OOIR: Observatory of International Research

Papers

(The TQCC of IEEE Transactions on Device and Materials Reliability is 4. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-11-01 to 2025-11-01.)

Article	Citations
From Mega to nano: Beyond one Century of Vacuum Electronics	53
Special Issue on Semiconductor Design for Manufacturing (DFM)Joint Call for Papers	50
Mission Profile-Based Hotspot Temperature and Lifespan Estimation of DC-Link Capacitors Used in Automotive Traction Inverters	35
Investigation of the Interaction Effect Between the Microstructure Evolution and the Thermo-Mechanical Behavior of Cu-Filled Through Silicon Via	29
FEA-Dominant Reliability and Lifetime Model of Double-Sided Cooling SiC Power Module	24
Sintered Silver-Based Direct-Cooled IGBTs With High Output Power and Thermal Reliability	23
Investigations on High-Power LEDs and Solder Interconnects in Automotive Application: Part I—Initial Characterization	23
Location-Aware Error Correction for Mitigating the Impact of Interconnects on STT-MRAM Reliability	23
Guidelines for the Design of Random Telegraph Noise-Based True Random Number Generators	23
A Modified Bypass Circuit for Improved Reliability of PV Module Validated With Real-Time Data	22
IEEE Transactions on Device and Materials Reliability Publication Information	18
IEEE Transactions on Device and Materials Reliability Publication Information	18
Implication of Self-Heating Effect on Device Reliability Characterization of Multi-Finger n-MOSFETs on 22FDSOI	17
Modeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology	17
Research of Single-Event Burnout in P-NiO/n-Ga₂O₃ Heterojunction Diode	16
Reliability of Advanced Nodes	16
Unveiling the Degradation Mechanism of Polymer-Based Thermal Interface Materials Under Thermo-Oxidative Condition	15
A DLTS Study on Deep Trench Processing-Induced Trap States in Silicon Photodiodes	15
Device Screening Strategy for Suppressing Current Imbalance in Parallel-Connected SiC MOSFETs	14
Single-Event Effects Induced by Monoenergetic Fast Neutrons in Silicon Power UMOSFETs	14
Degradation Analysis of 14 nm SOI FinFETs by Influence of Hot Carrier Injection and Self-Heating Synergistic Effects	14
Simulation Study of Stress Effect on Performance and Design Methodology of Proposed Si/SiGe Integrated Bragg Grating Filter	13
Thermal Effect on Carbon Nanotube Fiber High-Ampacity Conductors at High Frequencies	13
Fault Modeling and Test Algorithm Development Framework for Gate-All-Around SRAMs	13
IEEE Transactions on Device and Materials Reliability Publication Information	13

