OOIR: Observatory of International Research

Papers

(The median citation count of IEEE Transactions on Device and Materials Reliability is 1. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2022-08-01 to 2026-08-01.)

Article	Citations
Special Issue on Semiconductor Design for Manufacturing (DFM)Joint Call for Papers	62
Editorial	38
Location-Aware Error Correction for Mitigating the Impact of Interconnects on STT-MRAM Reliability	36
A Modified Bypass Circuit for Improved Reliability of PV Module Validated With Real-Time Data	33
On the Response Time Constant of Interface Defects in Accumulation	33
Design and Reliability Assessment of a Reconfigurable Tunneling Device for Ultra Low-Power Applications	27
Guidelines for the Design of Random Telegraph Noise-Based True Random Number Generators	24
FEA-Dominant Reliability and Lifetime Model of Double-Sided Cooling SiC Power Module	22
Package-Level Electro-Thermal Simulation With Transient Thermal Resistance Model for Surge Stress Failure Analysis of SiC MOSFET	22
Sintered Silver-Based Direct-Cooled IGBTs With High Output Power and Thermal Reliability	22
Mission Profile-Based Hotspot Temperature and Lifespan Estimation of DC-Link Capacitors Used in Automotive Traction Inverters	20
IEEE Transactions on Device and Materials Reliability Publication Information	19
IEEE Transactions on Device and Materials Reliability Publication Information	19
Reliability of Advanced Nodes	19
Unveiling the Degradation Mechanism of Polymer-Based Thermal Interface Materials Under Thermo-Oxidative Condition	16
Research of Single-Event Burnout in P-NiO/n-Ga ₂ O ₃ Heterojunction Diode	16
Stability in Electroluminescence From Ag-NSi Schottky Junction LED: Role of Ambient Oxidation	16
Table of Contents	16
Influence of Gate Insulator Modulation on the Electrical and Material Properties of Dual-Gate InGaZnO Thin-Film Transistors	16
A DLTS Study on Deep Trench Processing-Induced Trap States in Silicon Photodiodes	16
Implication of Self-Heating Effect on Device Reliability Characterization of Multi-Finger n-MOSFETs on 22FDSOI	16
Modeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology	15
Fault Modeling and Test Algorithm Development Framework for Gate-All-Around SRAMs	14
Single-Event Effects Induced by Monoenergetic Fast Neutrons in Silicon Power UMOSFETs	14
IEEE Transactions on Device and Materials Reliability Publication Information	14

Research on the degradation mechanism of Stacked Aluminum Polymer Capacitors in Humid Environments	13
Lifetime Prediction of IGBT by BPNN Based on Improved Dung Beetle Optimization Algorithm	13
IEEE Transactions on Device and Materials Reliability Publication Information	13
Insights Into the Effects of Interface Trap Charges on Electrostatic-Based Magnesium Silicide Tunneling Interface	13
Effects of Electrolyte Volume on Electrochemical Migration of Tin in Water Drop Test	13
Failure Mechanism and Predictive Modeling for Microbump Interconnects Drop Life Under Diverse Impact Angles in Advanced Packaging	12
Impact of Substrate Connection on Dynamic-R _ON Drift of 650 V Normally-Off Monolithic Bidirectional AlGaN/GaN HEMT	12
Degradation Analysis of 14 nm SOI FinFETs by Influence of Hot Carrier Injection and Self-Heating Synergistic Effects	12
Table of Contents	12
A Page–Sector Joint Degradation-Reliability Error Analysis Model for High-Density NAND Flash	12
A Novel Dual-Mode Dual Trench MOSFET With Self-Adjustable Field Plate for Low EMI Noise and High Dynamic Avalanche Robustness	11
TechRxiv: Share Your Preprint Research with the World!	11
IEEE Transactions on Device and Materials Reliability Publication Information	11
Introducing IEEE Collabratec	11
A New SiC Quasi MOSFET for Ultra-Low Specific On-Resistance and Improved Reliability	11
Revealing the Impact of Gate Area Scaling on Charge Trapping Employing SiO₂Transistors	11
Non-Traditional Operational Mechanisms of NbO _x -Based Threshold Switching Devices Used on On-Chip ESD Protection	11
Member Get-A-Member (MGM) Program	11
