IEEE Electron Device Letters

Papers
(The H4-Index of IEEE Electron Device Letters is 41. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-06-01 to 2025-06-01.)
ArticleCitations
Table of Contents165
Editorial 2020 Electron Devices Society George E. Smith Award133
IEEE Electron Device Letters information for authors132
Blank Page124
EDS Meetings Calendar85
Front Cover80
Hot Carrier Degradation Reduction in Metal Oxide Thin-Film Transistors by Implementing a Lightly Doped Drain-Like Structure68
RFIC 2023 Call for Papers68
Blank Page66
Table of Contents61
Hot Carrier Degradation Accompanied by Recovery in InSnZnO Thin-Film Transistors61
Small-Area Perovskite Photodiodes With High Detectivity and Stability60
Choice of Metal as Gate Electrode of Thin-Film Transistor With High-k Gate Dielectric60
A Voltage-Controlled Gain Cell Magnetic Memory58
Plasma Processes for Vertical Niobium Nitride Superconducting Through Silicon Vias58
First Experiment of a 600-GHz CW Gyrotron Developed as Light Source for EMF Exposure Assessment56
High-Efficiency Metal-Insulator-Metal Electron Emitter Based on Porous Alumina Film54
0.18 dB Low-Noise Figure at 10 GHz for GaN MIS-HEMT With Plasma-Enhanced Atomic Layer Deposition SiN Layer53
A Novel Insulated Gate Trigger Thyristor Integrated With Gate Transient Voltage Suppressor for Ultrahigh di/dt Pulse Switching51
Modulation of Ciss of a 4H-SiC Planar MOSFET With a Shorter Sidewall and a Thicker Gate50
Toward the Measurement of Microwave Electric Field Using Cesium Vapor MEMS Cell50
Asymmetric Interference Behavior in 3D NAND Cell and the Reverse Trend Induced by Undercut of Sacrificial Nitride Film48
Guar Gum-WTe2 Nanohybrid-Based Biomemristor Synapse With Short- and Long-Term Plasticity48
Design and Experimental Research of a Compact Ku-Band Triaxial Klystron Amplifier With Low Seed Injection Power48
Triple-Node FinFET With Non-Ohmic Schottky Junctions for Synaptic Devices47
Conductive Bridging Random Access Memory-Based Switch Matrix for Reconfigurable Interconnection of Chiplet Integration47
Thermal Process and Dopant Diffusion Model of a-InGaZnO TFTs for VT Prediction Using Lateral Carrier Density Profiling Technique46
The Nanoscale Electrical Damage Mechanism of Ge₂Sb₂Te₅ Phase-Change Films Discovered by Conductive Atomic Force Microscopy46
High-Reliability HfO2/ZrO2 Superlattice Ferroelectric Poly-Si FinFET Memory Device Utilizing Green Laser Crystallization46
Rapid On-Wafer Quality Screening of AlGaN/GaN Superlattice Castellated Field Effect Transistors Using Short-Term Stress and Electroluminescence46
Influence of Annealing Temperature on ZrO2 Nanoparticles for Improved Photodetection45
Flexible Organic Optoelectronic Devices for Neuromorphic Computing45
Organic-Inorganic Hybrid Integrated Optical Waveguide Gain Compensator Based on CsPbBr3 Perovskite Nanocrystals45
Changes to the Editorial Board44
A Novel Non-Volatile Optoelectronic Memory: The Photon-Triggered FGMOS43
A Compact Model of Amorphous InGaZnO TFTs to Predict Temperature-Dependent Characteristics43
A 1-V Supply a-InGaZnO-Based Voltage Reference With Enhancement- and Depletion-Mode Thin-Film Transistors42
Highly Sensitive Mutual-Capacitive Fingerprint Sensor With Reference Electrode42
A Flexible Graphene-Based Fabric Ultrasound Source for Machine Learning Enhanced Information Encryption42
Impact of the Low Temperature Ohmic Contact Process on DC and Forward Gate Bias Stress Operation of GaN HEMT Devices42
Investigating Forward Gate ESD Mechanism of Schottky-Type p-GaN Gate HEMTs Using a SiC-Based High-Speed Pulsed I-V Test System41
Ultrathin Interfacial Layer and Pre-Gate Annealing to Suppress Virtual Gate Formation in GaN-Based Transistors: The Impact of Trapping and Fluorine Inclusion41
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