OOIR: Observatory of International Research

Papers

(The TQCC of Ultramicroscopy is 6. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2020-05-01 to 2024-05-01.)

Article	Citations
Hybrid pixel direct detector for electron energy loss spectroscopy	61
The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision	40
Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications	36
Adaptive domain misorientation approach for the EBSD measurement of deformation induced dislocation sub-structures	35
Contrast transfer and noise considerations in focused-probe electron ptychography	29
3D electron backscatter diffraction study of α lath morphology in additively manufactured Ti-6Al-4V	26
Automated Detection of Helium Bubbles in Irradiated X-750	25
Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings	22
Spectral DQE of the Volta phase plate	22
Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition	20
Imaging Polarity in Two Dimensional Materials by Breaking Friedel's Law	20
Coupled Broad Ion Beam–Scanning Electron Microscopy (BIB–SEM) for polishing and three dimensional (3D) serial section tomography (SST)	19
Sub-pixel electron detection using a convolutional neural network	19
Denoising atomic resolution 4D scanning transmission electron microscopy data with tensor singular value decomposition	19
Micrograph contrast in low-voltage SEM and cryo-SEM	18
Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challenges	18
Training artificial neural networks for precision orientation and strain mapping using 4D electron diffraction datasets	18
Dose measurement in the TEM and STEM	18
Graphene encapsulation enabled high-throughput atom probe tomography of liquid specimens	18
Tracking the picoscale spatial motion of atomic columns during dynamic structural change	18
Free, flexible and fast: Orientation mapping using the multi-core and GPU-accelerated template matching capabilities in the Python-based open source 4D-STEM analysis toolbox Pyxem	17
Deep learning for scanning electron microscopy: Synthetic data for the nanoparticles detection	17
Exploring the accuracy of isotopic analyses in atom probe mass spectrometry	17
Spatial and spectral dynamics in STEM hyperspectral imaging using random scan patterns	16
Low energy nano diffraction (LEND) – A versatile diffraction technique in SEM	16

Lattice resolution of vibrational modes in the electron microscope	16
FIB/SEM tomography segmentation by optical flow estimation	16
Sub-Sampled Imaging for STEM: Maximising Image Speed, Resolution and Precision Through Reconstruction Parameter Refinement	15
Beam-sensitive metal-organic framework structure determination by microcrystal electron diffraction	15
Correction of artefacts associated with large area EBSD	15
Orientation mapping of graphene using 4D STEM-in-SEM	15
Non-negative matrix factorization for mining big data obtained using four-dimensional scanning transmission electron microscopy	15
Atom column detection from simultaneously acquired ABF and ADF STEM images	15
Quantitative electric field mapping of a p–n junction by DPC STEM	15
Suppressing dynamical diffraction artefacts in differential phase contrast scanning transmission electron microscopy of long-range electromagnetic fields via precession	15
A high-speed atomic force microscopy with super resolution based on path planning scanning	15
Stroboscopic ultrafast imaging using RF strip-lines in a commercial transmission electron microscope	14
Integrated correction of optical distortions for global HR-EBSD techniques	14
Efficient large field of view electron phase imaging using near-field electron ptychography with a diffuser	14
A multi-ion plasma FIB study: Determining ion implantation depths of Xe, N, O and Ar in tungsten via atom probe tomography	14
An in-situ method for protecting internal cracks/pores from ion beam damage and reducing curtaining for TEM sample preparation using FIB	14
Imaging biological macromolecules in thick specimens: The role of inelastic scattering in cryoEM	14
Ultra-high contrast STEM imaging for segmented/pixelated detectors by maximizing the signal-to-noise ratio	14
A new type of nanoscale reference grating manufactured by combined laser-focused atomic deposition and x-ray interference lithography and its use for calibrating a scanning electron microscope	14
EBSD pattern simulations for an interaction volume containing lattice defects	14
Event-based hyperspectral EELS: towards nanosecond temporal resolution	13
In search of best automated model: Explaining nanoparticle TEM image segmentation	13
TrueEBSD: Correcting spatial distortions in electron backscatter diffraction maps	13
Wavelength-multiplexed single-shot ptychography	13
Dissecting complex nanoparticle heterostructures via multimodal data fusion with aberration-corrected STEM spectroscopy	13
High-quality reconstruction of coherent modulation imaging using weak cascade modulators	13
Influence of lens aberrations, specimen thickness and tilt on differential phase contrast STEM images	13
A simple method to clean ligand contamination on TEM grids	13
Achieving diffraction-limited resolution in soft-X-ray Fourier-transform holography	12
Auto-segmentation technique for SEM images using machine learning: Asphaltene deposition case study	12
ab initio description of bonding for transmission electron microscopy	12
30 T scanning tunnelling microscope in a hybrid magnet with essentially non-metallic design	12
TEM bright field imaging of thick specimens: nodes in Thon ring patterns	12
The performance evaluation of direct detection electron energy-loss spectroscopy at 200 kV and 80 kV accelerating voltages	12
Integrated super resolution fluorescence microscopy and transmission electron microscopy	11
High resolution atomic scale characterization of dislocations in high entropy alloys: Critical assessment of template matching and geometric phase analysis	11
Charting the low-loss region in electron energy loss spectroscopy with machine learning	11
Modulator refinement algorithm for coherent modulation imaging	11
Mapping valence electron distributions with multipole density formalism using 4D-STEM	11
Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM	11
Quantifying the performance of a hybrid pixel detector with GaAs:Cr sensor for transmission electron microscopy	11
Fast reconstruction of atomic-scale STEM-EELS images from sparse sampling	11
3D characterisation using plasma FIB-SEM: A large-area tomography technique for complex surfaces like black silicon	11
Integrated wafer-scale manufacturing of electron cryomicroscopy specimen supports	10
Accurate measurement of strain at interfaces in 4D-STEM: A comparison of various methods	10
Evaluation of different rectangular scan strategies for STEM imaging	10
Dirac, c and a Supper date	10
Defocus-dependent Thon-ring fading	10
A new solution to the curved Ewald sphere problem for 3D image reconstruction in electron microscopy	10
Inelastic mean free path measurement by STEM-EELS technique using needle-shaped specimen	10

