OOIR: Observatory of International Research

Papers

(The TQCC of IEEE Transactions on Device and Materials Reliability is 4. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2022-05-01 to 2026-05-01.)

Article	Citations
From Mega to nano: Beyond one Century of Vacuum Electronics	59
Special Issue on Semiconductor Design for Manufacturing (DFM)Joint Call for Papers	55
Editorial	34
Guidelines for the Design of Random Telegraph Noise-Based True Random Number Generators	31
Location-Aware Error Correction for Mitigating the Impact of Interconnects on STT-MRAM Reliability	30
A Modified Bypass Circuit for Improved Reliability of PV Module Validated With Real-Time Data	28
Sintered Silver-Based Direct-Cooled IGBTs With High Output Power and Thermal Reliability	28
Investigations on High-Power LEDs and Solder Interconnects in Automotive Application: Part I—Initial Characterization	26
Package-Level Electro-Thermal Simulation With Transient Thermal Resistance Model for Surge Stress Failure Analysis of SiC MOSFET	23
On the Response Time Constant of Interface Defects in Accumulation	22
FEA-Dominant Reliability and Lifetime Model of Double-Sided Cooling SiC Power Module	21
Mission Profile-Based Hotspot Temperature and Lifespan Estimation of DC-Link Capacitors Used in Automotive Traction Inverters	21
Investigation of the Interaction Effect Between the Microstructure Evolution and the Thermo-Mechanical Behavior of Cu-Filled Through Silicon Via	20
IEEE Transactions on Device and Materials Reliability Publication Information	19
Reliability of Advanced Nodes	18
IEEE Transactions on Device and Materials Reliability Publication Information	18
Modeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology	17
Table of Contents	16
Stability in Electroluminescence from Ag-NSi Schottky Junction LED: Role of Ambient Oxidation	16
Implication of Self-Heating Effect on Device Reliability Characterization of Multi-Finger n-MOSFETs on 22FDSOI	16
A DLTS Study on Deep Trench Processing-Induced Trap States in Silicon Photodiodes	15
Unveiling the Degradation Mechanism of Polymer-Based Thermal Interface Materials Under Thermo-Oxidative Condition	15
IEEE Transactions on Device and Materials Reliability Publication Information	15
Research of Single-Event Burnout in P-NiO/n-Ga ₂ O ₃ Heterojunction Diode	15
Degradation Analysis of 14 nm SOI FinFETs by Influence of Hot Carrier Injection and Self-Heating Synergistic Effects	15

