IEEE Design & Test

Article	Citations
IEEE Foundation	67
Top Picks in Hardware and Embedded Security 2022	41
Flexible and Portable Management of Secure Scan Implementations Exploiting P1687.1 Extensions	36
Special Issue on the 2023 Symposium on Integrated Circuits and Systems Design	31
On Backside Probing Techniques and Their Emerging Security Threats	28
Celebrating 20 Years of EDA: Milestones, Challenges, and Future Directions	25
SPOCK: Reverse Packet Traversal for Deadlock Recovery	24
An Energy-Aware Nanoscale Design of Reversible Atomic Silicon Based on Miller Algorithm	22
BHT-NoC: Blaming Hardware Trojans in NoC Routers	22
Special Issue on Emerging Challenges With 3-D NAND Flash Storage	20
Improvement of Functional Safety of the Level-Crossing Barrier Machine by a Noninvasive Angle-Detection Method	19
Report on the 28th Asia and South Pacific Design Automation Conference	18
Tipping the Balance: Imbalanced Classes in Deep-Learning Side-Channel Analysis	18
Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond	17
IEEE Connects You to a Universe of Information!	17
Front Cover	16
Celebrating Three Decades of IEEE/ACM International Symposium on Low Power Electronics and Design	15
On the Impact of Uncertainties in Silicon-Photonic Neural Networks	15
ISCA: Intelligent Sense-Compute Adaptive Co-Optimization of Multimodal Machine Learning Kernels for Resilient mHealth Services on Wearables	14
The 2022 International Conference on Computer-Aided Design (ICCAD)	13
An Open-Source 12-bit 10-kS/s Incremental ADC in 130-nm CMOS	13
Special Issue on Wearable IoT Devices for Reliable Mobile Health Applications	12
IC Phone Home!	12
IEEE App	11
edAttack: Hardware Trojan Attack on On-Chip Packet Compression	11

FlooNoC: A Multi-Tb/s Wide NoC for Heterogeneous AXI4 Traffic	10
IEEE Design&Test Publication Information	10
Soft and Hard Error-Correction Techniques in STT-MRAM	10
Hardware/Software Coexploration for Hyperdimensional Computing on Network-on-Chip Architecture	9
IEEE Design & Test Publication Information	9
Eavesdropping Attack Detection Using Machine Learning in Network-on-Chip Architectures	9
Datapath Extension of NPUs to Support Nonconvolutional Layers Efficiently	9
Table of Contents	9
Get in the Conversation!	9
Blank Page	9
Special Issue on the 2021 Workshop on Top Picks in Hardware and Embedded Security	8
Table of Contents	8
Fault-Tolerant Neuromorphic Computing With Memristors Using Functional ATPG for Efficient Recalibration	8
IEEE Design & Test Publication Information	8
CLEAR Cross-Layer Resilience: A Retrospective	7
IEEE App	7
BiomedBench: A Benchmark Suite of TinyML Biomedical Applications for Low-Power Wearables	7
FPGA-Chain: Enabling Holistic Protection of FPGA Supply Chain With Blockchain Technology	7
SoC-GPIO-Based Dynamic Power Noise Control for Video Sensor Applications	7
Remembering Arvind	7
A Survey on Machine Learning Accelerators and Evolutionary Hardware Platforms	6
Traversal Packets: Opportunistic Bypass Packets for Deadlock Recovery	6
Evaluating 3D Flash Memory retention reliability under Temperature Elevation	6
Voltage–Resistance-Adaptive MPPT Circuit for Energy Harvesting	6
On the Relation Between Reliability and Entropy in Physical Unclonable Functions	6
CaSA: End-to-End Quantitative Security Analysis of Randomly Mapped Caches	6
Special Issue on Approximate Computing: Challenges, Methodologies, Algorithms, and Architectures for Dependable and Secure Systems	6
Get in the Conversation!	5
Attack of the AI Papers	5
IEEE Design & Test Publication Information	5
A Tutorial on Secure and Efficient Firmware Delivery	5
A Brief 20-Year History and Future Perspectives on Sizing and Layout Synthesis of Analog/RF ICs	5
Front Cover	5
Special Issue on TinyML	5
IEEE Membership	5
Robust and Secure Systems	5
20 Years of IEEE CEDA and More of EDA	5
TechRxiv	5
Recap of the 62nd ACM/IEEE Design Automation Conference (DAC62): The “Chips to Systems Conference”	5
