OOIR: Observatory of International Research

Papers

(The median citation count of IEEE Transactions on Device and Materials Reliability is 0. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-04-01 to 2025-04-01.)

Article	Citations
[Front cover]	48
TechRxiv: Share Your Preprint Research with the World!	40
Blank Page	36
Special Issue on Semiconductor Design for Manufacturing (DFM)Joint Call for Papers	26
Member Get-A-Member (MGM) Program	22
IEEE Transactions on Device and Materials Reliability Publication Information	21
2022 Index IEEE Transactions on Device and Materials Reliability Vol. 22	20
IEEE Robert Bosch Micro and Nano Electro Mechanical Systems Award	20
[Blank page]	19
Call for papers: Special issue on Solid-State Image Sensors	18
2021 IEEE EDS Early Career Award	17
IEEE Transactions on Device and Materials Reliability information for authors	17
IEEE Transactions on Device and Materials Reliability Information for Authors	16
Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on "Semiconductor Device Modeling for Circuit and System Design	16
From Mega to nano: Beyond one Century of Vacuum Electronics	16
Call for Papers for a Special Issue of IEEE Journal of the Electron Devices Society on "Materials, processing and integration for neuromorphic devices and in-memory computing"	14
The Characteristics and Reliability With Channel Length Dependent on the Deposited Sequence of SiO₂ and Si₃N₄ as PV in LTPS TFTs	13
Investigation of the Interaction Effect Between the Microstructure Evolution and the Thermo-Mechanical Behavior of Cu-Filled Through Silicon Via	12
IEEE Transactions on Device and Materials Reliability Publication Information	12
Reliability Characterization of a Low-k Dielectric Using Magnetoresistance as a Diagnostic Tool	12
Front Cover	12
Impact of Interface Layer on Device Characteristics of Si:HfO₂-Based FeFET’s	11
ESD Stress Effect on Failure Mechanisms in GaN-on-Si Power Device	11
Simulation Study of High-Speed Ge Photodetector Dark and Light Current Degradation	11
High-Performance Radiation-Hardened Spintronic Retention Latch and Flip-Flop for Highly Reliable Processors	11

A Novel DTSCR With Embedded MOS and Island Diodes for ESD Protection of High-Speed ICs	10
Failure Mechanism of Aluminum Diffusion in Low-Voltage Trench MOSFET With High Cell Density	10
Characterization of LDO Induced Increment of SEE Sensitivity for 22-nm FDSOI SRAM	10
Numerical Simulation of Trapped Hole Lateral Migration and Induced Threshold Voltage Retention Loss in a SONOS Flash Memory	10
FEA-Dominant Reliability and Lifetime Model of Double-Sided Cooling SiC Power Module	10
H²C-TM: A Hybrid High Coverage Test Method for Improving the Detection of HtD Faults in STT-MRAMs	10
Improvement of Encapsulation Technique of Organic Photovoltaics by UV-Curable Adhesive	10
Optimization Techniques for Reliable Low Leakage GNRFET-Based 9T SRAM	9
Detection and Analysis of Stress Wave in MOSFET Under Gate-Source Overvoltage Failure	9
Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs	9
Aging and Sintered Layer Defect Detection of Discrete MOSFETs Using Frequency Domain Reflectometry Associated With Parasitic Resistance	9
HEMT Inspired GaN Optical Waveguides: Analysis Under Thermal Stress and Prospects	9
Time-Dependent Dielectric Breakdown in 45-nm PD-SOI N-Channel FETs at Cryogenic Temperatures for Quantum Computing Applications	9
Systematic Unsupervised Recycled Field-Programmable Gate Array Detection	9
Extracting Total Ionizing Dose Threshold Voltage Shifts From Ring Oscillator Circuit Response	8
Linking the Intrinsic Electrical Response of Ferroelectric Devices to Material Properties by Means of Impedance Spectroscopy	8
Side-Channel Attack Resilient RHBD 12T SRAM Cell for Secure Nuclear Environment	8
