Ultramicroscopy

Papers
(The TQCC of Ultramicroscopy is 6. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-06-01 to 2025-06-01.)
ArticleCitations
Corrigendum to “Electron crystallography of chiral and non-chiral small molecules” [Ultramicroscopy 232 (2022) 113417]58
On central focusing for contrast optimization in direct electron ptychography of thick samples40
Editorial Board36
Quantitative composition determination by ADF-STEM at a low-angular regime: a combination of EFSTEM and 4DSTEM30
Uncovering polar vortex structures by inversion of multiple scattering with a stacked Bloch wave model30
Methodology and implementation of a tunable deep-ultraviolet laser source for photoemission electron microscopy28
Nano1D: An accurate computer vision software for analysis and segmentation of low-dimensional nanostructures24
Non-contact non-resonant atomic force microscopy method for measurements of highly mobile molecules and nanoparticles23
Unraveling van der Waals epitaxy: A real-time in-situ study of MoSe2 growth on graphene/Ru(0001)22
Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guide22
In search of best automated model: Explaining nanoparticle TEM image segmentation21
Characterization of the mechanical properties of the cortex region of human hair fibers by multiparametric atomic force microscopy mapping21
Momentum Microscopy with Combined Hemispherical and Time-of-Flight Electron Analyzers at the Soft X-ray Beamline I09 of the Diamond Light Source20
espm: A Python library for the simulation of STEM-EDXS datasets20
A simple circularity-based approach for nanoparticle size histograms beyond the spherical approximation19
Gun energy filter for a low energy electron microscope18
Development of a liquid-helium free cryogenic sample holder with mK temperature control for autonomous electron microscopy18
L-shell ionization of Cd: Structure of the x-ray emission spectrum18
Improving the accuracy of temperature measurement on TEM samples using plasmon energy expansion thermometry (PEET): Addressing sample thickness effects17
Editorial Board17
Editorial Board16
Prospect for measuring two-dimensional van der Waals magnets by electron magnetic chiral dichroism15
Imaging biological macromolecules in thick specimens: The role of inelastic scattering in cryoEM15
A sorter for electrons based on magnetic elements15
Mapping of lattice distortion in martensitic steel—Comparison of different evaluation methods of EBSD patterns14
Edge-induced excitations in Bi214
Direct investigations of interactions between nucleolins and aptamers on pancreatic cancer and normal cells by atomic force microscopy14
Perimeter procedure to produce average equivalent area grain size14
Positioning and atomic imaging of micron-size graphene sheets by a scanning tunneling microscope14
Controlling the parameters of focused ion beam for ultra-precise fabrication of nanostructures13
Multimode Objective Lens for Momentum Microscopy and XPEEM: Theory13
Standardizing resolution definition in scanning helium microscopy13
Accurate magnification determination for cryoEM using gold13
Weld-free mounting of lamellae for electrical biasing operando TEM13
Optimized detector configurations for the reconstruction of phase-contrast images in scanning transmission electron microscopy12
Impact of beam size and diffraction effects in the measurement of long-range electric fields in crystalline samples via 4DSTEM12
Site-specific plan-view TEM lamella preparation of pristine surfaces with a large field of view12
Exploring deep learning models for 4D-STEM-DPC data processing12
Quantitative three-dimensional characterization of critical sizes of non-spherical TiO2 nanoparticles by using atomic force microscopy12
Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization12
Commonsense and common nonsense opinions: PROSPECTS for further reducing beam damage in electron microscopy of radiation-sensitive specimens12
The reference window for reduced perturbation of the reference wave in electrical biasing off-axis electron holography12
Editorial Board12
The characterisation of dental enamel using transmission Kikuchi diffraction in the scanning electron microscope combined with dynamic template matching12
The impact of electric field strength on the accuracy of boron dopant quantification in silicon using atom probe tomography11
Editorial Board11
Regularization techniques for 3D surface reconstruction from four quadrant backscattered electron detector images11
Editorial Board11
Editorial Board11
Minimum-dose phase-contrast tomography by successive numerical optical sectioning employing the aberration-corrected STEM and a pixelated detector11
Editorial Board11
Effect of the surrounding environment on electron beam irradiation damage of enhanced green fluorescent protein10
Angstrom-scale imaging of magnetization in antiferromagnetic Fe2As via 4D-STEM10
Evaluation of electron radiation damage to green fluorescent protein10
Role of slice thickness quantification in the 3D reconstruction of FIB tomography data of nanoporous materials10
Data synchronization in operando gas and heating TEM10
Angular dynamics of small nanoparticles induced by non-vortex electron beams10
Analysis of Local Charges at Hetero-interfaces by Electron Holography – A Comparative Study of Different Techniques10
Design of electrostatic lenses through genetic algorithm and particle swarm optimisation methods integrated with differential algebra10
Ultrastructure of antennal sensilla of Anastatus orientalis (Hymenoptera: Eupelmidae), an egg parasitoid of the invasive spotted lanternfly, Lycorma delicatula (Hemiptera: Fulgoridae)10
Photovoltaic and photothermal effects induced by visible laser radiation in atomic force microscopy probes10
A new method for estimating nanoparticle deposition coverage from a set of weak-contrast SEM images10
Gold nanoparticles and tilt pairs to assess protein flexibility by cryo-electron microscopy9
Temporal coherence envelope function of field emission in electron microscopy9
Manganese Migration in Li1-xMn2O4 Cathode Materials9
Parameter dependence of depth and lateral resolution of transmission Kikuchi diffraction9
