OOIR: Observatory of International Research

Papers

(The median citation count of IEEE Transactions on Device and Materials Reliability is 0. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2022-01-01 to 2026-01-01.)

Article	Citations
From Mega to nano: Beyond one Century of Vacuum Electronics	55
Special Issue on Semiconductor Design for Manufacturing (DFM)Joint Call for Papers	53
Sintered Silver-Based Direct-Cooled IGBTs With High Output Power and Thermal Reliability	40
A Modified Bypass Circuit for Improved Reliability of PV Module Validated With Real-Time Data	31
On the Response Time constant of Interface Defects in Accumulation	26
Guidelines for the Design of Random Telegraph Noise-Based True Random Number Generators	25
Investigation of the Interaction Effect Between the Microstructure Evolution and the Thermo-Mechanical Behavior of Cu-Filled Through Silicon Via	24
Editorial	20
Mission Profile-Based Hotspot Temperature and Lifespan Estimation of DC-Link Capacitors Used in Automotive Traction Inverters	19
FEA-Dominant Reliability and Lifetime Model of Double-Sided Cooling SiC Power Module	19
Location-Aware Error Correction for Mitigating the Impact of Interconnects on STT-MRAM Reliability	19
Investigations on High-Power LEDs and Solder Interconnects in Automotive Application: Part I—Initial Characterization	18
Reliability of Advanced Nodes	16
IEEE Transactions on Device and Materials Reliability Publication Information	16
Modeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology	16
IEEE Transactions on Device and Materials Reliability Publication Information	16
Implication of Self-Heating Effect on Device Reliability Characterization of Multi-Finger n-MOSFETs on 22FDSOI	15
Research of Single-Event Burnout in P-NiO/n-Ga₂O₃ Heterojunction Diode	15
A DLTS Study on Deep Trench Processing-Induced Trap States in Silicon Photodiodes	14
Degradation Analysis of 14 nm SOI FinFETs by Influence of Hot Carrier Injection and Self-Heating Synergistic Effects	14
Thermal Effect on Carbon Nanotube Fiber High-Ampacity Conductors at High Frequencies	14
Single-Event Effects Induced by Monoenergetic Fast Neutrons in Silicon Power UMOSFETs	14
Fault Modeling and Test Algorithm Development Framework for Gate-All-Around SRAMs	14
Unveiling the Degradation Mechanism of Polymer-Based Thermal Interface Materials Under Thermo-Oxidative Condition	14
IEEE Transactions on Device and Materials Reliability Publication Information	14

Lifetime Prediction of IGBT by BPNN Based on Improved Dung Beetle Optimization Algorithm	14
Effects of Electrolyte Volume on Electrochemical Migration of Tin in Water Drop Test	13
Failure Mechanism and Predictive Modeling for Microbump Interconnects Drop Life Under Diverse Impact Angles in Advanced Packaging	13
Insights Into the Effects of Interface Trap Charges on Electrostatic-Based Magnesium Silicide Tunneling Interface	13
TechRxiv: Share Your Preprint Research with the World!	12
Table of Contents	12
Member Get-A-Member (MGM) Program	12
Introducing IEEE Collabratec	12
A New SiC Quasi MOSFET for Ultra-Low Specific On-Resistance and Improved Reliability	11
Electrical Switching Safe Operation Area on GaN Bidirectional Switches Under Hard-Switching Conditions by Multiple Pulse Test	11
Study of Trap Influence on Threshold Voltage of SiC MOSFET Based on Transient Current Method	11
Revealing the Impact of Gate Area Scaling on Charge Trapping Employing SiO₂Transistors	11
A Novel Dual-Mode Dual Trench MOSFET With Self-Adjustable Field Plate for Low EMI Noise and High Dynamic Avalanche Robustness	11
IEEE Transactions on Device and Materials Reliability Information for Authors	10
Non-Traditional Operational Mechanisms of NbO _x -Based Threshold Switching Devices Used on On-Chip ESD Protection	10