CD-DFT: A Current-Difference Design-for-Testability to Detect Short Defects of STT-MRAM Under Process Variations	8
Analysis of Multicrystalline Si Solar Cell Improvement Using Laser-Beam-Induced Current Technique	8
A Consistent Analytical Method to Assess Reliability of Redundant Safety Instrumented Systems	8
A Modified Bypass Circuit for Improved Reliability of PV Module Validated With Real-Time Data	8
Qualitative and Quantitative Diagnostic Device for Detecting Defects in Crystalline Silicon PV Cells	8
Self-Heating Mapping of the Experimental Device and Its Optimization in Advance Sub-5 nm Node Junctionless Multi-Nanowire FETs	8
PEAR: Unbalanced Inter-Page Errors Aware Read Scheme for Latency-Efficient 3-D NAND Flash	8
Guidelines for the Design of Random Telegraph Noise-Based True Random Number Generators	8
An Empirical Study on Fault Detection and Root Cause Analysis of Indium Tin Oxide Electrodes by Processing S-Parameter Patterns	8
Design of Compact Reliable Energy Efficient Read Disturb Free 17T CNFET Ternary S-RAM Cell	8
From Accelerated to Operating Conditions: How Trapped Charge Impacts on TDDB in SiO₂ and HfO₂ Stacks	8
Characterization and Modeling of Hot Carrier Degradation Under Dynamic Operation Voltage	7
In-Field Testing of Functionally-Possible Transition Faults With High Activation Frequencies	7
Low Conductance State Drift Characterization and Mitigation in Resistive Switching Memories (RRAM) for Artificial Neural Networks	7
Total Ionizing Dose (TID) Impact on Basic Amplifier Stages	7
High Sensitivity Temperature Measurements to Track and Compensate Aging Effects on CMOS Amplifiers	7
Investigations on High-Power LEDs and Solder Interconnects in Automotive Application: Part I—Initial Characterization	7
CMOS Reliability From Past to Future: A Survey of Requirements, Trends, and Prediction Methods	7
Optimization of 3-D IC Routing Based on Thermal Equalization Analysis	7
Blank Page	6
Evaluations of Gate Oxide Reliability in SiC MOSFETs Under Extremely High Gate Voltage Stress	6
Utilizing Two Three-Transistor Structures for Designing Radiation Hardened Circuits	6
FPGA Assessment Methodology of Adverse X-Ray Effects on Secure Digital Circuits	6
IEEE Transactions on Device and Materials Reliability Publication Information	6
From Ground to Orbit: A Robust and Efficient Test Methodology for RISC-V Soft-Cores	6
A Review: Breakdown Voltage Enhancement of GaN Semiconductors-Based High Electron Mobility Transistors	6
Impact of Hot Carrier Aging on the 1/f and Random Telegraph Noise of Short-Channel Triple-Gate Junctionless MOSFETs	6
TechRxiv: Share Your Preprint Research with the World!	6
Mission Profile-Based Hotspot Temperature and Lifespan Estimation of DC-Link Capacitors Used in Automotive Traction Inverters	6
Negative Bias Temperature Instability in Top-Gated Carbon Nanotube Thin Film Transistors With Y₂O₃ Gate Dielectric	6
IEEE Transactions on Device and Materials Reliability Publication Information	5
Blank Page	5
TechRxiv: Share Your Preprint Research with the World!	5

A Thermal Circuit Representing Frequency Dependent Dynamic Heating Between Electron and Lattice in SOI-FinFET	5
Analysis of Floating Limiting Rings Termination Under Repetitive Avalanche Current Stress for 4H-SiC JBS Rectifiers	5
Table of contents	5
Blank Page	5
IEEE Transactions on Semiconductor Manufacturing CALL FOR PAPERS for Special Issue on Process-Level Machine Learning Applications in Semiconductor Manufacturing	5
[Blank page]	5
Workload-Aware Electromigration Analysis in Emerging Spintronic Memory Arrays	5
Eight-Level/Cell Storage by Tuning the Spatial Distribution of Dielectrics in a Tri-Layer ReRAM Cell: Electrical Characteristics and Reliability	5
