IEEE Transactions on Device and Materials Reliability

Papers
(The H4-Index of IEEE Transactions on Device and Materials Reliability is 16. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-11-01 to 2025-11-01.)
ArticleCitations
From Mega to nano: Beyond one Century of Vacuum Electronics53
Special Issue on Semiconductor Design for Manufacturing (DFM)Joint Call for Papers50
Mission Profile-Based Hotspot Temperature and Lifespan Estimation of DC-Link Capacitors Used in Automotive Traction Inverters35
Investigation of the Interaction Effect Between the Microstructure Evolution and the Thermo-Mechanical Behavior of Cu-Filled Through Silicon Via29
FEA-Dominant Reliability and Lifetime Model of Double-Sided Cooling SiC Power Module24
Sintered Silver-Based Direct-Cooled IGBTs With High Output Power and Thermal Reliability23
Investigations on High-Power LEDs and Solder Interconnects in Automotive Application: Part I—Initial Characterization23
Location-Aware Error Correction for Mitigating the Impact of Interconnects on STT-MRAM Reliability23
Guidelines for the Design of Random Telegraph Noise-Based True Random Number Generators23
A Modified Bypass Circuit for Improved Reliability of PV Module Validated With Real-Time Data22
IEEE Transactions on Device and Materials Reliability Publication Information18
IEEE Transactions on Device and Materials Reliability Publication Information18
Implication of Self-Heating Effect on Device Reliability Characterization of Multi-Finger n-MOSFETs on 22FDSOI17
Modeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology17
Research of Single-Event Burnout in P-NiO/n-Ga2O3 Heterojunction Diode16
Reliability of Advanced Nodes16
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