Journal of Electronic Testing-Theory and Applications

Papers
(The TQCC of Journal of Electronic Testing-Theory and Applications is 2. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2020-05-01 to 2024-05-01.)
ArticleCitations
LoBA: A Leading One Bit Based Imprecise Multiplier for Efficient Image Processing22
Spectrum Analyzer Based on a Dynamic Filter13
Aging-Resilient SRAM-based True Random Number Generator for Lightweight Devices12
Low-Cost Error Detection in Deep Neural Network Accelerators with Linear Algorithmic Checksums11
Hardware Obfuscation for IP Protection of DSP Applications9
SC-COTD: Hardware Trojan Detection Based on Sequential/Combinational Testability Features using Ensemble Classifier9
Review of Manufacturing Process Defects and Their Effects on Memristive Devices8
Traxtor: An Automatic Software Test Suit Generation Method Inspired by Imperialist Competitive Optimization Algorithms8
Analysis of Security Vulnerability Levels of In-Vehicle Network Topologies Applying Graph Representations8
A Review of Various Defects in PCB7
Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient Faults7
Resistance of the Montgomery Ladder Against Simple SCA: Theory and Practice7
An Efficient VLSI Test Data Compression Scheme for Circular Scan Architecture Based on Modified Ant Colony Meta-heuristic6
Aging Prediction and Tolerance for the SRAM Memory Cell and Sense Amplifier6
Model Transferability from ImageNet to Lithography Hotspot Detection6
Fault Diagnosis Method of Low Noise Amplifier Based on Support Vector Machine and Hidden Markov Model6
Pre-Silicon Verification Using Multi-FPGA Platforms: A Review6
Fault Diagnosis of Linear Analog Electronic Circuit Based on Natural Response Specification using K-NN Algorithm6
A Source-code Aware Method for Software Mutation Testing Using Artificial Bee Colony Algorithm6
Comprehensive Analysis and Optimization of Reliable Viterbi Decoder Circuits Implemented in Modular VLSI Design Logic Styles5
Hardware Efficient Approximate Multiplier Architecture for Image Processing Applications5
Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies5
CMOS Implementation and Performance Analysis of Known Approximate 4:2 Compressors4
Design of Power Gated SRAM Cell for Reducing the NBTI Effect and Leakage Power Dissipation During the Hold Operation4
Smell Detection Agent Optimization Approach to Path Generation in Automated Software Testing4
Automated Design Error Debugging of Digital VLSI Circuits4
Design and Evaluation of XOR Arbiter Physical Unclonable Function and its Implementation on FPGA in Hardware Security Applications4
Thermal-aware Test Data Compression for System-on-Chip Based on Modified Bitmask Based Methods4
Novel Fault-Tolerant Processing in Memory Cell in Ternary Quantum-Dot Cellular Automata4
A Low Power-Consumption Triple-Node-Upset-Tolerant Latch Design4
Hardware Trojan Free Netlist Identification: A Clustering Approach4
A Fault Verification Method Based on the Substitution Theorem and Voltage-Current Phase Relationship4
Self Healing Controllers to Mitigate SEU in the Control Path of FPGA Based System: A Complete Intrinsic Evolutionary Approach4
A Systematic Bit Selection Method for Robust SRAM PUFs4
Reducing Aging Impacts in Digital Sensors via Run-Time Calibration4
Design of Radiation Hardened Latch and Flip-Flop with Cost-Effectiveness for Low-Orbit Aerospace Applications4
Retesting Defective Circuits to Allow Acceptable Faults for Yield Enhancement4
Neural Network-based Online Fault Diagnosis in Wireless-NoC Systems3
Tipping Point Analysis of Electrical Resistance Data with Early Warning Signals of Failure for Predictive Maintenance3
Part I: Evaluation for Hardware Trojan Detection Based on Electromagnetic Radiation3
AFIA: ATPG-Guided Fault Injection Attack on Secure Logic Locking3
Parameterizable Real Number Models for Mixed-Signal Designs Using SystemVerilog3
Single Particle Fault Injection Signal Generation Method Using Gaussian Cloud Model3
Novel MEMS Piezoresistive Sensor with Hair-Pin Structure to Enhance Tensile and Compressive Sensitivity and Correct Non-Linearity3
Analysis and Detection of Open-gate Defects in Redundant Structures of a FinFET SRAM Cell3
Error-Efficient Approximate Multiplier Design using Rounding Based Approach for Image Smoothing Application3
Identifying Resistive Open Defects in Embedded Cells under Variations3
Multiple Retest Systems for Screening High-Quality Chips2
Influence of Printed Circuit Board Dynamics on the Fretting Wear of Electronic Connectors: A Dynamic Analysis Approach2
Estimating Operational Age of an Integrated Circuit2
Hardware Trojan Detection Method Based on Dual Discriminator Assisted Conditional Generation Adversarial Network2
Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects2
Soft Errors Sensitivity of SRAM Cells in Hold, Write, Read and Half-Selected Conditions2
Diagnosis of Incipient Faults in Nonlinear Analog Circuits Based on High Order Moment Fractional Transform2
A Bit-Error Rate Measurement and Error Analysis of Wireline Data Transmission using Current Source Model for Single Event Effect under Irradiation Environment2
An Accurate Estimation Algorithm for Failure Probability of Logic Circuits Using Correlation Separation2
A New Neural Network Based on CNN for EMIS Identification2
Testable Architecture Design for Programmable Cellular Automata on FPGA Using Run-Time Dynamically Reconfigurable Look-Up Tables2
Investigation of the Impact of BTI Aging Phenomenon on Analog Amplifiers2
Soft Computing Techniques Based CAD Approach for Power Supply Noise Reduction in System-on-Chip2
Method of Implanting Hardware Trojan Based on EHW in Part of Circuit2
Deep Soft Error Propagation Modeling Using Graph Attention Network2
Applying Artificial Neural Networks to Logic Built-in Self-test: Improving Test Point Insertion2
Design of INV/BUFF Logic Locking For Enhancing the Hardware Security2
A probability density estimation algorithm on multiwavelet for the high-resolution ADC2
On Reducing Test Data Volume for Circular Scan Architecture Using Modified Shuffled Shepherd Optimization2
Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit2
TRAP-GATE: A Probabilistic Approach to Enhance Hardware Trojan Detection and its Game Theoretic Analysis2
Built-In Self-Test for Multi-Threshold NULL Convention Logic Asynchronous Circuits using Pipeline Stage Parallelism2
Cross-PUF Attacks: Targeting FPGA Implementation of Arbiter-PUFs2
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