Electrical Switching Safe Operation Area on GaN Bidirectional Switches Under Hard-Switching Conditions by Multiple Pulse Test	11
Study of Trap Influence on Threshold Voltage of SiC MOSFET Based on Transient Current Method	11
A Lifetime Prediction Method of IGBT Based on Phased Nonlinear Wiener Process	10
Analysis of Trapping Mechanisms and Capacitance Dispersion in Double-π Gate AlGaN/GaN HEMTs Under High-Temperature Conditions	10
Predicting Failure Distributions of SRAM Arrays by Using Extreme Value Statistic, Bit Cell Simulation, and Machine Learning	10
Avalanche Failure Mechanisms of 1200-V/40-A 4H-SiC Junction Barrier Schottky Diodes With Various Epilayer Defects	10
Compact Modeling of Process Variation and Reliability Predictions for Nanosheet Gate-All-Around FET	10
Reliability Analysis of IGZO Thin-Film Transistor for Wearable Biosensing Applications	10
Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on "Semiconductor Device Modeling for Circuit and System Design	10
IEEE Transactions on Device and Materials Reliability Information for Authors	10
TechRxiv: Share Your Preprint Research with the World!	10
Call for Nominations Editor-in-Chief IEEE Transactions on Device and Materials Reliability	10
Aging-Induced Mg Cluster Observation in GaN-Based Lasers by Atom Probe Tomography	9
Open Model Interface Assisted NBTI-Aware Design With Dual-V _th Logic Synthesis Strategy for Reliability Improvement	9
Plasma Induced Charging Damage Causing MOS Device Reliability Lifetime Degradation Originating From Well Charging of a Technology With Deep Trench Isolation	9
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Designing and Reliability Analysis of Radiation Hardened Stacked Gate Junctionless FinFET and CMOS Inverter	9
Temperature-Dependent Study of Large-Signal Reliability of p-FET-Based Power Amplifier for mmWave Applications	9
Degradation Behavior and Mechanism of SONOS FLASH by Total Ionization Dose Effects	9
Impact of Pulse Voltage Stress on the Reliability of Ferroelectric Thin-Film Transistor	9
NAVIgator under Fire: Characterizing Voltage Limits and Soft Error Resilience of AMD NAVI GPUs	9
FPGA Assessment Methodology of Adverse X-Ray Effects on Secure Digital Circuits	8
Aging and Sintered Layer Defect Detection of Discrete MOSFETs Using Frequency Domain Reflectometry Associated With Parasitic Resistance	8
A Consistent Analytical Method to Assess Reliability of Redundant Safety Instrumented Systems	8
Table of Contents	8
Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs	8
TCAD Investigation on a Novel SiC Trench MOSFET With Integrated N ⁺ -PolySi/SiC Heterojunction Diode for Improved Third-Quadrant and High-Temperature	8
Reliability of VO textsubscript 2-Based mmWave Switches Under 100 Million Thermal Cycles	8
SiC MOSFET Gate-Oxide and SiC/SiO ₂ Interface Defect Charge Movement Based on the Hi-Lo C _ISS	8
Design of Robust SRAM Cell With Enhanced Soft-Error Hardening for Radiation-Prone Applications	8
Evaluations of Gate Oxide Reliability in SiC MOSFETs Under Extremely High Gate Voltage Stress	7
Semi-Empirical Modeling of Hot Carrier Degradation in 12-nm FinFET LDMOS Devices	7

Degradation Mechanism of 4H-SiC MOSFET under 10 MeV Proton Irradiation	7
Exploring the Optimal Solution for Graphene-Based Microstrip Line Attenuators	7
Mitigating the Process Variations in Negative Capacitance Junctionless Device and Circuit	7
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Negative Bias Temperature Instability in Top-Gated Carbon Nanotube Thin Film Transistors With Y₂O₃ Gate Dielectric	7
Proton Irradiation Effects on Single Event Burnout in AlGaN/GaN HEMTs	7
Low Conductance State Drift Characterization and Mitigation in Resistive Switching Memories (RRAM) for Artificial Neural Networks	7
Influence of Critical Working Conditions on Stability of Varistor Characteristics	6
Call for Nominations for Editor-in-Chief IEEE Transactions on Semiconductor Manufacturing	6