Fault Modeling and Test Algorithm Development Framework for Gate-All-Around SRAMs	14
Failure Mechanism and Predictive Modeling for Microbump Interconnects Drop Life Under Diverse Impact Angles in Advanced Packaging	14
Lifetime Prediction of IGBT by BPNN Based on Improved Dung Beetle Optimization Algorithm	13
Insights Into the Effects of Interface Trap Charges on Electrostatic-Based Magnesium Silicide Tunneling Interface	13
Effects of Electrolyte Volume on Electrochemical Migration of Tin in Water Drop Test	13
Impact of Substrate connection on Dynamic-R _ON drift of 650V normally-off Monolithic Bidirectional AlGaN/GaN HEMT	12
Single-Event Effects Induced by Monoenergetic Fast Neutrons in Silicon Power UMOSFETs	12
Table of Contents	12
IEEE Transactions on Device and Materials Reliability Publication Information	12
Introducing IEEE Collabratec	11
Electrical Switching Safe Operation Area on GaN Bidirectional Switches Under Hard-Switching Conditions by Multiple Pulse Test	11
Member Get-A-Member (MGM) Program	11
Revealing the Impact of Gate Area Scaling on Charge Trapping Employing SiO₂Transistors	11
TechRxiv: Share Your Preprint Research with the World!	11
A Novel Dual-Mode Dual Trench MOSFET With Self-Adjustable Field Plate for Low EMI Noise and High Dynamic Avalanche Robustness	11
Study of Trap Influence on Threshold Voltage of SiC MOSFET Based on Transient Current Method	10
Predicting Failure Distributions of SRAM Arrays by Using Extreme Value Statistic, Bit Cell Simulation, and Machine Learning	10
Avalanche Failure Mechanisms of 1200-V/40-A 4H-SiC Junction Barrier Schottky Diodes with Various Epilayer Defects	10
A New SiC Quasi MOSFET for Ultra-Low Specific On-Resistance and Improved Reliability	10
IEEE Transactions on Device and Materials Reliability Information for Authors	10
A Lifetime Prediction Method of IGBT Based on Phased Nonlinear Wiener Process	10
Non-Traditional Operational Mechanisms of NbO _x -Based Threshold Switching Devices Used on On-Chip ESD Protection	10
IEEE Transactions on Device and Materials Reliability Publication Information	10
Analysis of Trapping Mechanisms and Capacitance Dispersion in Double-π Gate AlGaN/GaN HEMTs Under High-Temperature Conditions	10
Reliability Analysis of IGZO Thin Film Transistor for Wearable Biosensing Applications	10
TechRxiv: Share Your Preprint Research with the World!	9
Aging-Induced Mg Cluster Observation in GaN-Based Lasers by Atom Probe Tomography	9
Temperature-Dependent Study of Large-Signal Reliability of p-FET-Based Power Amplifier for mmWave Applications	9
Compact Modeling of Process Variation and Reliability Predictions for Nanosheet Gate-All-Around FET	9
Call for Nominations Editor-in-Chief IEEE Transactions on Device and Materials Reliability	9
Degradation Behavior and Mechanism of SONOS FLASH by Total Ionization Dose Effects	9
Impact of Pulse Voltage Stress on the Reliability of Ferroelectric Thin-Film Transistor	9
Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on "Semiconductor Device Modeling for Circuit and System Design	9
Blank Page	9
Open Model Interface Assisted NBTI-Aware Design With Dual-V _th Logic Synthesis Strategy for Reliability Improvement	9
FPGA Assessment Methodology of Adverse X-Ray Effects on Secure Digital Circuits	8
Proton Irradiation Effects on Single Event Burnout in AlGaN/GaN HEMTs	8
Aging and Sintered Layer Defect Detection of Discrete MOSFETs Using Frequency Domain Reflectometry Associated With Parasitic Resistance	8
Reliability of VO textsubscript 2-Based mmWave Switches Under 100 Million Thermal Cycles	8
Table of Contents	8
Design of Robust SRAM Cell With Enhanced Soft-Error Hardening for Radiation-Prone Applications	8
NAVIgator under Fire: Characterizing Voltage Limits and Soft Error Resilience of AMD NAVI GPUs	8
Designing and Reliability Analysis of Radiation Hardened Stacked Gate Junctionless FinFET and CMOS Inverter	8
Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs	8
Mitigating the Process Variations in Negative Capacitance Junctionless Device and Circuit	8
Plasma Induced Charging Damage Causing MOS Device Reliability Lifetime Degradation Originating From Well Charging of a Technology With Deep Trench Isolation	8
SiC MOSFET Gate-Oxide and SiC/SiO ₂ Interface Defect Charge Movement Based on the Hi-Lo C _ISS	7
Negative Bias Temperature Instability in Top-Gated Carbon Nanotube Thin Film Transistors With Y₂O₃ Gate Dielectric	7
Evaluations of Gate Oxide Reliability in SiC MOSFETs Under Extremely High Gate Voltage Stress	7
Call for Nominations for Editor-in-Chief IEEE Electron Device Letters	7

