetic force microscope in a 12 T superconducting magnet	4
Influence of experimental conditions on apparent AFM tip-surface contact in air	4
A versatile machine learning workflow for high-throughput analysis of supported metal catalyst particles	4
Properties of blade-like field emitters	4
Optimizing experimental parameters of integrated differential phase contrast (iDPC) for atomic resolution imaging	3
Ghostbuster: A phase retrieval diffraction tomography algorithm for cryo-EM	3
Using non-parametric statistical testing to quantify solute clustering in atom probe reconstructions	3
High-quality TEM specimen preparation for lithium-ion conducting solid electrolytes by low-energy ion milling	3
Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination	3
Enhancing subsurface imaging in ultrasonic atomic force microscopy with optimized contact force	3
Relativistic EELS scattering cross-sections for microanalysis based on Dirac solutions	3
Fast reconstruction of scanning transmission electron microscopy images using Markov random field model	3
Exploration of atom probe tomography at sub-10K	3
SIM-STEM Lab: Incorporating Compressed Sensing Theory for Fast STEM Simulation	3
A refined plan-view specimen preparation technique for high-quality electron microscopy studies of epitaxially grown atomically thin 2D layers	3
Neutral helium atom microscopy	3
Editorial Board	3
Sub-Kelvin thermometry for evaluating the local temperature stability within in situ TEM gas cells	3
Collection of propagating electromagnetic fields by uncoated probe	3
Design and optimization of a conical electrostatic objective lens of a low-voltage scanning electron microscope for surface imaging and analysis in ultra-high-vacuum environment	3
Editorial Board	3
Correction of AFM data artifacts using a convolutional neural network trained with synthetically generated data	3
Quantitative comparison of excitation modes of tuning forks for shear force in probe microscopy	3
Measurement of the pattern shifts for HR-EBSD with larger lattice rotations	3
Cryogenic spectroscopic imaging scanning tunnelling microscope in a water-cooled magnet down to 1.7 K	3
Displacement separation analysis from atomic-resolution images	3
Nondestructive and local mapping photoresponse of WSe2 by electrostatic force microscopy	3
A novel STM for quality atomic resolution with piezoelectric motor of high compactness and simplicity	3
Fifth-order asymptotic geometric aberrations of electron lenses	3
Reliable phase quantification in focused probe electron ptychography of thin materials	3
Direct measurement of the PSF for Coulomb delocalization – a reconsideration	3
Programmable comprehensive controller for multi-color 3D confocal spinning-disk image scanning microscope	3
Preface to the Proceedings of the Thirteenth International Workshop on Low Energy Electron Microscopy and Photoemission Electron Microscopy (LEEM/PEEM 13)	3
Modeling scanning near-field optical photons scattered from an atomic force microscope for quantum metrology	3
Preface to the twelfth international workshop on low energy microscopy and photoemission electron microscopy (LEEM/PEEM 12)	3
Evaluating direct detection detectors for short-range order characterization of amorphous materials by electron scattering	3
Thermal characterization of morphologically diverse copper phthalocyanine thin layers by scanning thermal microscopy	3
Principal image decomposition for multi-detector backscatter electron topography reconstruction	3
Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process	3
Isolated scan unit and scanning tunneling microscope for stable imaging in ultra-high magnetic fields	3
Experimental realization of a π/2 vortex mode converter for electron	3
Experimental evaluation of usable specimen thickness of Si for lattice imaging by transmission electron microscopy at 300 kV	3
An in-situ magnetising holder achieving 1.5 T in-plane field in 200 kV transmission electron microscope	3
The effect of secondary electrons on radiolysis as observed by in liquid TEM: The role of window material and electrical bias	3
Discrimination of coherent and incoherent cathodoluminescence using temporal photon correlations	3