A Lifetime Prediction Method of IGBT Based on Phased Nonlinear Wiener Process	10
IEEE Transactions on Device and Materials Reliability Publication Information	10
Predicting Failure Distributions of SRAM Arrays by Using Extreme Value Statistic, Bit Cell Simulation, and Machine Learning	10
Compact Modeling of Process Variation and Reliability Predictions for Nanosheet Gate-All-Around FET	10
Analysis of Trapping Mechanisms and Capacitance Dispersion in Double-π Gate AlGaN/GaN HEMTs Under High-Temperature Conditions	10
Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on "Semiconductor Device Modeling for Circuit and System Design	9
Degradation Behavior and Mechanism of SONOS FLASH by Total Ionization Dose Effects	9
Temperature-Dependent Study of Large-Signal Reliability of p-FET-Based Power Amplifier for mmWave Applications	9
From Mega to nano: Beyond one Century of Vacuum Electronics	9
Call for Nominations Editor-in-Chief IEEE Transactions on Device and Materials Reliability	8
Impact of Pulse Voltage Stress on the Reliability of Ferroelectric Thin-Film Transistor	8
A Consistent Analytical Method to Assess Reliability of Redundant Safety Instrumented Systems	8
Table of Contents	8
Exploring the Optimal Solution for Graphene-Based Microstrip Line Attenuators	8
Plasma Induced Charging Damage Causing MOS Device Reliability Lifetime Degradation Originating From Well Charging of a Technology With Deep Trench Isolation	8
Aging-Induced Mg Cluster Observation in GaN-Based Lasers by Atom Probe Tomography	8
Open Model Interface Assisted NBTI-Aware Design With Dual-V_th Logic Synthesis Strategy for Reliability Improvement	8
[Blank page]	8
Evaluations of Gate Oxide Reliability in SiC MOSFETs Under Extremely High Gate Voltage Stress	8
Designing and Reliability Analysis of Radiation Hardened Stacked Gate Junctionless FinFET and CMOS Inverter	8
TechRxiv: Share Your Preprint Research with the World!	8
Blank Page	8
Reliability of VO textsubscript 2-Based mmWave Switches Under 100 Million Thermal Cycles	8
FPGA Assessment Methodology of Adverse X-Ray Effects on Secure Digital Circuits	8
Aging and Sintered Layer Defect Detection of Discrete MOSFETs Using Frequency Domain Reflectometry Associated With Parasitic Resistance	8
Proton Irradiation Effects on Single Event Burnout in AlGaN/GaN HEMTs	7
Blank Page	7
Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs	7
Design of Robust SRAM Cell With Enhanced Soft-Error Hardening for Radiation-Prone Applications	7
IEEE Transactions on Device and MaterialsReliability publication information	7
Low Conductance State Drift Characterization and Mitigation in Resistive Switching Memories (RRAM) for Artificial Neural Networks	7
TCAD Investigation on a Novel SiC Trench MOSFET With Integrated N ⁺ -PolySi/SiC HeteroJunction Diode for Improved Third Quadrant and High Temperature	7
Negative Bias Temperature Instability in Top-Gated Carbon Nanotube Thin Film Transistors With Y₂O₃ Gate Dielectric	7
TechRxiv: Share Your Preprint Research with the World!	6
Effects of Electron Irradiation and Thermal Cycling on Electrical Properties of SiC MOSFET	6

An Efficient Modeling Approach for Electrothermal Migration Analysis of On-Chip Interconnects	6
High Gate Reliability and Breakdown Voltage p-GaN HEMTs Based on Post-Annealing-Free Oxygen Plasma Treatment	6
Influence of Critical Working Conditions on Stability of Varistor Characteristics	6
Research of Single-Event Burnout in 1.2-kV Rated CoolSiC Trench MOSFET	6
Analytical Model for Cu Interconnect Lifetimes Under Combined Thermomigration and Electromigration Stress	6
Call for Nominations for Editor-in-Chief IEEE Electron Device Letters	6
Lifetime Prediction Method for IGBT Modules Under Combined Power Cycling–Vibration Conditions	6
Investigation of Electrical Breakdown in AlGaN/GaN/AlN HEMTs Through Nanoscale Analysis and Physics-Based Modeling	6