IEEE Design & Test Publication Information	5
Dynamically Reconfigurable Network Protocol for Shape-Changeable Computer System	5
Table of Contents	5
Binary Forward-Only Algorithms	5
Physical Design for Heterogeneous Integration: Challenges and Opportunities	5
Circuits to Systems: Codesigning Efficient AI Hardware	5
Special Issue Dedicated to the 2024 Symposium on Integrated Circuits and Systems Design (SBCCI)	4
Estimating Code Vulnerability to Timing Errors Via Microarchitecture-Aware Machine Learning	4
IEEE Membership	4
IEEE Connects You to a Universe of Information!	4
Front Cover	4

Novel Technique for Manufacturing, System-Level, and In-System Testing of Large SoC Using Functional Protocol-Based High-Speed I/O	4
Special Issue on Design and Test of Multidie Packages	4
Recap of the 61st ACM/IEEE Design Automation Conference (DAC61): The “Chips to Systems Conference”	4
A BIST Approach to Approximate Co-Testing of Embedded Data Converters	4
The 28th IEEE European Test Symposium	4
ISLPED 2023: International Symposium on Low-Power Electronics and Design	4
Table of Contents	4
Functional Verification of a RISC-V Vector Accelerator	4
Using STLs for Effective In-Field Test of GPUs	4
CAFEEN: A Cooperative Approach for Energy-Efficient NoCs With Multiagent Reinforcement Learning	3
Residual Structural Traces in Logic Locking: Insights from Redundancy Analysis and Beyond	3
Special Issue on Top Picks in Test and Reliability	3
A Global Self-Repair Method for TSV Arrays With Adaptive FNS-CAC Codec	3
Heuristic-Based Algorithms for Low-Complexity AV1 Intraprediction	3
The Future of Design for Test and Silicon Lifecycle Management	3
IEEE Design & Test Publication Information	3
Edge AI—An Industry View	3
Table of Contents	3
Testing for Electromigration in Sub-5-nm FinFET Memories	3
Table of Contents	3
Strange Loops in Design and Technology: 59th DAC Keynote Speech	3
Long-Wire Leakage: The Threat of Crosstalk	3
Table of Contents	3
SeMAP—A Method to Secure the Communication in NoC-Based Many-Cores	3
Seamless Thermal Optimization of Parallel Workloads	3
IEEE Design & Test Publication Information	3
Report on the 2025 Embedded Systems Week (ESWEEK)	3
Ethical Design of Computers: From Semiconductors to IoT and Artificial Intelligence	2
EAVREF: An Evolutionary-Algorithm-Based Tool for Low-Power CMOS Voltage Reference Designs	2
Special Issue on NOCS 2022	2
SoCProbe: Compositional Post-Silicon Validation of Heterogeneous NoC-Based SoCs	2
Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and Correction	2
IEEE Design & Test Publication Information	2
Front Cover	2
IEEE App	2
Silicon Lifecycle Management (SLM): Requirements, Trends, and Opportunities	2
This Stuff Is Great—Am I Right?	2
Virtualizing USB Kernel Mode Debug (KMD) Class to Guest OS for Native OS-Like Debug Experience	2
Recap of the 29th ACM/IEEE International Symposium on Low Power Electronics and Design (ISLPED’24)	2
SAFER: Safety Assurances for Emergent Behavior	2
Learning Your Lock: Exploiting Structural Vulnerabilities in Logic Locking	2
Majority-Logic-Based Self-Checking Adder in Quantum-Dot Cellular Automata	2
Analysis and Mitigation of DRAM Faults in Sparse-DNN Accelerators	2
VioNet: A Hierarchical Detailed Routing Wire-Short Violation Predictor Based on a Convolutional Neural Network	2
IEEE Foundation	2
Special Issue on Wearable IoT Devices for Reliable Mobile Health Applications	2
IEEE Membership	2
Shaping Resilient AI Hardware Through DNN Computational Feature Exploitation	2
3-D Ferroelectric NAND In-Storage Processing Architecture for Mass Spectrometry	2
Leveraging RISC-V for HW/SW Codesign of Flexible and Efficient TinyML SoCs	2
Special Issue on the 2023 International Symposium on Networks-on-Chip (NOCS 2023)	2
Front Cover	2
Special Issue on Emerging Challenges With 3-D NAND Flash Storage	2
Is There an Answer?	2
On the Origin of AI Species	2
An EMG Denoising Method Based on Flexible Wearable Sensors	2
Postquantum Cryptography for Internet of Things	2
