OOIR: Observatory of International Research

Papers

(The TQCC of Journal of Electronic Testing-Theory and Applications is 3. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2022-05-01 to 2026-05-01.)

Article	Citations
Using both Stable and Unstable SRAM Bits for the Physical Unclonable Function	50
Achieving Agility in Projects Through Hierarchical Divisive Clustering Algorithm	20
Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial Approach	19
Comparison of Single Event Effect and Space Electrostatic Discharge Effect on FPGA Signal Transmission	16
Read & Write Stability of CNTFET 6T SRAM Cell: A Comprehensive Analysis	15
On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits	14
Design and Simulation of a Dependable Architecture Using Triple Modular Redundancy for Embedded Cyber-Physical Systems	13
Artificial Neural Network Based Prediction Model for IR Drop Measurement in a VLSI Power Delivery Network	12
Design and Verification of an Asynchronous NoC Router Architecture for GALS Systems	11
Smell Detection Agent Optimization Approach to Path Generation in Automated Software Testing	10
Investigation of Single Event Effects in a Resistive RAM Memory Array by Coupling TCAD and SPICE Simulations	9
Logic Locking Based Configurable Obfuscation Cell for Enhanced IC Security	9
Inherent Hardware Identifiers: Advancing IC Traceability and Provenance in the Multi-Die Era	9
A Feature-Adaptive and Scalable Hardware Trojan Detection Framework For Third-party IPs Utilizing Multilevel Feature Analysis and Random Forest	9
Enhanced Moth Flame Optimization Algorithm Entropy-Based Centroid SVM-Based Software Defect Prediction	8
Diagnosis of Analog and Digital Circuit Faults Using Exponential Deep Learning Neural Network	8
A Program-Output Estimator for Software Testing Using Program Analysis and Deep Learning Algorithms	8
A Source-code Aware Method for Software Mutation Testing Using Artificial Bee Colony Algorithm	7
Test Case Optimization using Machine Learning based Hybrid Meta-Heuristic Approach	7
Performance Efficient and Fault Tolerant Approximate Adder	7
Wafer-level Adaptive Testing Based on Dual-Predictor Collaborative Decision	7
The Newsletter of the Test Technology Technical Council of the IEEE Computer Society	7
A New Approximate 4-2 Compressor using Merged Sum and Carry	7
SFFHO: Development of Statistical Fitness-based Fire Hawk Optimizer for Software Testing and Maintenance Approach using Adaptive Deep Learning Method	6
Editorial	6

Network-on-Chip and Photonic Network-on-Chip Basic Concepts: A Survey	5
An End-to-End Mutually Exclusive Autoencoder Method for Analog Circuit Fault Diagnosis	5
Editorial	5
A Flexible Concurrent Testing Scheme for Non-Feedback and Feedback Bridging Faults in Integrated Circuits	5
Hardware Trojan Detection Method Based on Dual Discriminator Assisted Conditional Generation Adversarial Network	5
Development of a Simplified Programming Kit Based 16LF18856 for Embedded Systems Testing and Education in Developing Countries	5
Editorial	5
Cost-Effective Path Delay Defect Testing Using Voltage/Temperature Analysis Based on Pattern Permutation	5
Advancing Low Power BIST Architecture with GAN-Driven Test Pattern Optimization	5
Influence of Printed Circuit Board Dynamics on the Fretting Wear of Electronic Connectors: A Dynamic Analysis Approach	4
Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift	4
2022 Reviewers	4
A Method of Redundant Feature Suppression in Circuit Output Positions for Analog Circuit Soft and Hard Fault Diagnosis	4
CMOS Implementation and Performance Analysis of Known Approximate 4:2 Compressors	4
Self Healing Controllers to Mitigate SEU in the Control Path of FPGA Based System: A Complete Intrinsic Evolutionary Approach	4
An Investigation into the Failure Characteristics of External PCB Traces with Different Angle Bends	4
Deep Soft Error Propagation Modeling Using Graph Attention Network	4
Firmware-Driven Adaptive Clock Tuning for Electromagnetic Interference Tolerance in Automotive Systems	4
2021 JETTA-TTTC Best Paper Award	4
A Multi-Objective Test Scenario Prioritization Method Based on UML Activity Diagram	4
Built-In Self-Test for Multi-Threshold NULL Convention Logic Asynchronous Circuits using Pipeline Stage Parallelism	4
Interleaved Counter Matrix Code in SRAM Memories for Continuous Adjacent Multiple Bit Upset Correction	4
Modular Test Kit – A Modular Approach for Efficient and Function-Oriented Testing	3
Cross-PUF Attacks: Targeting FPGA Implementation of Arbiter-PUFs	3
Chebyshev-based Algorithm: Achieving Fast ADC Static Parameter Testing Using a Low-precision Signal Source	3
Automated Design Error Debugging of Digital VLSI Circuits	3
Beyond Power Side Channels: Impedance as a Cryptographic Threat	3
Investigation of Silicon Aging Effects in Dopingless PUF for Reliable Security Solution	3
Equivalent Circuit and Damage Threshold Study of Communication Interfaces under HEMP	3
Towards the Detection of Hardware Trojans with Cost Effective Test Vectors using Genetic Algorithm	3
Real-time Embedded System Fault Injector Framework for Micro-architectural State Based Reliability Assessment	3
Instant Test and Repair for TSVs using Differential Signaling	3
Test Technology Newsletter	3
New Second-order Threshold Implementation of Sm4 Block Cipher	3
A Tunable Concurrent BIST Design Based on Reconfigurable LFSR	3
A Quadruple-Node Upsets Hardened Latch Design Based on Cross-Coupled Elements	3
Fault Diagnosis of Analog Circuits Using an Improved BiTCN Combined with BiLSTM	3
Syntactic and Semantic Analysis of Temporal Assertions to Support the Approximation of RTL Designs	3
PrecIRisc: A High-Precision and Low-Bloat Dynamic Binary Instrumentation Tailored for RISC Architectures	3
Multi-modal Pre-silicon Evaluation of Hardware Masking Styles	3