An Efficient Modeling Approach for Electrothermal Migration Analysis of On-Chip Interconnects	6
Research of Single-Event Burnout in 1.2-kV Rated CoolSiC Trench MOSFET	6
Lifetime Prediction Method for IGBT Modules Under Combined Power Cycling–Vibration Conditions	6
Analysis and Structural Mitigation of Trapping-State-Trap Induced Drain Leakage Current in Buried-Channel-Array Transistor	6
Key Factors Affecting Dynamic Reliability in GaN HEMTs and How Can They Be Mitigated?	6
Radiation Hardened SOI LDMOS With Dual P-Type Layers Shielding Irradiation Charge Field	6
Call for Nominations for Editor-in-Chief IEEE Electron Device Letters	6
High Gate Reliability and Breakdown Voltage p-GaN HEMTs Based on Post-Annealing-Free Oxygen Plasma Treatment	6
Investigation of Electrical Breakdown in AlGaN/GaN/AlN HEMTs Through Nanoscale Analysis and Physics-Based Modeling	6
Negative Capacitance Vertical Dopingless TFET and Its Analog/RF Analysis Using Interface Trap Charges	6
IEEE Transactions on Device and Materials Reliability Publication Information	6
TechRxiv: Share Your Preprint Research with the World!	6
Analytical Model for Cu Interconnect Lifetimes Under Combined Thermomigration and Electromigration Stress	6
Error-Corrected RRAM-Based Compute-in-Memory Accelerator Using Voltage-Clamp Current Mirror	6
Effects of Electron Irradiation and Thermal Cycling on Electrical Properties of SiC MOSFET	6
IEEE Transactions on Device and Materials Reliability Information for Authors	5
Degradation Mapping and Impact of Device Dimension on IGZO TFTs BTI	5
Influence of Phase Coarsening on Inhomogeneous Deformation and Fracture Behavior in Sn–Bi Solder Interconnects	5
Correlation of Radiation-Induced Interface Traps With Band Edge Energy Through Band Structure-Based Analysis of Electrostatics of UTB SOI Devices	5
SafeHDC: Concurrent Uncertainty and Fault Detection in Hyperdimensional Computing	5
Design of Highly Reliable 14T and 16T SRAM Cells Combined With Layout Harden Technique	5
Call for Nominations for Editor-in-Chief	5
Comprehensive TCAD-Based Single Event Effect Study of TFET-Based 1T DRAM and Crossbar Memory Array	5
Irradiation-Induced Degradation of Surface Acoustic Wave Devices Fabricated on Bulk AlN	5
Digital Probing of Activation Energy for Evaluating Reliability in 2-D and 3-D NAND Flash Memory	5
A Highly Reliable Dual-Node-Upset-Tolerant 20T Radiation Hardened SRAM Cell for Aerospace Applications	5
Wide Band Gap Semiconductors for Automotive Applications	5
White X-Ray Radiation Effects in MOS Capacitors With Atomic Layer Deposited HfO₂/Al₂O₃ and Al₂O₃/HfO₂/Al₂O₃ Gate	5
Memristive Switching Behavior of MoO₃ Decorated PSi Heterostructure and Impact of Temperature on Device Reliability	5
Comprehensive Study on Trap-Induced Bias Instability via High-Pressure D ₂ and N ₂ Annealing	5
Comparison of Different Input Data for the Prediction of LED Solder Joints Using Artificial Neural Networks	5
DAAS: Differential Aging-Aware STA for Precise Timing Closure With Reduced Design Margin	4
Reliability of Advanced Nodes	4
Metastable Operating Stability of Perovskite/Silicon Tandem Solar Cell Modules	4
Trap Location and Stress Degradation Analysis of GaN High Electron Mobility Transistors Based on the Transient Current Method	4
IEEE Transactions on Device and Materials Reliability Information for Authors	4
ESR Modeling for Atmospheric Corrosion Behavior of Metallized Film Capacitors	4
Fe-Related Trapping and Detrapping Dynamics in AlGaN/GaN HEMTs Inspected by Drain Current Transient (DCT) Spectroscopy	4
Analysis of Multicrystalline Si Solar Cell Degradation Due to Reverse Bias and High Temperature Aging	4
Systematic Reliability Evaluation of FPGA Implemented CNN Accelerators	4
Failure Mechanisms of Fluorine-Doped Tin Oxide Thin Films in Glass and Reliability Tests	4
Modeling Degradation Kinetics of FAPbI₃ Perovskite Solar Cells: Impact of Microstructural and Optoelectronic Defects	4
Fast Heater‑Based NBTI Resolves the Reverse Antenna Effect in PID‑Degraded High‑k and SiO ₂ pMOSFETs	4