TCAD Investigation on a Novel SiC Trench MOSFET With Integrated N ⁺ -PolySi/SiC Heterojunction Diode for Improved Third-Quadrant and High-Temperature	7
A Consistent Analytical Method to Assess Reliability of Redundant Safety Instrumented Systems	7
Blank Page	7
Low Conductance State Drift Characterization and Mitigation in Resistive Switching Memories (RRAM) for Artificial Neural Networks	7
Semi-empirical Modeling of Hot Carrier Degradation in 12 nm FinFET LDMOS devices	7
Exploring the Optimal Solution for Graphene-Based Microstrip Line Attenuators	7
TechRxiv: Share Your Preprint Research with the World!	7
Analytical Model for Cu Interconnect Lifetimes Under Combined Thermomigration and Electromigration Stress	6
Influence of Critical Working Conditions on Stability of Varistor Characteristics	6
High Gate Reliability and Breakdown Voltage p-GaN HEMTs Based on Post-Annealing-Free Oxygen Plasma Treatment	6
Radiation Hardened SOI LDMOS With Dual P-Type Layers Shielding Irradiation Charge Field	6
An Efficient Modeling Approach for Electrothermal Migration Analysis of On-Chip Interconnects	6
Error-Corrected RRAM-Based Compute-in-Memory Accelerator Using Voltage-Clamp Current Mirror	6
IEEE Transactions on Device and Materials Reliability Publication Information	6
Negative Capacitance Vertical Dopingless TFET and Its Analog/RF Analysis Using Interface Trap Charges	6
Effects of Electron Irradiation and Thermal Cycling on Electrical Properties of SiC MOSFET	6
Key Factors Affecting Dynamic Reliability in GaN HEMTs and How Can They Be Mitigated?	6
Lifetime Prediction Method for IGBT Modules Under Combined Power Cycling–Vibration Conditions	6
Research of Single-Event Burnout in 1.2-kV Rated CoolSiC Trench MOSFET	6
Analysis and Structural Mitigation of Trapping-State-Trap Induced Drain Leakage Current in Buried-Channel-Array-Transistor	6
Call for Nominations for Editor-in-Chief IEEE Transactions on Semiconductor Manufacturing	6
Investigation of Electrical Breakdown in AlGaN/GaN/AlN HEMTs Through Nanoscale Analysis and Physics-Based Modeling	6
White X-Ray Radiation Effects in MOS Capacitors With Atomic Layer Deposited HfO₂/Al₂O₃ and Al₂O₃/HfO₂/Al₂O₃ Gate	5
Trap Location and Stress Degradation Analysis of GaN High Electron Mobility Transistors Based on the Transient Current Method	5
Influence of Phase Coarsening on Inhomogeneous Deformation and Fracture Behavior in Sn–Bi Solder Interconnects	5
IEEE Transactions on Device and Materials Reliability Information for Authors	5
Memristive Switching Behavior of MoO₃ Decorated PSi Heterostructure and Impact of Temperature on Device Reliability	5
Comprehensive Study on Trap-Induced Bias Instability via High-Pressure D ₂ and N ₂ Annealing	5
A Highly Reliable Dual-Node-Upset-Tolerant 20T Radiation Hardened SRAM Cell for Aerospace Applications	5
Degradation Mapping and Impact of Device Dimension on IGZO TFTs BTI	5
Call for Nominations for Editor-in-Chief	5
Design of Highly Reliable 14T and 16T SRAM Cells Combined With Layout Harden Technique	5
Correlation of Radiation-Induced Interface Traps With Band Edge Energy Through Band Structure-Based Analysis of Electrostatics of UTB SOI Devices	5
Wide Band Gap Semiconductors for Automotive Applications	5
IEEE Transactions on Device and Materials Reliability Information for Authors	4
Comprehensive TCAD-Based Single Event Effect Study of TFET-Based 1T DRAM and Crossbar Memory Array	4
Digital Probing of Activation Energy for Evaluating Reliability in 2-D and 3-D NAND Flash Memory	4
ESR Modeling for Atmospheric Corrosion Behavior of Metallized Film Capacitors	4
DAAS: Differential Aging-Aware STA for Precise Timing Closure With Reduced Design Margin	4
An Effective Method to Identify Microarchitectural Vulnerabilities in GPUs	4
Effect of Aging Temperature on the Fatigue Resistance and Shear Strength of SAC305 Solder Joints	4
Characterization, Analysis, and Modeling of Long-Term RF Reliability and Degradation of SiGe HBTs for High Power Density Applications	4
Irradiation-Induced Degradation of Surface Acoustic Wave Devices Fabricated on Bulk AlN	4
Table of Contents	4
Comparison of Different Input Data for the Prediction of LED Solder Joints Using Artificial Neural Networks	4
Reliability of Advanced Nodes	4
Metastable Operating Stability of Perovskite/Silicon Tandem Solar Cell Modules	4
Call for Papers for a Special Issue of IEEE Journal of the Electron Devices Society on "Materials, processing and integration for neuromorphic devices and in-memory computing"	4
Fast Heater‑Based NBTI Resolves the Reverse Antenna Effect in PID‑Degraded High‑k and SiO ₂ pMOSFETs	4
Single-Event Burnout Hardening 4H-SiC UMOSFET Structure	4
Failure Mechanisms of Fluorine-Doped Tin Oxide Thin Films in Glass and Reliability Tests	4
Systematic Reliability Evaluation of FPGA Implemented CNN Accelerators	4
Analysis of Multicrystalline Si Solar Cell Degradation Due to Reverse Bias and High Temperature Aging	4
SafeHDC: Concurrent Uncertainty and Fault Detection in Hyperdimensional Computing	4
Fe-Related Trapping and Detrapping Dynamics in AlGaN/GaN HEMTs Inspected by Drain Current Transient (DCT) Spectroscopy	4
Front Cover	4
IEEE Transactions on Device and MaterialsReliability publication information	4
Modeling Degradation Kinetics of FAPbI₃ Perovskite Solar Cells: Impact of Microstructural and Optoelectronic Defects	4