Insights Into the Effects of Interface Trap Charges on Electrostatic-Based Magnesium Silicide Tunneling Interface	13
Lifetime Prediction of IGBT by BPNN Based on Improved Dung Beetle Optimization Algorithm	13
Study of Trap Influence on Threshold Voltage of SiC MOSFET Based on Transient Current Method	12
Failure Mechanism and Predictive Modeling for Microbump Interconnects Drop Life Under Diverse Impact Angles in Advanced Packaging	12
Introducing IEEE Collabratec	12
Member Get-A-Member (MGM) Program	12
Table of Contents	12
A Novel Dual-Mode Dual Trench MOSFET With Self-Adjustable Field Plate for Low EMI Noise and High Dynamic Avalanche Robustness	12
TechRxiv: Share Your Preprint Research with the World!	12
Non-Traditional Operational Mechanisms of NbOx-Based Threshold Switching Devices Used on on-Chip ESD Protection	11
Revealing the Impact of Gate Area Scaling on Charge Trapping Employing SiO₂Transistors	11
A New SiC Quasi MOSFET for Ultra-Low Specific On-Resistance and Improved Reliability	11
IEEE Transactions on Device and Materials Reliability Publication Information	10
A Lifetime Prediction Method of IGBT Based on Phased Nonlinear Wiener Process	10
From Mega to nano: Beyond one Century of Vacuum Electronics	10
IEEE Transactions on Device and Materials Reliability Information for Authors	10
Predicting Failure Distributions of SRAM Arrays by Using Extreme Value Statistic, Bit Cell Simulation, and Machine Learning	10
Degradation Behavior and Mechanism of SONOS FLASH by Total Ionization Dose Effects	10
Compact Modeling of Process Variation and Reliability Predictions for Nanosheet Gate-All-Around FET	10
Analysis of Trapping Mechanisms and Capacitance Dispersion in Double-π Gate AlGaN/GaN HEMTs Under High-Temperature Conditions	10
Reliability and Characterization of Nanosilver Joints Prepared by a Time-Reduced Sintering Process	10
Temperature-Dependent Study of Large-Signal Reliability of p-FET-Based Power Amplifier for mmWave Applications	9
An Analytical Model of Read-Disturb Failure Time in a Post-Cycling Resistive Switching Memory	9
Open Model Interface Assisted NBTI-Aware Design With Dual-V_th Logic Synthesis Strategy for Reliability Improvement	9
Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on "Semiconductor Device Modeling for Circuit and System Design	9
TechRxiv: Share Your Preprint Research with the World!	9
Blank Page	9
Plasma Induced Charging Damage Causing MOS Device Reliability Lifetime Degradation Originating From Well Charging of a Technology With Deep Trench Isolation	9
Erratum to “Reliability Characterization of a Low-k Dielectric Using Magnetoresistance as a Diagnostic Tool”	9
Call for Nominations Editor-in-Chief IEEE Transactions on Device and Materials Reliability	9
Impact of Pulse Voltage Stress on the Reliability of Ferroelectric Thin-Film Transistor	9
Aging-Induced Mg Cluster Observation in GaN-Based Lasers by Atom Probe Tomography	9
Negative Bias Temperature Instability in Top-Gated Carbon Nanotube Thin Film Transistors With Y₂O₃ Gate Dielectric	8
FPGA Assessment Methodology of Adverse X-Ray Effects on Secure Digital Circuits	8
Reliability of VO textsubscript 2-Based mmWave Switches Under 100 Million Thermal Cycles	8
A Consistent Analytical Method to Assess Reliability of Redundant Safety Instrumented Systems	8
Table of Contents	8
Effects of Temperature and Bias Voltage on Electron Transport Properties in GaN High-Electron-Mobility Transistors	8
Designing and Reliability Analysis of Radiation Hardened Stacked Gate Junctionless FinFET and CMOS Inverter	8
Proton Irradiation Effects on Single Event Burnout in AlGaN/GaN HEMTs	8
Evaluations of Gate Oxide Reliability in SiC MOSFETs Under Extremely High Gate Voltage Stress	8
Development of Accelerated Life Testing Apparatus for Light-Emitting Diode Therapy	8
[Blank page]	8
Exploring the Optimal Solution for Graphene-Based Microstrip Line Attenuators	7
Low Conductance State Drift Characterization and Mitigation in Resistive Switching Memories (RRAM) for Artificial Neural Networks	7
TechRxiv: Share Your Preprint Research with the World!	7
Blank Page	7
Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs	7
Aging and Sintered Layer Defect Detection of Discrete MOSFETs Using Frequency Domain Reflectometry Associated With Parasitic Resistance	7
Influence of Critical Working Conditions on Stability of Varistor Characteristics	7