Experimental Study on Failure Mechanism of 4H-SiC MOSFETs Under Unclamped Inductive Switching (UIS) Stress Conditions	4
Table of Contents	4
Modeling and Evaluation of Single Event Effects on Hafnia-Based FeRAM	4
Investigations on High-Power LEDs and Solder Interconnects in Automotive Application: Part II—Reliability	3
Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on "Wide and Ultrawide Bandgap Semiconductor Devices for RF and Power Applications"	3
Table of Contents	3
Failure Mechanism of Aluminum Diffusion in Low-Voltage Trench MOSFET With High Cell Density	3
Study on Electromagnetic Pulse Damage of 22nm FDSOI in Radiation Environment	3
Reliability Analysis of GaAs-PIN Limiter Under Ultra-Wideband Pulse Radiation	3
Aging Reliability Compact Modeling of Trap Effects in Power GaN HEMTs	3
Impact of EP-CG Interlayer Dielectric on Performance of L-Shaped Split-Gate Flash Memory	3
3D NAND Scaling Performance Enhancement using 2D MoS ₂ Channel	3
Prediction of Crack Initiation at Die Corner of Molded Underfill Flip-Chip Packages Under Thermal Load by New Criteria	3
Call for Papers for a Special Issue of IEEE Journal of the Electron Devices Society on "Materials, processing and integration for neuromorphic devices and in-memory computing"	3
Characterization, Analysis, and Modeling of Long-Term RF Reliability and Degradation of SiGe HBTs for High Power Density Applications	3
Analysis of the Degradation of Depletion-Mode GaN High-Electron-Mobility Transistors Under Reverse Pulse Electrical Stress Using the Voltage-Transient Method	3
Self-Heating Mapping of the Experimental Device and Its Optimization in Advance Sub-5 nm Node Junctionless Multi-Nanowire FETs	3
Call for Papers for a Special Issue of IEEE Journal of the Electron Devices Society on "Materials, processing and integration for neuromorphic devices and in-memory computing"	3
Sensitivity of Logic Cells to Laser Fault Injections: An Overview of Experimental Results for IHP Technologies	3
An Efficient Dynamic Threshold Voltage Detection Scheme for Improving 3-D NAND Flash Reliability	3
All-Regions Damage Extraction Method for SiC IGBTs Based on C-V Curves	3
Correlation of HCD and Percolation Paths in FinFETs: Study of RDF and MGG Impacts Through 3-D Particle-Based Simulation	3
QRAM4Space: Dual-Node Radiation-Tolerant Quadruple SRAM for Space Systems	3
Weak Snapback Silicon Controlled Rectifier ESD Device With Double Snapback Characteristics	3
Impact of Temperature on Amplifier Circuits in 4H-SiC CMOS Technology	3
Reliability-Aware structural and spacer optimization of E-shaped CombFET for advanced CMOS nodes	3
Exploring Non-TAP Interfaces for Efficient and Secure Access to IJTAG Network	3
A Low Cost Triple-Node-Upset Self-Recoverable Latch Design for Nanoscale CMOS	3

Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on "Semiconductor Device Modeling for Circuit and System Design	3
On-Silicon Characterization of CDM-Like Stress in Long Interconnects Using vf-TLP in Nanometric ICs	3
Total-Ionizing-Dose Radiation Effect on Current Gain for Bipolar Junction Transistor Based 18 V BCD Technology	3
Microstructural Evolution of Gate Oxide in SiC Power MOSFETs Under Heavy-Ion Irradiation	3
Resistance Degradation of Unintentionally Doped Single Crystal BaTiO ₃	3
New Total-Ionizing-Dose Resistant Data Storing Technique for NAND Flash Memory	3
Analysis of Electrical Performance Degradation of 4H-SiC Junction Barrier Schottky Diodes Induced by Neutron Irradiation	3
2023 Index IEEE Transactions on Device and Materials Reliability Vol. 23	3
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2024 Index IEEE Transactions on Device and Materials Reliability Vol. 24	2
IEEE Transactions on Device and Materials Reliability Information for Authors	2
A Novel Lifetime Estimation Method and Structural Optimization Design for Film Capacitors in EVs Considering Material Aging and Power Losses	2
On the Reliability of Complementary Field Effect Transistor: Unveiling the Role of Grain Granularities and Random Fluctuations	2