Reconstructing porous structures from FIB-SEM image data: Optimizing sampling scheme and image processing	10
Effect of electron beam irradiation on the temperature of single AuGe nanoparticles in a TEM	10
Autofocus of whole slide imaging based on convolution and recurrent neural networks	10
Spin structure relation to phase contrast imaging of isolated magnetic Bloch and Néel skyrmions	10
On the reduction in the effects of radiation damage to two-dimensional crystals of organic and biological molecules at liquid-helium temperature	10
A versatile sample fabrication method for ultrafast electron diffraction	10
Unravelling new principles of site-selective doping contrast in the dual-beam focused ion beam/scanning electron microscope	10
Alignment of electron optical beam shaping elements using a convolutional neural network	10
Wet-chemical etching of FIB lift-out TEM lamellae for damage-free analysis of 3-D nanostructures	9
Directly correlated microscopy of trench defects in InGaN quantum wells	9
Experimental realization of a π/2 vortex mode converter for electron	9
Cepstral scanning transmission electron microscopy imaging of severe lattice distortions	9
Off-axis electron holography of Néel-type skyrmions in multilayers of heavy metals and ferromagnets	9
Transmission imaging on a scintillator in a scanning electron microscope	9
Aggregated nanoparticles: Sample preparation and analysis by atom probe tomography	9
Quantification of reagent mixing in liquid flow cells for Liquid Phase-TEM	9
Origin and Suppression of Beam Damage-Induced Oxygen-K Edge Artifact from γ-Al2O3 using Cryo-EELS	9
Accurate EELS background subtraction – an adaptable method in MATLAB	9
Dimensionality reduction and unsupervised clustering for EELS-SI	9
Beam shaping and probe characterization in the scanning electron microscope	9
STEM electron beam-induced current measurements of organic-inorganic perovskite solar cells	8
Analysis of nanoscale fluid inclusions in geomaterials by atom probe tomography: Experiments and numerical simulations	8
On 2D-FTIR-XRF microscopy – A step forward correlative tissue studies by infrared and hard X-ray radiation	8
Direct investigations of the electrical conductivity of normal and cancer breast cells by conductive atomic force microscopy	8
The behavior of Fowler-Nordheim plot from carbon nanotubes-based large area field emitters arrays	8
Correlating local chemical and structural order using Geographic Information Systems-based spatial statistics	8
Precise measurement of the electron beam current in a TEM	8
Laser ablation sample preparation for atom probe tomography and transmission electron microscopy	8
A cartridge-based turning specimen holder with wireless tilt angle measurement for magnetic induction mapping in the transmission electron microscope	8
Quantitative analysis of spectroscopic low energy electron microscopy data: High-dynamic range imaging, drift correction and cluster analysis	8
The studies on wet chemical etching via in situ liquid cell TEM	8
Atom probe tomography quantification of carbon in silicon	8
Chemical kinetics for operando electron microscopy of catalysts: 3D modeling of gas and temperature distributions during catalytic reactions	8
4D-STEM at interfaces to GaN: Centre-of-mass approach & NBED-disc detection	8
The importance of temporal and spatial incoherence in quantitative interpretation of 4D-STEM	7
Neutral helium atom microscopy	7
Support vector machine for EELS oxidation state determination	7
Observer Design for Topography Estimation in Atomic Force Microscopy Using Neural and Fuzzy Networks	7
Reducing bias and variance for CTF estimation in single particle cryo-EM	7
3D electron backscatter diffraction characterization of fine α titanium microstructures: collection, reconstruction, and analysis methods	7
Theoretical modeling and simulation-based assessment of graded-bandgap AlGaAs/GaAs electron-injection cathode	7
Quantum theory of magnon excitation by high energy electron beams	7