Comprehensive TCAD-Based Single Event Effect Study of TFET-Based 1T DRAM and Crossbar Memory Array	5
Comprehensive Study on Trap-Induced Bias Instability via High-Pressure D ₂ and N ₂ Annealing	5
IEEE Transactions on Device and Materials Reliability Publication Information	5
Wide Band Gap Semiconductors for Automotive Applications	5
Call for Nominations for Editor-in-Chief	5
A Highly Reliable Dual-Node-Upset-Tolerant 20T Radiation Hardened SRAM Cell for Aerospace Applications	5
Error-Corrected RRAM-Based Compute-in-Memory Accelerator Using Voltage-Clamp Current Mirror	5
Call for Nominations for Editor-in-Chief IEEE Transactions on Semiconductor Manufacturing	5
White X-Ray Radiation Effects in MOS Capacitors With Atomic Layer Deposited HfO₂/Al₂O₃ and Al₂O₃/HfO₂/Al₂O₃ Gate	5
Degradation Mapping and Impact of Device Dimension on IGZO TFTs BTI	5
IEEE Transactions on Device and Materials Reliability Information for Authors	5
Negative Capacitance Vertical Dopingless TFET and Its Analog/RF Analysis Using Interface Trap Charges	5
Radiation Hardened SOI LDMOS With Dual P-Type Layers Shielding Irradiation Charge Field	5
Trap Location and Stress Degradation Analysis of GaN High Electron Mobility Transistors Based on the Transient Current Method	4
IEEE Transactions on Device and Materials Reliability Information for Authors	4
Metastable Operating Stability of Perovskite/Silicon Tandem Solar Cell Modules	4
Characterization, Analysis, and Modeling of Long-Term RF Reliability and Degradation of SiGe HBTs for High Power Density Applications	4
Reliability of Advanced Nodes	4
Systematic Reliability Evaluation of FPGA Implemented CNN Accelerators	4
Memristive Switching Behavior of MoO₃ Decorated PSi Heterostructure and Impact of Temperature on Device Reliability	4
Digital Probing of Activation Energy for Evaluating Reliability in 2D and 3D NAND Flash Memory	4
Table of Contents	4
Fe-Related Trapping and Detrapping Dynamics in AlGaN/GaN HEMTs Inspected by Drain Current Transient (DCT) Spectroscopy	4
DAAS: Differential Aging-Aware STA for Precise Timing Closure With Reduced Design Margin	4
An Effective Method to Identify Microarchitectural Vulnerabilities in GPUs	4
Failure Mechanisms of Fluorine-Doped Tin Oxide Thin Films in Glass and Reliability Tests	4
Design of Highly Reliable 14T and 16T SRAM Cells Combined With Layout Harden Technique	4
Analysis of Multicrystalline Si Solar Cell Degradation Due To Reverse Bias and High Temperature Aging	4
Comparison of Different Input Data for the Prediction of LED Solder Joints Using Artificial Neural Networks	4
Correlation of Radiation-Induced Interface Traps With Band Edge Energy Through Band Structure-Based Analysis of Electrostatics of UTB SOI Devices	4
IEEE Transactions on Device and Materials Reliability information for authors	4
Effect of Aging Temperature on the Fatigue Resistance and Shear Strength of SAC305 Solder Joints	4
Single-Event Burnout Hardening 4H-SiC UMOSFET Structure	4
Modeling Degradation Kinetics of FAPbI₃ Perovskite Solar Cells: Impact of Microstructural and Optoelectronic Defects	4
Irradiation-Induced Degradation of Surface Acoustic Wave Devices Fabricated on Bulk AlN	4
Influence of Phase Coarsening on Inhomogeneous Deformation and Fracture Behavior in Sn–Bi Solder Interconnects	4
Front Cover	3
2023 Index IEEE Transactions on Device and Materials Reliability Vol. 23	3
Characterization and Analysis of Hot Carrier Degradation Under DC and Large-Signal RF Stress in a PDSOI Floating-Body NFET-Based Power Amplifier Cell Under WiFi Operating Conditions	3
QRAM4Space: Dual-Node Radiation-Tolerant Quadruple SRAM for Space Systems	3
Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on "Wide and Ultrawide Bandgap Semiconductor Devices for RF and Power Applications"	3