Research on the Mechanism of Electrical Erosion Accelerating Failure in High-Current Pulse Thyristor-Based Switches	2
A Comprehensive Modeling Framework for Charge-Sharing and Bias-Dependent Single Event Transient Prediction in FinFETs	2
Comparative Analysis of SGTMOS Degradation Under Repeated Off-State Avalanche and Short Circuit Current Pulses	2
Performance-Limiting Trapping Effects in n-Type Ga ₂ O ₃ Schottky Barrier Diodes	2
SiC Damage Induced by Heavy Ion Irradiation and Post-Gate Stress in SiC MOSFETs	2
Table of Contents	2
Comparative Study on the Performance of Digital Low-Light EBAPS Devices Based on Different Multi-Alkali Photocathode Materials	2
Defect Profiling and Dielectric Breakdown Projections of the β-Ga ₂ O ₃ /HfO <	2
Thermal Runaway in Thin Film PV: temperature profile modeling	2
Special Issue on Intelligent Sensor Systems for the IEEE Journal of Electron Devices	2
Deep Learning-Driven Ensemble Learning for Solar PV Faults Detection Under Low Irradiance Condition	2
Investigation on Traps Dynamics & Negative Bias Stress in D-Mode GaN-on-Si Power MIS HEMTs Under High-Temperature	2
Design and Fabrication of FS-IGBTs With Enhanced Ruggedness and the Influence of Circuit Parameters on Short-Circuit	2
Predicting the Degradation and Recovery Trends of the Photovoltaic Efficiency of Sb₂Se₃ Antimony Solar Cells	2
Impact of Post-Metallization Annealing on the Reliability of Barrierless Mo Word Lines	2
Reliability and Optimization Simulation Study of Zero-Temperature-Delay Point in Digital Circuits for Advanced Technology	2
Experimental Comparison of TID Hardness in MOSFETs Implemented With the Enclosed, Diamond (Hexagonal Gate), and Rectangular Layout Styles	2
Reliability Test of 21% Efficient Flexible Perovskite Solar Cell Under Concave, Convex and Sinusoidal Bending	2
Effect of Gamma Radiation on Static DC, Reliability, and RF Performance of Submicron GaN-on-Si RF MIS-HEMTs With In Situ SiN	2
Statistical Model and Transistor Size Effect of Hot Carrier Injection for Stability Reinforced SRAM Physically Unclonable Function	2
Drain Field Plate Effects in p-GaN HEMTs During Surge Voltage Hard Switching	2
Cause Analysis on the Abnormal Failure of SiC Power Modules During the HV-H³TRB Tests	2
Resilience via Recovery: Gamma-Irradiated Cascode GaN HEMTs Under Electron Wind Force	2
2025 Index IEEE Transactions on Device and Materials Reliability Vol. 25	2
Simulation Study of Single-Event Burnout Reliability for 1.7-kV 4H-SiC VDMOSFET	2
Reliability Assisted Electro-Physical Modelling of Radiation-Induced Resistance Fluctuation in Nanosheet FET	2
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Copper Line Resistance Degradation Caused by Unidirectional and Bidirectional Pulsed Currents	2
Drain Extended MOS Body Region Engineering for Switching Reliability Under Unclamped Inductive Load Conditions	2
Capacitor-Coupled Offset-Canceled DRAM Sense Amplifier With Ultralow Offset Voltage and Hidden Cancelation Time	2
IEEE Transactions on Device and Materials Reliability Information for Authors	2
Study on the Effect of Cu Buffer and Cu-Wire Bonds on SiC Device Performance	2
Improvement of Encapsulation Technique of Organic Photovoltaics by UV-Curable Adhesive	2
Board Level-Component Solder Joints Normalized Crack Severity Index of Solid-State Drive With Different Reliability Temperature Cycle Test Profiles	2
Optimization Techniques for Reliable Low Leakage GNRFET-Based 9T SRAM	2
Multiple Phase Change Materials Integrated Into Power Module for Normal and High Current Reliability Enhancement	1
Special Issue on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS 2023) in the IEEE Transactions on Device and Materials Reliability	1
Table of Contents	1
An Aging Small-Signal Equivalent Circuit Modeling Method for InP HBT	1
Investigating the Arc-Shaped Kink Drain Voltage of Drain Current With Capacitance-Voltage Measurement Method in GaN HEMTs	1
IEEE Transactions on Device and Materials Reliability Publication Information	1