Design of Robust SRAM Cell With Enhanced Soft-Error Hardening for Radiation-Prone Applications	7
IEEE Transactions on Device and MaterialsReliability publication information	7
Call for Nominations for Editor-in-Chief IEEE Electron Device Letters	7
Investigation of Electrical Breakdown in AlGaN/GaN/AlN HEMTs Through Nanoscale Analysis and Physics-Based Modeling	6
An Efficient Modeling Approach for Electrothermal Migration Analysis of On-Chip Interconnects	6
Lifetime Prediction Method for IGBT Modules Under Combined Power Cycling–Vibration Conditions	6
IEEE Transactions on Device and Materials Reliability Publication Information	6
Introducing IEEE Collabratec	6
Negative Capacitance Vertical Dopingless TFET and Its Analog/RF Analysis Using Interface Trap Charges	6
Reflow Residues on Printed Circuit Board Assemblies and Interaction With Humidity	6
Correlation of Radiation-Induced Interface Traps With Band Edge Energy Through Band Structure-Based Analysis of Electrostatics of UTB SOI Devices	6
Call for Nominations for Editor-in-Chief IEEE Transactions on Semiconductor Manufacturing	6
Research of Single-Event Burnout in 1.2-kV Rated CoolSiC Trench MOSFET	6
Effects of Electron Irradiation and Thermal Cycling on Electrical Properties of SiC MOSFET	6
Error-Corrected RRAM-Based Compute-in-Memory Accelerator Using Voltage-Clamp Current Mirror	6
Comprehensive Study on Trap-Induced Bias Instability via High-Pressure D ₂ and N ₂ Annealing	6
Radiation Hardened SOI LDMOS With Dual P-Type Layers Shielding Irradiation Charge Field	6
Systematic Reliability Evaluation of FPGA Implemented CNN Accelerators	5
Trap Location and Stress Degradation Analysis of GaN High Electron Mobility Transistors Based on the Transient Current Method	5
Call for Nominations for Editor-in-Chief	5
Influence of Phase Coarsening on Inhomogeneous Deformation and Fracture Behavior in Sn–Bi Solder Interconnects	5
Memristive Switching Behavior of MoO₃ Decorated PSi Heterostructure and Impact of Temperature on Device Reliability	5
Wide Band Gap Semiconductors for Automotive Applications	5
White X-Ray Radiation Effects in MOS Capacitors With Atomic Layer Deposited HfO₂/Al₂O₃ and Al₂O₃/HfO₂/Al₂O₃ Gate	5
Analysis of Multicrystalline Si Solar Cell Degradation Due To Reverse Bias and High Temperature Aging	5
Comprehensive TCAD-Based Single Event Effect Study of TFET-Based 1T DRAM and Crossbar Memory Array	5
IEEE Transactions on Device and Materials Reliability Information for Authors	5
Degradation Mapping and Impact of Device Dimension on IGZO TFTs BTI	5
IEEE Transactions on Device and Materials Reliability information for authors	4
Metallization Reliability of GaN-Based High-Voltage Light-Emitting Diodes	4
A Highly Reliable Dual-Node-Upset-Tolerant 20T Radiation Hardened SRAM Cell for Aerospace Applications	4
Single-Event Burnout Hardening 4H-SiC UMOSFET Structure	4
Modeling Degradation Kinetics of FAPbI₃ Perovskite Solar Cells: Impact of Microstructural and Optoelectronic Defects	4
Soft-Error-Aware SRAM for Terrestrial Applications	4
Call for Papers for a Special Issue of IEEE Journal of the Electron Devices Society on "Materials, processing and integration for neuromorphic devices and in-memory computing"	4
Reliability of Advanced Nodes	4
Metastable Operating Stability of Perovskite/Silicon Tandem Solar Cell Modules	4
Design of Highly Reliable 14T and 16T SRAM Cells Combined With Layout Harden Technique	4
An Effective Method to Identify Microarchitectural Vulnerabilities in GPUs	4
Front Cover	4
ESR Modeling for Atmospheric Corrosion Behavior of Metallized Film Capacitors	4
Characterization, Analysis, and Modeling of Long-Term RF Reliability and Degradation of SiGe HBTs for High Power Density Applications	4
2023 Index IEEE Transactions on Device and Materials Reliability Vol. 23	4
Failure Mechanisms of Fluorine-Doped Tin Oxide Thin Films in Glass and Reliability Tests	4
IEEE Transactions on Device and Materials Reliability Information for Authors	4
Irradiation-Induced Degradation of Surface Acoustic Wave Devices Fabricated on Bulk AlN	4
Table of Contents	4
DAAS: Differential Aging-Aware STA for Precise Timing Closure With Reduced Design Margin	4
Effect of Aging Temperature on the Fatigue Resistance and Shear Strength of SAC305 Solder Joints	4
IEEE Transactions on Device and MaterialsReliability publication information	4
Fe-Related Trapping and Detrapping Dynamics in AlGaN/GaN HEMTs Inspected by Drain Current Transient (DCT) Spectroscopy	4