OOIR: Observatory of International Research

Papers

(The TQCC of Journal of Electronic Testing-Theory and Applications is 3. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2022-06-01 to 2026-06-01.)

Article	Citations
Using both Stable and Unstable SRAM Bits for the Physical Unclonable Function	52
Achieving Agility in Projects Through Hierarchical Divisive Clustering Algorithm	21
Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial Approach	19
Read & Write Stability of CNTFET 6T SRAM Cell: A Comprehensive Analysis	17
Comparison of Single Event Effect and Space Electrostatic Discharge Effect on FPGA Signal Transmission	16
On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits	15
Artificial Neural Network Based Prediction Model for IR Drop Measurement in a VLSI Power Delivery Network	14
Design and Verification of an Asynchronous NoC Router Architecture for GALS Systems	14
Design and Simulation of a Dependable Architecture Using Triple Modular Redundancy for Embedded Cyber-Physical Systems	12
Smell Detection Agent Optimization Approach to Path Generation in Automated Software Testing	11
A Feature-Adaptive and Scalable Hardware Trojan Detection Framework For Third-party IPs Utilizing Multilevel Feature Analysis and Random Forest	10
Logic Locking Based Configurable Obfuscation Cell for Enhanced IC Security	10
Test Case Optimization using Machine Learning based Hybrid Meta-Heuristic Approach	10
Performance Efficient and Fault Tolerant Approximate Adder	9
A Program-Output Estimator for Software Testing Using Program Analysis and Deep Learning Algorithms	8
Wafer-level Adaptive Testing Based on Dual-Predictor Collaborative Decision	8
Enhanced Moth Flame Optimization Algorithm Entropy-Based Centroid SVM-Based Software Defect Prediction	8
A Source-code Aware Method for Software Mutation Testing Using Artificial Bee Colony Algorithm	7
Diagnosis of Analog and Digital Circuit Faults Using Exponential Deep Learning Neural Network	7
The Newsletter of the Test Technology Technical Council of the IEEE Computer Society	7
Investigation of Single Event Effects in a Resistive RAM Memory Array by Coupling TCAD and SPICE Simulations	7
A New Approximate 4-2 Compressor using Merged Sum and Carry	7
Inherent Hardware Identifiers: Advancing IC Traceability and Provenance in the Multi-Die Era	7
Editorial	6
A Flexible Concurrent Testing Scheme for Non-Feedback and Feedback Bridging Faults in Integrated Circuits	6

Editorial	6
Advancing Low Power BIST Architecture with GAN-Driven Test Pattern Optimization	5
Hardware Trojan Detection Method Based on Dual Discriminator Assisted Conditional Generation Adversarial Network	5
Cost-Effective Path Delay Defect Testing Using Voltage/Temperature Analysis Based on Pattern Permutation	5
Development of a Simplified Programming Kit Based 16LF18856 for Embedded Systems Testing and Education in Developing Countries	5
An End-to-End Mutually Exclusive Autoencoder Method for Analog Circuit Fault Diagnosis	5
SFFHO: Development of Statistical Fitness-based Fire Hawk Optimizer for Software Testing and Maintenance Approach using Adaptive Deep Learning Method	5
Firmware-Driven Adaptive Clock Tuning for Electromagnetic Interference Tolerance in Automotive Systems	5
Network-on-Chip and Photonic Network-on-Chip Basic Concepts: A Survey	5
Editorial	5
2021 JETTA-TTTC Best Paper Award	4
A Multi-Objective Test Scenario Prioritization Method Based on UML Activity Diagram	4
An Investigation into the Failure Characteristics of External PCB Traces with Different Angle Bends	4
A Quadruple-Node Upsets Hardened Latch Design Based on Cross-Coupled Elements	4
Fault Diagnosis of Analog Circuits Using an Improved BiTCN Combined with BiLSTM	4
Influence of Printed Circuit Board Dynamics on the Fretting Wear of Electronic Connectors: A Dynamic Analysis Approach	4
Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift	4
Interleaved Counter Matrix Code in SRAM Memories for Continuous Adjacent Multiple Bit Upset Correction	4
Chebyshev-based Algorithm: Achieving Fast ADC Static Parameter Testing Using a Low-precision Signal Source	4
Cross-PUF Attacks: Targeting FPGA Implementation of Arbiter-PUFs	4
Real-time Embedded System Fault Injector Framework for Micro-architectural State Based Reliability Assessment	4
CMOS Implementation and Performance Analysis of Known Approximate 4:2 Compressors	4
Self Healing Controllers to Mitigate SEU in the Control Path of FPGA Based System: A Complete Intrinsic Evolutionary Approach	4
2022 Reviewers	4
Deep Soft Error Propagation Modeling Using Graph Attention Network	4
A Method of Redundant Feature Suppression in Circuit Output Positions for Analog Circuit Soft and Hard Fault Diagnosis	4
Built-In Self-Test for Multi-Threshold NULL Convention Logic Asynchronous Circuits using Pipeline Stage Parallelism	4
Investigation of Silicon Aging Effects in Dopingless PUF for Reliable Security Solution	3
A Tunable Concurrent BIST Design Based on Reconfigurable LFSR	3
Multi-modal Pre-silicon Evaluation of Hardware Masking Styles	3
Test Technology Newsletter	3
Equivalent Circuit and Damage Threshold Study of Communication Interfaces under HEMP	3
New Second-order Threshold Implementation of Sm4 Block Cipher	3
Modular Test Kit – A Modular Approach for Efficient and Function-Oriented Testing	3
Formal Verification of Universal Numbers using Theorem Proving	3
Syntactic and Semantic Analysis of Temporal Assertions to Support the Approximation of RTL Designs	3
Beyond Power Side Channels: Impedance as a Cryptographic Threat	3
Instant Test and Repair for TSVs using Differential Signaling	3
ATPG Optimization for Bridging Faults in Incomplete Testing of SoCs	3
Dynamic Smartcard Protection and SSELUR-GRU-Based Attack Stage Identification in Industrial IoT	3
Automated Design Error Debugging of Digital VLSI Circuits	3
PrecIRisc: A High-Precision and Low-Bloat Dynamic Binary Instrumentation Tailored for RISC Architectures	3
Towards the Detection of Hardware Trojans with Cost Effective Test Vectors using Genetic Algorithm	3