Table of contents	5
IEEE Transactions on Device and Materials Reliabilityinformation for authors	5
The Influence of Bond Wire Aging on DM EMI Noise in IGBT Converters Considering High-Frequency Ringing	5
Exploiting Resistance Drift Characteristics to Improve Reliability of LDPC-Assisted Phase-Change Memory	5
Plasma Charging Damage in HK-First and HK-Last RMG NMOS Devices	5
Destructive Testing for Reliability Analysis at High-Power Microwave in GaAs/InGaP Hetero-Junction Bipolar Transistor	5
TechRxiv: Share Your Preprint Research with the World!	5
Electromigration Performance Improvement of Metal Heaters for Si Photonic Ring Modulators	4
Self-Heating and Reliability-Aware “Intrinsic” Safe Operating Area of Wide Bandgap Semiconductors—An Analytical Approach	4
Impact of Self-Heating on Linearity Performance of In_0.53Ga_0.47As-Based Gate-All-Around MOSFETs	4
Accelerated Lifetime Testing and Analysis of Delta-Doped Silicon Test Structures	4
Reliability Challenges in Advanced 3D Technologies: The Case of Through Silicon Vias and SiCN–SiCN Wafer-to-Wafer Hybrid-Bonding Technologies	4
Dynamic Reliability Assessment of Vertical GaN Trench MOSFETs With Thick Bottom Dielectric	4
Reliability Test of 21% Efficient Flexible Perovskite Solar Cell Under Concave, Convex and Sinusoidal Bending	4
Nondestructive and Quantitative Evaluation of a GaAs Epitaxial Layer Covered With a Silicon Nitride Insulating Thin Film After a Highly Accelerated Temperature and Humidity Stress With the Use of Phot	4
Implication of Self-Heating Effect on Device Reliability Characterization of Multi-Finger n-MOSFETs on 22FDSOI	4
Probing the Atomic-Scale Mechanisms of Time-Dependent Dielectric Breakdown in Si/SiO₂ MOSFETs (June 2022)	4
Negative-Bias Temperature Instability of p-GaN Gate GaN-on-Si Power Devices	4
Single Pulse Charge Pumping Technique Improvement for Interface-States Profiling in the Channel of MOSFET Devices	4
Cause Analysis on the Abnormal Failure of SiC Power Modules During the HV-H³TRB Tests	4
Guest Editorial TDMR IIRW Special Section	4
Elimination of Thermo-Mechanically Driven Circumferential Crack Formation in Copper Through-Glass via Substrate	4
Proton-Induced Effect on AlGaN/GaN HEMTs After Hydrogen Treatment	4
Highly Reproducible and Reliable Methanol Sensor Based on Hydrothermally Grown TiO₂ Nanoparticles	4
Research of Single-Event Burnout in 1.2-kV Rated CoolSiC Trench MOSFET	4
Modeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology	4
A DLTS Study on Deep Trench Processing-Induced Trap States in Silicon Photodiodes	4
Influence of Critical Working Conditions on Stability of Varistor Characteristics	4
Analysis of Hump Effect Induced by Positive Bias Temperature Instability in the Local Oxidation of Silicon n-MOSFETs	3
Reflow Residues on Printed Circuit Board Assemblies and Interaction With Humidity	3
Research of Single-Event Burnout in P-NiO/n-Ga₂O₃ Heterojunction Diode	3
Unveiling the Degradation Mechanism of Polymer-Based Thermal Interface Materials Under Thermo-Oxidative Condition	3
IEEE Transactions on Device and Materials Reliability Information for Authors	3
Blank Page	3
Measurements and Review of Failure Mechanisms and Reliability Constraints of 4H-SiC Power MOSFETs Under Short Circuit Events	3
Machine Learning Approach for Prediction of Point Defect Effect in FinFET	3
Negative Capacitance Vertical Dopingless TFET and Its Analog/RF Analysis Using Interface Trap Charges	3
Suppression of Total Dose Effects on the Performance of InAlGaN/GaN MIS-HEMT via Field Plate Implementation	3
IEEE Transactions on Device and MaterialsReliability publication information	3
TechRxiv: Share Your Preprint Research with the World!	3