Study on Electromagnetic Pulse Damage of 22nm FDSOI in Radiation Environment	3
Aging Reliability Compact Modeling of Trap Effects in Power GaN HEMTs	3
Analysis of the Degradation of Depletion-Mode GaN High-Electron-Mobility Transistors Under Reverse Pulse Electrical Stress Using the Voltage-Transient Method	3
IEEE Transactions on Device and MaterialsReliability publication information	3
New Total-Ionizing-Dose Resistant Data Storing Technique for NAND Flash Memory	3
Weak Snapback Silicon Controlled Rectifier ESD Device With Double Snapback Characteristics	3
Microstructural Evolution of Gate Oxide in SiC Power MOSFETs Under Heavy-Ion Irradiation	3
Table of Contents	3
Reliability Analysis of GaAs-PIN Limiter Under Ultra-Wideband Pulse Radiation	3
On-Silicon Characterization of CDM-Like Stress in Long Interconnects Using vf-TLP in Nanometric ICs	3
ESR Modeling for Atmospheric Corrosion Behavior of Metallized Film Capacitors	3
Call for Papers for a Special Issue of IEEE Journal of the Electron Devices Society on "Materials, processing and integration for neuromorphic devices and in-memory computing"	3
Prediction of Crack Initiation at Die Corner of Molded Underfill Flip-Chip Packages Under Thermal Load by New Criteria	3
Correlation of HCD and Percolation Paths in FinFETs: Study of RDF and MGG Impacts Through 3-D Particle-Based Simulation	3
Investigations on High-Power LEDs and Solder Interconnects in Automotive Application: Part II—Reliability	3
Exploring Non-TAP Interfaces for Efficient and Secure Access to IJTAG Network	3
An Efficient Dynamic Threshold Voltage Detection Scheme for Improving 3-D NAND Flash Reliability	3
Resistance Degradation of Unintentionally Doped Single Crystal BaTiO3	3
SiC Damage Induced by Heavy Ion Irradiation and Post-Gate Stress in SiC MOSFETs	2
Self-Heating Mapping of the Experimental Device and Its Optimization in Advance Sub-5 nm Node Junctionless Multi-Nanowire FETs	2
Sensitivity of Logic Cells to Laser Fault Injections: An Overview of Experimental Results for IHP Technologies	2
Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on "Semiconductor Device Modeling for Circuit and System Design	2
EXT-TAURUM P2T: An Extended Secure CAN-FD Architecture for Road Vehicles	2
Failure Mechanism of Aluminum Diffusion in Low-Voltage Trench MOSFET With High Cell Density	2
Blank Page	2
Reliability Test of 21% Efficient Flexible Perovskite Solar Cell Under Concave, Convex and Sinusoidal Bending	2
Table of Contents	2
Monitoring Initial Solder Layer Degradation in a Multichip IGBT Module via Combined TSEPs	2
Optimization Techniques for Reliable Low Leakage GNRFET-Based 9T SRAM	2
A Low Cost Triple-Node-Upset Self-Recoverable Latch Design for Nanoscale CMOS	2
Improvement of Encapsulation Technique of Organic Photovoltaics by UV-Curable Adhesive	2

Comparative Study on the Performance of Digital Low-Light EBAPS Devices Based on Different Multi-Alkali Photocathode Materials	2
Resilience via Recovery: Gamma-Irradiated Cascode GaN HEMTs Under Electron Wind Force	2
Predicting the Degradation and Recovery Trends of the Photovoltaic Efficiency of Sb₂Se₃ Antimony Solar Cells	2
Copper Line Resistance Degradation Caused by Unidirectional and Bidirectional Pulsed Currents	2
Research on the Mechanism of Electrical Erosion Accelerating Failure in High-Current Pulse Thyristor-Based Switches	2
Effect of Gamma Radiation on Static DC, Reliability, and RF Performance of Submicron GaN-on-Si RF MIS-HEMTs With In Situ SiN	2
Statistical Model and Transistor Size Effect of Hot Carrier Injection for Stability Reinforced SRAM Physically Unclonable Function	2
Board Level-Component Solder Joints Normalized Crack Severity Index of Solid-State Drive With Different Reliability Temperature Cycle Test Profiles	2
