OOIR: Observatory of International Research

Papers

(The TQCC of Ultramicroscopy is 6. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-09-01 to 2025-09-01.)

Article	Citations
Corrigendum to “Electron crystallography of chiral and non-chiral small molecules” [Ultramicroscopy 232 (2022) 113417]	69
On central focusing for contrast optimization in direct electron ptychography of thick samples	47
Editorial Board	41
Uncovering polar vortex structures by inversion of multiple scattering with a stacked Bloch wave model	32
Quantitative composition determination by ADF-STEM at a low-angular regime: a combination of EFSTEM and 4DSTEM	32
Nano1D: An accurate computer vision software for analysis and segmentation of low-dimensional nanostructures	31
Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guide	26
Non-contact non-resonant atomic force microscopy method for measurements of highly mobile molecules and nanoparticles	26
espm: A Python library for the simulation of STEM-EDXS datasets	24
Characterization of the mechanical properties of the cortex region of human hair fibers by multiparametric atomic force microscopy mapping	24
Methodology and implementation of a tunable deep-ultraviolet laser source for photoemission electron microscopy	23
In search of best automated model: Explaining nanoparticle TEM image segmentation	22
An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps	22
Unraveling van der Waals epitaxy: A real-time in-situ study of MoSe2 growth on graphene/Ru(0001)	22
Gun energy filter for a low energy electron microscope	22
Editorial Board	19
L-shell ionization of Cd: Structure of the x-ray emission spectrum	19
Editorial Board	19
A sorter for electrons based on magnetic elements	17
Prospect for measuring two-dimensional van der Waals magnets by electron magnetic chiral dichroism	17
Weld-free mounting of lamellae for electrical biasing operando TEM	17
Perimeter procedure to produce average equivalent area grain size	16
Positioning and atomic imaging of micron-size graphene sheets by a scanning tunneling microscope	16
Development of a liquid-helium free cryogenic sample holder with mK temperature control for autonomous electron microscopy	16
Edge-induced excitations in Bi2	16

Direct investigations of interactions between nucleolins and aptamers on pancreatic cancer and normal cells by atomic force microscopy	15
Improving the accuracy of temperature measurement on TEM samples using plasmon energy expansion thermometry (PEET): Addressing sample thickness effects	15
Imaging biological macromolecules in thick specimens: The role of inelastic scattering in cryoEM	15
A simple circularity-based approach for nanoparticle size histograms beyond the spherical approximation	15
Standardizing resolution definition in scanning helium microscopy	15
Mapping of lattice distortion in martensitic steel—Comparison of different evaluation methods of EBSD patterns	15
Optimized detector configurations for the reconstruction of phase-contrast images in scanning transmission electron microscopy	15
Editorial Board	14
The reference window for reduced perturbation of the reference wave in electrical biasing off-axis electron holography	14
Accurate magnification determination for cryoEM using gold	14
Impact of beam size and diffraction effects in the measurement of long-range electric fields in crystalline samples via 4DSTEM	13
Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization	13
Quantitative three-dimensional characterization of critical sizes of non-spherical TiO2 nanoparticles by using atomic force microscopy	13
Site-specific plan-view TEM lamella preparation of pristine surfaces with a large field of view	13
Regularization techniques for 3D surface reconstruction from four quadrant backscattered electron detector images	13
Exploring deep learning models for 4D-STEM-DPC data processing	12
Editorial Board	12
Analysis of Local Charges at Hetero-interfaces by Electron Holography – A Comparative Study of Different Techniques	12
The characterisation of dental enamel using transmission Kikuchi diffraction in the scanning electron microscope combined with dynamic template matching	12
Controlling the parameters of focused ion beam for ultra-precise fabrication of nanostructures	12
Minimum-dose phase-contrast tomography by successive numerical optical sectioning employing the aberration-corrected STEM and a pixelated detector	12
A new method for estimating nanoparticle deposition coverage from a set of weak-contrast SEM images	12
Commonsense and common nonsense opinions: PROSPECTS for further reducing beam damage in electron microscopy of radiation-sensitive specimens	12
Editorial Board	12
Editorial Board	12
Editorial Board	12
Photovoltaic and photothermal effects induced by visible laser radiation in atomic force microscopy probes	11
Effect of the surrounding environment on electron beam irradiation damage of enhanced green fluorescent protein	11
Data synchronization in operando gas and heating TEM	11
Design of electrostatic lenses through genetic algorithm and particle swarm optimisation methods integrated with differential algebra	11
Angstrom-scale imaging of magnetization in antiferromagnetic Fe2As via 4D-STEM	10
Temporal coherence envelope function of field emission in electron microscopy	10
Automated classification of nanoparticles with various ultrastructures and sizes via deep learning	10
Orientation, pattern center refinement and deformation state extraction through global optimization algorithms	10
Role of slice thickness quantification in the 3D reconstruction of FIB tomography data of nanoporous materials	10
Clustering characteristic diffraction vectors in 4-D STEM data sets from overlapping structures in nanocrystalline and amorphous materials	10
Dynamical diffraction effects of inhomogeneous strain fields investigated by scanning convergent electron beam diffraction and dark field electron holography	10
Fiber-optic sample illuminator design for the observation of light induced phenomena with transmission electron microscopy in situ: Antimicrobial photodynamic therapy	10
Preface to special section on imaging, diffraction and crystallography – John Spence's legacy	10
Crystal lattice image reconstruction from Moiré sampling scanning transmission electron microscopy	10
The impact of electric field strength on the accuracy of boron dopant quantification in silicon using atom probe tomography	10
Dose measurement in the TEM and STEM	10
Parameter dependence of depth and lateral resolution of transmission Kikuchi diffraction	10
In situ STEM analysis of electron beam induced chemical etching of an ultra-thin amorphous carbon foil by oxygen during high resolution scanning	9
Dose symmetric electron diffraction tomography (DS-EDT): Implementation of a dose-symmetric tomography scheme in 3D electron diffraction	9
Electron ptychography dose reduction using Moiré sampling on periodic structures	9
Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential	9
Numerical simulations of field emission characteristics of open CNT	9
In multi electron beam systems, “Neighbours Matter”	9
High-precision atomic imaging using an innovative vibration-isolated scanning tunneling microscope	9