A SiC Trench Schottky Diode With Accelerated Hole Extraction and Recombination Structure for Enhancing Single-Event Burnout Tolerance	3
Reliability and Process Scalability of TiO₂/Porous Silicon-Based Broadband Photodetectors	3
Monitoring Initial Solder Layer Degradation in a Multichip IGBT Module via Combined TSEPs	3
Introducing IEEE Collabratec	3
Table of Contents	3
Influence of Hot Carrier Degradation on Total Ionizing Dose in Bulk I/O-FinFETs	3
Special Issue on Semiconductor Design for Manufacturing (DFM)Joint Call for Papers	3
Table of Contents	3
Device Screening Strategy for Suppressing Current Imbalance in Parallel-Connected SiC MOSFETs	3
Design Optimization of Three-Stacked Nanosheet FET From Self-Heating Effects Perspective	3
Table of Contents	2
Table of Contents	2
Drain Extended MOS Body Region Engineering for Switching Reliability Under Unclamped Inductive Load Conditions	2
Special Issue on Intelligent Sensor Systems for the IEEE Journal of Electron Devices	2
IEEE Transactions on Device and Materials Reliability Publication Information	2
Blank page	2
TechRxiv: Share Your Preprint Research with the World!	2
Blank Page	2
Dielectrics for 2D electronics	2
Member Get-A-Member (MGM) Program	2
Degradation and Reliability Modeling of EM Robustness of Voltage Regulators Based on ADT: An Approach and a Case Study	2
Degradation Mapping and Impact of Device Dimension on IGZO TFTs BTI	2
IEEE Transactions on Device and Materials Reliability Information for Authors	2
2024 Index IEEE Transactions on Device and Materials Reliability Vol. 24	2
Call for Nominations for Editor-in-Chief	2
Dielectrics for 2D electronics	2
Effect of Hydrogen Molecule Release on NBTI by Low-Temperature Pre-Treatment in P-Channel Power VDMOS Transistors	2
Table of Contents	2
Reliability and Optimization Simulation Study of Zero-Temperature-Delay Point in Digital Circuits for Advanced Technology	2
Electro-Mechanical Properties of Molybdenum Thin Film on Polyethylene Terephthalate Subjected to Tensile Stress	2
Effect of Vapor Phase Infiltration on Metal-Polymer Adhesion for Ultra-Low-k Dielectric Materials	2
Thermal Runaway in Thin Film PV: temperature profile modeling	2

IEEE Transactions on Device and Materials Reliability Information for Authors	2
Introducing IEEE Collabratec	2
IEEE Transactions on Device and Materials Reliability Publication Information	2
Systematic Reliability Evaluation of FPGA Implemented CNN Accelerators	1
High Precision IGBT Health Evaluation Method: Extreme Learning Machine Optimized by Improved Krill Herd Algorithm	1
Mitigation Technique for Single Event Transient via Pulse Quenching	1
Investigation on Traps Dynamics & Negative Bias Stress in D-Mode GaN-on-Si Power MIS HEMTs Under High-Temperature	1
Editorial Kudos to Our Reviewers	1
Failure Mechanism and Predictive Modeling for Microbump Interconnects Drop Life Under Diverse Impact Angles in Advanced Packaging	1
Lateral and Vertical Gate Oxide Stacking Impact on Noise Margins and Delays for the 8T SRAM Designed With Source Pocket Engineered GaSb/Si Heterojunction Vertical TFET: A Reliability Study	1
Predicting the Degradation and Recovery Trends of the Photovoltaic Efficiency of Sb₂Se₃ Antimony Solar Cells	1
Metallic Ratio Equivalent-Time Sampling and Application to TDC Linearity Calibration	1
Bound-Constrained Expectation Maximization for Weibull Competing-Risks Device Reliability	1
A 10T Soft-Error-Immune SRAM With Multi-Node Upset Recovery for Low-Power Space Applications	1
Metallization Reliability of GaN-Based High-Voltage Light-Emitting Diodes	1
Novel ESD Compact Modeling Methodology Using Machine Learning Techniques for Snapback and Non-Snapback ESD Devices	1
Failure Analysis and Performance Improvement of Phase Change Memory Based on Ge₂Sb₂Te₅	1