Call for Papers for a Special Issue of IEEE Journal of the Electron Devices Society on "Materials, processing and integration for neuromorphic devices and in-memory computing"	2
All-Regions Damage Extraction Method for SiC IGBTs Based on C-V Curves	2
Thermal Runaway in Thin Film PV: temperature profile modeling	2
Drain Extended MOS Body Region Engineering for Switching Reliability Under Unclamped Inductive Load Conditions	2
Study on the Effect of Cu Buffer and Cu-Wire Bonds on SiC Device Performance	2
Cause Analysis on the Abnormal Failure of SiC Power Modules During the HV-H³TRB Tests	2
Blank Page	1
IEEE Transactions on Device and Materials Reliability Information for Authors	1
Power Cycling Modeling and Lifetime Evaluation of SiC Power MOSFET Module Using a Modified Physical Lifetime Model	1
SafeDE: A Low-Cost Hardware Solution to Enforce Diverse Redundancy in Multicores	1
Comparative Analysis of SGTMOS Degradation Under Repeated Off-State Avalanche and Short Circuit Current Pulses	1
Reliability and Optimization Simulation Study of Zero-Temperature-Delay Point in Digital Circuits for Advanced Technology	1
Special Issue on Intelligent Sensor Systems for the IEEE Journal of Electron Devices	1
The Failure Mechanism of Internal Circuit During ESD Striking a Power to Another Power	1
A Gate-Level SER Estimation Tool With Event-Driven Dynamic Timing and SET Height Consideration	1
Effect of Titanium-Polymer Interactions on Adhesion of Polymer-Copper Redistribution Layers in Advanced Packaging	1
Investigation of the Mechanism of Mixed-Gas Plasma Modulation of Indium Oxide Thin-Film Transistor Performance	1
On-Chip Heater Design and Control Methodology for Reliability Testing Applications Requiring Over 300°C Local Temperatures	1
Moisture Dependent Degradation Rate of Silicone in LED Optical Housing Material—Ab-Initio Modelling	1
Radiation Hardened Domino Logic-Based Schmitt Trigger Circuit With Improved Noise Immunity	1
Impact of Total Ionizing Dose on the Electrical Performance of Silicon Carbide MOSFET	1
Investigation on Traps Dynamics & Negative Bias Stress in D-Mode GaN-on-Si Power MIS HEMTs Under High-Temperature	1
Improving Single-Event Effect Performance of SiC MOSFET by Excess Hole Extraction	1
Experimental Comparison of TID Hardness in MOSFETs Implemented With the Enclosed, Diamond (Hexagonal Gate), and Rectangular Layout Styles	1
A Comprehensive Modeling Framework for Charge-Sharing and Bias-Dependent Single Event Transient Prediction in FinFETs	1
Design and Fabrication of FS-IGBTs With Enhanced Ruggedness and the Influence of Circuit Parameters on Short-Circuit	1
A Novel Lifetime Estimation Method and Structural Optimization Design for Film Capacitors in EVs Considering Material Aging and Power Losses	1
The Achievement of Pulse Laser Deposited Amorphous P-Type N-Doped Ga₂O₃ for Applying in Thin Film Transistor and Homojunction Diode	1
Assessing the Reliability of DRAM CMOS Periphery: Comparing AC and DC Conditions for BTI and TDDB	1
AdAM: Adaptive Approximate Multiplier for Fault Tolerance in DNN Accelerators	1
A Low-Area Overhead and Low-Delay Triple-Node-Upset Self-Recoverable Design Based on Stacked Transistors	1
Exploration of the exciting world of multifunctional oxide-based electronic devices: from material to system-level applications	1
IEEE Transactions on Device and Materials Reliability Information for Authors	1
Table of Contents	1
Blank Page	1
IEEE Transactions on Device and Materials Reliability Publication Information	1
A 10T Soft-Error-Immune SRAM With Multi-Node Upset Recovery for Low-Power Space Applications	1
A DICE Flip-Flop Design by Resetting Redundancy Hardening for Single Event Upset Tolerance	1
Simulation Study of Single-Event Burnout Reliability for 1.7-kV 4H-SiC VDMOSFET	1
2024 Index IEEE Transactions on Device and Materials Reliability Vol. 24	1