The influence of chromatic aberration on the dose-limited spatial resolution of transmission electron microscopy	9
An improved method assigning three-dimensional atomic potentials to multiple slices in exit-wave simulations of Transmission Electron Microscopy	9
Inter-Bragg crystallographic phase retrieval from shape transforms, stacking faults and substitutional disorder	9
Differential phase contrast STEM image calculation software – Magnifier	9
Reflection imaging with a helium zone plate microscope	9
Theoretical study on sixth-order geometrical aberration correction	9
Editorial Board	9
Exploiting the full potential of the advanced two-hexapole corrector for STEM exemplified at 60kV	9
High-precision atomic-scale strain mapping of nanoparticles from STEM images	9
Phase offset method of ptychographic contrast reversal correction	9
Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy	8
Strategy for optimizing experimental settings for studying low atomic number colloidal assemblies using liquid phase scanning transmission electron microscopy	8
Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Wolfgang Baumeister, Colin Humphreys, John Spence and Knut Urban on the occasion of their 75th, 80	8
Semicircular-aperture illumination scanning transmission electron microscopy	8
A semi-classical theory of magnetic inelastic scattering in transmission electron energy loss spectroscopy	8
Interfacial excess of solutes across phase boundaries using atom probe microscopy	8
Signal detection and imaging methods for MEMS electron microscope	8
Coherent and incoherent imaging of biological specimens with electrons and X-rays	8
Stroboscopic ultrafast imaging using RF strip-lines in a commercial transmission electron microscope	8
Editorial Board	8
Workflow automation of SEM acquisitions and feature tracking	8
Reaction-diffusion study of electron-beam-induced contamination growth	8
Directly correlated microscopy of trench defects in InGaN quantum wells	8
Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by scanning precession electron diffraction tomography	8
Data-driven control in atomic force microscopy using a genetic algorithm	8
In my Good Books	8
In-situ characterization of discharge products of lithium-oxygen battery using Flow Electrochemical Atomic Force Microscopy	8
Influence of magnetic field on electron beam-induced Coulomb explosion of gold microparticles in transmission electron microscopy	8
Accurate and fast localization of EBSD pattern centers for screen moving technology	8
Generational assessment of EBSD detectors for cross-correlation-based analysis: From scintillators to direct detection	7
Editorial Board	7
Near-real-time diagnosis of electron optical phase aberrations in scanning transmission electron microscopy using an artificial neural network	7
WRAP: A wavelet-regularised reconstruction algorithm for magnetic vector electron tomography	7
Symmetry of diffraction patterns of two-dimensional crystal structures	7
A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learning	7
Editorial Board	7
Editorial Board	7
A method for estimating magnetic field of TEM objective lens	7
Fluctuation cepstral scanning transmission electron microscopy of mixed-phase amorphous materials	7
Editorial Board	7
Theoretical study on the effect of temperature gradient on contact-free scanning for scanning ion conductance microscopy	7
Real-time electron clustering in an event-driven hybrid pixel detector	7
Computer vision AC-STEM automated image analysis for 2D nanopore applications	7
Direct investigations of the electrical conductivity of normal and cancer breast cells by conductive atomic force microscopy	7
Enhancing classification in correlative microscopy using multiple classifier systems with dynamic selection	7
Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM	7
Recovery of spatial frequencies in coherent diffraction imaging in the presence of a central obscuration	7
Spectrum imaging measurements with semi-parallel detection using an AES apparatus	7
Brightness evaluation of pulsed electron gun using negative electron affinity photocathode developed for time-resolved measurement using scanning electron microscope	7
Editorial Board	6
Emittance minimization for aberration correction I: Aberration correction of an electron microscope without knowing the aberration coefficients	6
High precision orientation mapping from 4D-STEM precession electron diffraction data through quantitative analysis of diffracted intensities	6
Unitary two-state quantum operators realized by quadrupole fields in the electron microscope	6
On the instrument-dependent appearance of ion dissociation events in atom probe tomography mass spectra	6
Interpretability of high-resolution transmission electron microscopy images	6
Atom probe specimen preparation methods for nanoparticles	6
Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy	6
Non-negative matrix factorization-aided phase unmixing and trace element quantification of STEM-EDXS data	6
New Poisson denoising method for pulse-count STEM imaging	6
Parameter retrieval of small particles in dark-field Fourier ptychography and a rectangle in real-space ptychography	6
WhatEELS. A python-based interactive software solution for ELNES analysis combining clustering and NLLS	6
Machine learning based de-noising of electron back scatter patterns of various crystallographic metallic materials fabricated using laser directed energy deposition	6
A versatile sample fabrication method for ultrafast electron diffraction	6
A method for a column-by-column EELS quantification of barium lanthanum ferrate	6
Process optimization of broad ion beam milling for preparation of coating cross-sections	6
Editorial Board	6
Site-specific plan-view (S)TEM sample preparation from thin films using a dual-beam FIB-SEM	6
Exploration of fs-laser ablation parameter space for 2D/3D imaging of soft and hard materials by tri-beam microscopy	6
Prediction of the morphology of nano particles based solely on atom counting data	6
Splicing dual-range EELS spectra: Identifying and correcting artefacts	6