Improving Breakdown Voltage in AlGaN/GaN Metal-Insulator-Semiconductor HEMTs Through Electric-Field Dispersion Layer Material Selection	1
Modeling of Threshold Voltage Degradation of 22nm FD-SOI nMOSFETs Under Dynamic Voltage Scaling	1
High Pressure Deuterium Annealing for Improved Immunity Against Stress-Induced Threshold Voltage Degradation	1
Correlation of Radiation-Induced Interface Traps With Band Edge Energy Through Band Structure-Based Analysis of Electrostatics of UTB SOI Devices	1
Layout-Dominated Dynamic Imbalanced Current Analysis and Its Suppression Strategy of Parallel SiC MOSFETs	1
Analyzing Total-Ionizing-Dose Induced Memory Window Degradation in Ferroelectric FinFET	1
Irradiation-Induced Degradation of Surface Acoustic Wave Devices Fabricated on Bulk AlN	1
Comparative Analysis of SGTMOS Degradation Under Repeated Off-State Avalanche and Short Circuit Current Pulses	1
Cylindrical Indentation to Selectively Stress Nanoscale CMOS Transistors	1
The Impact of Gold Plating Process for Bonding Pads on Interconnection Quality	1
SafeDE: A Low-Cost Hardware Solution to Enforce Diverse Redundancy in Multicores	1
Degradation Physics of Silicone Under UV-A Irradiation	1
Simulation Study of Stress Effect on Performance and Design Methodology of Proposed Si/SiGe Integrated Bragg Grating Filter	1
Developing Cost-Effective Ultrathin Reliable High Power White LED Emitters	1
Investigation of Deuterium De-Passivation by Repetitive Thermal Stress in CMOS Fabrication	1
Thermal Effect on Carbon Nanotube Fiber High-Ampacity Conductors at High Frequencies	1
Study on Characteristics and UIS of Hexagonal Planar SiC VDMOSFETs With Varied JFET Width	1
White X-Ray Radiation Effects in MOS Capacitors With Atomic Layer Deposited HfO₂/Al₂O₃ and Al₂O₃/HfO₂/Al₂O₃ Gate	1
Frequency Dependent Degradation and Failure of Flexible a-InGaZnO Thin-Film Transistors Under Dynamic Stretch Stress	1
Simulation Study of Single-Event Burnout Reliability for 1.7-kV 4H-SiC VDMOSFET	1
Trap Location and Stress Degradation Analysis of GaN High Electron Mobility Transistors Based on the Transient Current Method	1
A Nonvolatile Multilevel Data Storage Memory Based on Two-Dimensional Materials for Aerospace Applications	1
Comprehensive Study on Trap-Induced Bias Instability via High-Pressure D ₂ and N ₂ Annealing	1
LCHC-DFT: A Low-Cost High-Coverage Design-for-Testability Technique to Detect Hard-to-Detect Faults in STT-MRAMs in the Presence of Process Variations	1
A 16nm All-Digital Hardware Monitor for Evaluating Electromigration Effects in Signal Interconnects Through Bit-Error-Rate Tracking	1
Reliability Analysis of Storage Systems With Partially Repairable Devices	0
IEEE Transactions on Device and Materials Reliability Information for Authors	0
Unveiling T_max Inside GaN HEMT Based X-Band Low-Noise Amplifier by Correlating Thermal Simulations and IR Thermographic Measurements	0
Schottky Gate Induced Threshold Voltage Instabilities in p-GaN Gate AlGaN/GaN HEMTs	0
A New Scheme of the Low-Cost Multiple-Node-Upset-Tolerant Latch	0
Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on "Wide and Ultrawide Bandgap Semiconductor Devices for RF and Power Applications"	0
Mechanism Analysis and Thermal Damage Prediction of High-Power Microwave Radiated CMOS Circuits	0
IEEE Transactions on Device and MaterialsReliability publication information	0
Temperature-Dependent Study of Large-Signal Reliability of p-FET-Based Power Amplifier for mmWave Applications	0
2023 Index IEEE Transactions on Device and Materials Reliability Vol. 23	0
Microstructural Evolution of Gate Oxide in SiC power MOSFETs under Heavy-Ion Irradiation	0
TDMR December 2024 Editorial	0