Editorial Board9
Dynamical diffraction effects of inhomogeneous strain fields investigated by scanning convergent electron beam diffraction and dark field electron holography9
Orientation, pattern center refinement and deformation state extraction through global optimization algorithms9
Crystal lattice image reconstruction from Moiré sampling scanning transmission electron microscopy9
Preface to special section on imaging, diffraction and crystallography – John Spence's legacy9
Clustering characteristic diffraction vectors in 4-D STEM data sets from overlapping structures in nanocrystalline and amorphous materials9
High-resolution compositional mapping of surfaces in non-contact atomic force microscopy by a new multi-frequency excitation8
Editorial Board8
Dose measurement in the TEM and STEM8
In situ STEM analysis of electron beam induced chemical etching of an ultra-thin amorphous carbon foil by oxygen during high resolution scanning8
Phase offset method of ptychographic contrast reversal correction8
Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential8
The influence of chromatic aberration on the dose-limited spatial resolution of transmission electron microscopy8
Dose symmetric electron diffraction tomography (DS-EDT): Implementation of a dose-symmetric tomography scheme in 3D electron diffraction8
Reflection imaging with a helium zone plate microscope8
Exploiting the full potential of the advanced two-hexapole corrector for STEM exemplified at 60kV8
An improved method assigning three-dimensional atomic potentials to multiple slices in exit-wave simulations of Transmission Electron Microscopy8
Accuracy and precision of position determination in ISTEM imaging of BaTiO8
Electron ptychography dose reduction using Moiré sampling on periodic structures8
Fiber-optic sample illuminator design for the observation of light induced phenomena with transmission electron microscopy in situ: Antimicrobial photodynamic therapy8
Automated classification of nanoparticles with various ultrastructures and sizes via deep learning8
Theoretical study on sixth-order geometrical aberration correction8
In multi electron beam systems, “Neighbours Matter”8
Numerical simulations of field emission characteristics of open CNT8
Influence of magnetic field on electron beam-induced Coulomb explosion of gold microparticles in transmission electron microscopy7
Workflow automation of SEM acquisitions and feature tracking7
Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Wolfgang Baumeister, Colin Humphreys, John Spence and Knut Urban on the occasion of their 75th, 807
Semicircular-aperture illumination scanning transmission electron microscopy7
Differential phase contrast STEM image calculation software – Magnifier7
Computer vision AC-STEM automated image analysis for 2D nanopore applications7
Coherent and incoherent imaging of biological specimens with electrons and X-rays7
Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy7
Generational assessment of EBSD detectors for cross-correlation-based analysis: From scintillators to direct detection7
Stroboscopic ultrafast imaging using RF strip-lines in a commercial transmission electron microscope7
High-precision atomic-scale strain mapping of nanoparticles from STEM images7
Editorial Board7
Signal detection and imaging methods for MEMS electron microscope7
Strategy for optimizing experimental settings for studying low atomic number colloidal assemblies using liquid phase scanning transmission electron microscopy7
Editorial Board7
Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by scanning precession electron diffraction tomography7
Reaction-diffusion study of electron-beam-induced contamination growth7
Interfacial excess of solutes across phase boundaries using atom probe microscopy7
Inter-Bragg crystallographic phase retrieval from shape transforms, stacking faults and substitutional disorder7
A semi-classical theory of magnetic inelastic scattering in transmission electron energy loss spectroscopy7
In my Good Books7
Directly correlated microscopy of trench defects in InGaN quantum wells7
In-situ characterization of discharge products of lithium-oxygen battery using Flow Electrochemical Atomic Force Microscopy7
Accurate and fast localization of EBSD pattern centers for screen moving technology7
Editorial Board7
Editorial Board6
Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy6
Theoretical study on the effect of temperature gradient on contact-free scanning for scanning ion conductance microscopy6
Editorial Board6
Near-real-time diagnosis of electron optical phase aberrations in scanning transmission electron microscopy using an artificial neural network6
Real-time electron clustering in an event-driven hybrid pixel detector6
A method for a column-by-column EELS quantification of barium lanthanum ferrate6
Symmetry of diffraction patterns of two-dimensional crystal structures6
High precision orientation mapping from 4D-STEM precession electron diffraction data through quantitative analysis of diffracted intensities6
Spectrum imaging measurements with semi-parallel detection using an AES apparatus6
WRAP: A wavelet-regularised reconstruction algorithm for magnetic vector electron tomography6
Recovery of spatial frequencies in coherent diffraction imaging in the presence of a central obscuration6
A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learning6
Unitary two-state quantum operators realized by quadrupole fields in the electron microscope6
Enhancing classification in correlative microscopy using multiple classifier systems with dynamic selection6
New Poisson denoising method for pulse-count STEM imaging6
Fluctuation cepstral scanning transmission electron microscopy of mixed-phase amorphous materials6
Brightness evaluation of pulsed electron gun using negative electron affinity photocathode developed for time-resolved measurement using scanning electron microscope6
A method for estimating magnetic field of TEM objective lens6
Direct investigations of the electrical conductivity of normal and cancer breast cells by conductive atomic force microscopy6
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