Microscopy and Microanalysis

Papers
(The H4-Index of Microscopy and Microanalysis is 20. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-06-01 to 2025-06-01.)
ArticleCitations
Real-Time and Correlative Imaging of Localised Corrosion Events by High-Speed Atomic Force Microscopy82
Seeing Electrons in Chemical Bonds – John Spence's Vision for Electron Microdiffraction and How to Realize it for Molecular Crystals42
3D Nanoscale Analysis of Implanted Deuterium in Tungsten using Atom Probe Tomography40
Thicker Sections (300-500 nm) Observed in the Conventional TEM May Reveal Extended Structures Not Recognized in Ultrathin Sections34
Crystallization by Amorphous Particle Attachment and the Evolution of Texture in Biogenic Calcium Carbonate29
In-situ Liquid Phase TEM of Soft and Active Matter28
Microscopy Education in the Fourth Industrial Revolution27
Probing Defects in Epitaxially Grown Cubic Boron Nitride on Diamond27
Using Inelastically Scattered Electrons to Enhance Imaging of Biological Macromolecules from Any Layer of a Thick Specimen27
Surface Characterization on Agriculture Steel Boriding26
Investigating Direct Focused Probe Ptychography for Single Particle Analysis25
Intermetallic Phases at a Resistance Spot Welded Fe-Al Interface25
Comparison of Different Microscopic Sample Preparation and Imaging Techniques for Visualization of Connective Tissue Components in Peripheral Nerve24
Application of a Correlative fs-Laser Workflow for Fast and Easy Feature Access in Failure Analysis of Recycled Automotive Body Parts23
Particles Per Hour as a Metric for Single-particle Cryo-EM Data Collection Speed When Comparing Super-resolution and Hardware-binned Data23
The Prospect of Quantum-Optical Information Transfer using an Electron Microscope Beam22
Using Your Beam Efficiently: Reducing Electron Dose in the STEM via Flyback Compensation22
Development of New Staining Procedures for DiagnosingCryptosporidiumspp. in Fecal Samples by Computerized Image Analysis22
Quantification of Ion-Implanted Single-Atom Dopants in Monolayer MoS2 via HAADF STEM Using the TEMUL Toolkit21
Optical Measurement of the Stoichiometry of Thin-Film Compounds Synthetized From Multilayers: Example of Cu(In,Ga)Se221
High Temperature Annealing of Twin-Roll Cast Al-Li-Based Alloy Studied by In-situ SEM and STEM20
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