IEEE Transactions on Device and MaterialsReliability publication information	0
Effect of Wiring Density and Pillar Structure on Chip Packaging Interaction for Mixed-Signal Cu Low k Chips	0
The Failure Mechanism of Internal Circuit During ESD Striking a Power to Another Power	0
EXT-TAURUM P2T: An Extended Secure CAN-FD Architecture for Road Vehicles	0
IEEE Transactions on Device and Materials Reliabilityinformation for authors	0
IEEE Transactions on Device and Materials Reliability Publication Information	0
Study on Lifetime Modeling of IGBT Modules Considering Electric Frequency Influence Mechanism	0
Investigations on High-Power LEDs and Solder Interconnects in Automotive Application: Part II—Reliability	0
Design, Fabrication and Characterization of Single-Crystalline Graphene gNEMS ESD Switches for Future ICs	0
TechRxiv: Share Your Preprint Research with the World!	0
Development of Accelerated Life Testing Apparatus for Light-Emitting Diode Therapy	0
Table of Contents	0
Reliability Characterization and Failure Prediction of 3D TLC SSDs in Large-Scale Storage Systems	0
J. J. Ebers Award	0
Exploration of the exciting world of multifunctional oxide-based electronic devices: from material to system-level applications	0
Front Cover	0
An Analytical Model of Read-Disturb Failure Time in a Post-Cycling Resistive Switching Memory	0
New Total-Ionizing-Dose Resistant Data Storing Technique for NAND Flash Memory	0
IEEE Transactions on Device and Materials Reliabilityinformation for authors	0
Review of Double-Sided Cooling Power Modules for Driving Electric Vehicles	0
Impact of Layout Parameter Mismatches on Short Circuit Reliability of Parallel-Connected Planar, Trench, and Double-Trench SiC MOSFETs	0
Modeling of Temperature Rises at Focal-Plane-Array and Their Impact on the Performance of a CCD-Based Spaceborne Earth-Observing Imaging System	0
Mechanism and Quantitative Modeling of the SRAM Soft Error Induced by Space Electrostatic Discharge	0
Table of Contents	0
Low-Temperature Deuterium Annealing for the Recovery of Ionizing Radiation-Induced Damage in MOSFETs	0
IEEE Transactions on Device and Materials Reliability Information for Authors	0
Access Region Stack Engineering for Mitigation of Degradation in AlGaN/GaN HEMTs With Field Plate	0
IEEE Transactions on Device and Materials Reliability Publication Information	0
Effects of Temperature and Bias Voltage on Electron Transport Properties in GaN High-Electron-Mobility Transistors	0
IEEE Transactions on Device and Materials Reliability Information for Authors	0
Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on "Wide and Ultrawide Bandgap Semiconductor Devices for RF and Power Applications"	0
Cryogenic Total Ionizing Dose Effects and Annealing Behaviors of SiGe HBTs	0
Strain—Engineered Asymmetrical Si/Si_1–xGe_x IR-Photo-Detector: Theoretical Reliability and Experimental Feasibility Studies	0
Call for Papers for a Special Issue of IEEE Journal of the Electron Devices Society on "Materials, processing and integration for neuromorphic devices and in-memory computing"	0
Investigation of Self-Heating Effect in Tree-FETs by Interbridging Stacked Nanosheets: A Reliability Perspective	0
Investigation of the Long-Term Reliability of a Velostat-Based Flexible Pressure Sensor Array for 210 Days	0
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Lightweight Read Reference Voltage Calibration Strategy for Improving 3-D TLC NAND Flash Memory Reliability	0
Single-Event Burnout Effects of Complementary LDMOS Devices in High-Voltage Integrated Circuits	0
A Low-Area Overhead and Low-Delay Triple-Node-Upset Self-Recoverable Design Based on Stacked Transistors	0
TDDB Lifetime Reduction From Charging Damage in a 3D Vertical NAND Memory Technology	0