Die-Attach Influence on Thermal/Electrical Parameters of GaN RF Device	1
The Achievement of Pulse Laser Deposited Amorphous P-Type N-Doped Ga₂O₃ for Applying in Thin Film Transistor and Homojunction Diode	1
Characterization of Electromagnetic Susceptibility in Optocouplers Exposed to Different Interference Waveforms	1
Effect of Large Amplitude Thermal Cycles on Power Assemblies Based on Ceramic Heat Sink and Multilayer Pressureless Silver Sintering	1
IEEE Transactions on Device and Materials Reliability Publication Information	1
Moisture Dependent Degradation Rate of Silicone in LED Optical Housing Material—Ab-Initio Modelling	1
Bridging the Data Gap in Photovoltaics with Synthetic Data Generation	1
Layered Trench Gate Exhibiting Source/Drain Over-Etch Immunity Without Punch-Through Stopper	1
In-Field Testing of Functionally-Possible Transition Faults With High Activation Frequencies	1
Numerical Simulation of Trapped Hole Lateral Migration and Induced Threshold Voltage Retention Loss in a SONOS Flash Memory	1
A Process-Robust Split-Gate eFlash Memory With Spacer-Defined Floating Gate in 55-nm Node	1
A Gate-Level SER Estimation Tool With Event-Driven Dynamic Timing and SET Height Consideration	1
A Low-Area Overhead and Low-Delay Triple-Node-Upset Self-Recoverable Design Based on Stacked Transistors	1
Mechanisms of Step-Stress Degradation in Carbon-Doped 0.15-μm AlGaN/GaN HEMTs for Power RF Applications	1
Thermal Stress Impact on Electrical Conductivity and Microstructure of Thin Aluminum Films Deposited on Polyethylene Terephthalate Substrates	1
Investigation of Switching Characteristics Degradation of GaN HEMT Under Power Cycling Aging	1
An Improved Thermal Network Model of Press-Pack IGBT Modules Considering Contact Surface Damage	1
Assessing the Reliability of DRAM CMOS Periphery: Comparing AC and DC Conditions for BTI and TDDB	1
System-Level Lifetime Extension in 3D NAND SSDs via V _T -Shift-Aware Flash Signal Processing and A	1
Power Cycling Modeling and Lifetime Evaluation of SiC Power MOSFET Module Using a Modified Physical Lifetime Model	1
Table of Contents	1
On-Chip Heater Design and Control Methodology for Reliability Testing Applications Requiring Over 300°C Local Temperatures	1
IEEE Transactions on Device and Materials Reliability Publication Information	1
Investigation of Single-Event Burnout in Laterally-Diffused Metal-Oxide Semiconductor for Power Modulation Circuits	1
Optimization of 3-D IC Routing Based on Thermal Equalization Analysis	1
A Snapback-Free RC-LIGBT Integrated with Three-Mode Self-Adaptive nMOS for Improved Performance and Reliability	1
Linking the Intrinsic Electrical Response of Ferroelectric Devices to Material Properties by Means of Impedance Spectroscopy	1
The Failure Mechanism of Internal Circuit During ESD Striking a Power to Another Power	1
Reliability Correlation Coefficient of Fail Bit Counts of Flash Memory	1
Special Issue on Semiconductor Design for Manufacturing (DFM)Joint Call for Papers	1
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Unveiling T_max Inside GaN HEMT Based X-Band Low-Noise Amplifier by Correlating Thermal Simulations and IR Thermographic Measurements	1
Impact of Total Ionizing Dose on the Electrical Performance of Silicon Carbide MOSFET	1
Electrical Behavior at Cryogenic Temperature of the Radiation-Tolerant Hourglass MOS Transistor	1
Radiation Hardened Domino Logic-Based Schmitt Trigger Circuit With Improved Noise Immunity	1
Improving Single-Event Effect Performance of SiC MOSFET by Excess Hole Extraction	1
AdAM: Adaptive Approximate Multiplier for Fault Tolerance in DNN Accelerators	1
Detection and Analysis of Stress Wave in MOSFET Under Gate-Source Overvoltage Failure	1
A Novel Si/SiC Heterojunction LDMOS With Improved Reverse Recovery and SEB Performances	1
PEAR: Unbalanced Inter-Page Errors Aware Read Scheme for Latency-Efficient 3-D NAND Flash	1
2022 Index IEEE Transactions on Device and Materials Reliability Vol. 22	1