IEEE Transactions on Device and Materials Reliability Publication Information	1
Effect of Large Amplitude Thermal Cycles on Power Assemblies Based on Ceramic Heat Sink and Multilayer Pressureless Silver Sintering	1
Correction Masking: A Technique to Implement Efficient SET Tolerant Error Correction Decoders	1
Multiple Phase Change Materials Integrated Into Power Module for Normal and High Current Reliability Enhancement	1
Mechanism and Quantitative Modeling of the SRAM Soft Error Induced by Space Electrostatic Discharge	1
IEEE Transactions on Device and Materials Reliability Publication Information	1
Table of Contents	1
Investigation of Switching Characteristics Degradation of GaN HEMT Under Power Cycling Aging	1
Total Ionizing Dose (TID) Impact on Basic Amplifier Stages	0
Impact of Electro-Thermal Transport on HCI and BTI Lifetime of Twin Nanowire FETs: Different Operational Modes	0
Front Cover	0
H²C-TM: A Hybrid High Coverage Test Method for Improving the Detection of HtD Faults in STT-MRAMs	0
Utilizing Two Three-Transistor Structures for Designing Radiation Hardened Circuits	0
Blank Page	0
ESD Protection Designs: Topical Overview and Perspective	0
A Kalman Filter Method Based on Adaptive Thermal Model for Online Junction Temperature Estimation of SiC MOSFET	0
Investigation on Electrical Properties of Printed Graphene Subjected to Aging, Ambient Environment and Gamma Radiation	0
Electro-Mechanical Properties of Molybdenum Thin Film on Polyethylene Terephthalate Subjected to Tensile Stress	0
Access Region Stack Engineering for Mitigation of Degradation in AlGaN/GaN HEMTs With Field Plate	0
Robust System Design IEEE IOLTS 2021	0
Table of Contents	0
Side-Channel Attack Resilient RHBD 12T SRAM Cell for Secure Nuclear Environment	0
Time-Dependent Dielectric Breakdown in 45-nm PD-SOI N-Channel FETs at Cryogenic Temperatures for Quantum Computing Applications	0
IEEE Transactions on Device and Materials Reliability Publication Information	0
Extracting Total Ionizing Dose Threshold Voltage Shifts From Ring Oscillator Circuit Response	0
TechRxiv: Share Your Preprint Research with the World!	0
A Novel Radiation-Hardened 14T SRAM Bitcell Based on 16nm FinFET	0
Exponential Gain Degradation Behavior on Irradiated InP/InGaAs Double Heterojunction Bipolar Transistors	0
Review of Double-Sided Cooling Power Modules for Driving Electric Vehicles	0
Special Issue on Semiconductor Design for Manufacturing (DFM)Joint Call for Papers	0
Front Cover	0
Table of Contents	0
Introducing IEEE Collabratec	0
The Impact of Gold Plating Process for Bonding Pads on Interconnection Quality	0
From Accelerated to Operating Conditions: How Trapped Charge Impacts on TDDB in SiO₂ and HfO₂ Stacks	0
Characterization and Modeling of Hot Carrier Degradation Under Dynamic Operation Voltage	0
IEEE Transactions on Device and Materials Reliability Publication Information	0
An Empirical Study on Fault Detection and Root Cause Analysis of Indium Tin Oxide Electrodes by Processing S-Parameter Patterns	0
Systematic Unsupervised Recycled Field-Programmable Gate Array Detection	0
Impact of Layout Parameter Mismatches on Short Circuit Reliability of Parallel-Connected Planar, Trench, and Double-Trench SiC MOSFETs	0
Blank Page	0
An Improved Steep-Slope Triple Metal Gate-Dual Dielectric-GaAs-Pocket-HTFET With Interface Trap Charges Analysis	0
Data-Driven Stress/Warpage Analyses Based on Stoney Equation for Packaging Applications	0
Investigation of Deuterium De-Passivation by Repetitive Thermal Stress in CMOS Fabrication	0
Effect of Ambient on the Field Emission Induced-Damage in Dielectric-Less MEMS Capacitive Structures	0
Device Reliability and Effect of Temperature on Memristors: Nanostructured V₂O₅	0
IEEE Transactions on Device and Materials Reliability Information for Authors	0