Brightness evaluation of pulsed electron gun using negative electron affinity photocathode developed for time-resolved measurement using scanning electron microscope	7
Local electronic transport across probe/ionic conductor interface in scanning probe microscopy	7
Relative roles of multiple scattering and Fresnel diffraction in the imaging of small molecules using electrons	7
Correlation symmetry analysis of electron nanodiffraction from amorphous materials	7
Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in Si	7
Implementation and operation of a fiber-coupled CMOS detector in a low energy electron Microscope	7
Spectral detection of spin-polarized ultra low-energy electrons in semiconductor heterostructures	7
Sub-Kelvin thermometry for evaluating the local temperature stability within in situ TEM gas cells	6
Identification and correction of temporal and spatial distortions in scanning transmission electron microscopy	6
Influence of electron landing energy on the measurement of the dimensional properties of nanoparticle populations imaged by SEM	6
Orientation, pattern center refinement and deformation state extraction through global optimization algorithms	6
Conductivity models for electron energy loss spectroscopy of graphene in a scanning transmission electron microscope with high energy resolution	6
Investigation of gas-electron interactions with electron holography	6
Contrast modes in a 3D ion transmission approach at keV energies	6
A user-friendly FIB lift-out technique to prepare plan-view TEM sample of 2D thin film materials	6
Influence of experimental conditions on localized surface plasmon resonances measurement by electron energy loss spectroscopy	6
Computer vision AC-STEM automated image analysis for 2D nanopore applications	6
Molecular dynamics simulation of bimodal atomic force microscopy	6
Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential	6
Evaluation of microstructure and conductivity of two-phase materials by the scanning spreading resistance microscopy (the case of shungite)	6
High-precision orientation mapping from spherical harmonic transform indexing of electron backscatter diffraction patterns	6
An algorithm for correcting systematic energy deficits in the atom probe mass spectra of insulating samples	6
Flat electron mirror	6
Exploring valence states of abnormal mineral deposits in biological tissues using correlative microscopy and spectroscopy techniques: A case study on ferritin and iron deposits from Alzheimer’s diseas	6
Controlling the parameters of focused ion beam for ultra-precise fabrication of nanostructures	6
The Performance of EDXS at Elevated Sample Temperatures Using a MEMS-Based In Situ TEM Heating System	6
Convergent beam electron diffraction of multilayer Van der Waals structures	6
Nanowire facilitated transfer of sensitive TEM samples in a FIB	6
SIM-STEM Lab: Incorporating Compressed Sensing Theory for Fast STEM Simulation	6
Factors limiting quantitative phase retrieval in atomic-resolution differential phase contrast scanning transmission electron microscopy using a segmented detector	6
Three dimensional cluster analysis for atom probe tomography using Ripley’s K-function and machine learning	6
A new sample preparation protocol for SEM and TEM particulate matter analysis	6
Phase contrast imaging with inelastically scattered electrons from any layer of a thick specimen	6
Extracting weak magnetic contrast from complex background contrast in plan-view FeGe thin films	6
Effects of atom probe analysis parameters on composition measurement of precipitates in an Al-Mg-Si-Cu alloy	6
Low terahertz-band scanning near-field microscope with 155-nm resolution	6
Atomically resolved low-temperature scanning tunneling microscope operating in a 22 T water-cooled magnet	6
Field dependent study on the impact of co-evaporated multihits and ion pile-up for the apparent stoichiometric quantification of GaN and AlN	6