Guest Editors’ Introduction: SBCCI 2023	2
Rethinking SoC Verification for Secure Cross-Layer Interactions	2
Building an Open-Source DNA Assembler Device	2
Front Cover	2
SBCCI 2022	2
GlucoseHD: Predicting Glucose Levels Using Hyperdimensional Computing	2
ISLPED 2022: An Experience of a Hybrid Conference in the Time of COVID-19	1
The 41st IEEE VLSI Test Symposium	1
Get in the Conversation!	1
TechRxiv: Share Your Preprint Research With the World!	1
Silent Data Corruption by 10× Test Escapes Threatens Reliable Computing	1
IEEE Connects You to a Universe of Information!	1
IEEE Membership	1
IEEE Design & Test Publication Information	1
Conference Report ICCAD 2025: First Time Outside the USA and a Record-Breaking Edition	1
Spectre Returns! Speculation Attacks Using the Return Stack Buffer	1
Report on the 2024 Embedded Systems Week (ESWEEK)	1
Special Issue on Benchmarking Machine Learning Systems and Applications	1
Table of Contents	1
IEEE Membership	1
Special Issue on the First IEEE Top Picks in VLSI Test and Reliability Workshop	1
Machine Learning for CAD/EDA	1
Challenges in Assessing and Improving Deep Neural Networks’ Reliability	1

Table of Contents	1
Understanding Error Propagation in Deep-Learning Neural Networks’ Accelerators and Applications	1
Fair and Comprehensive Benchmarking of Machine Learning Processing Chips	1
Get in the Conversation!	1
Guest Editors’ Introduction: Special Issue on Design and Test of Multidie Packages	1
Deadlock-Freedom in Computational Neuroscience Simulators	1
A Growing and Thriving Electronic Design, Automation, and Test Community: A DATE 2025 Perspective	1
Special Issue on 20 Years of IEEE CEDA	1
Analytical Model for Performance Evaluation of Token-Passing-Based WiNoCs	1
40th IEEE VLSI Test Symposium 2022	1
IEEE Design & Test Publication Information	1
A Coding Efficiency-Aware Hardware Design for VVC Affine Motion Estimation Reconstructor	1
IEEE Design & Test Publication Information	1
IEEE App	1
Furthering Moore’s Law Integration Benefits in the Chiplet Era	1
Full Key Extraction of SNOW-V Using ML-Assisted Power SCA	1
Impact of Partial TMR on RISC-V Processor Reliability	1
Quantum-Safe Internet of Things	1
Table of Contents	1
Crypto-DSEDA: A Domain-Specific EDA Flow for CiM-Based Cryptographic Accelerators	1
Exploring Asymmetric Autoencoder Architectures for Computationally Efficient Neural Image Compression	1
The VCR Effect in Active-RC Continuous-Time Sigma–Delta Modulators	1
Product Health Insights Using Telemetry	1
Reverse-Engineering CNN Models Using Side-Channel Attacks	1
Background Receiver IQ Imbalance Correction for In-Field Testing	1
Machine Learning in Advanced IC Design: A Methodological Survey	1
Fully Microstrip Three-Port Circuit Bandpass NGD Design and Test	1
Front Cover	0
Addressing the Cross-Temperature Issue in 3-D NAND Flash Memories: Characterization and Mitigation for Solid-State Drives	0
IEEE Design & Test Publication Information	0
Memory Usage Estimation for Dataflow-Model-Based Software Development Methodology	0
Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements	0
Indirect Test Pattern Generation for Mixed-Signal Circuits Using Machine Learning	0
Postpandemic Conferences: The DATE 2023 Experience	0
Open-Source Multilevel Converter Power IC Design and Test	0
Dependable STT-MRAM With Emerging Approximation and Speculation Paradigms	0
IEEE Design & Test Publication Information	0
A Hardware Accelerator for Language-Guided Reinforcement Learning	0
Can Model-Level Fault Tolerance be Enough for DNN Hardware Accelerators? A Study	0
PiN: Processing in Network-on-Chip	0
IEEE Membership	0
Low-Power High-Throughput Architecture for AV1 Arithmetic Decoder	0
Fuzzing for Automated SoC Security Verification: Challenges and Solution	0
FALCON: An FPGA Emulation Platform for Domain-Specific SoCs (DSSoCs)	0
Testability and Dependability of AI Hardware: Survey, Trends, Challenges, and Perspectives	0
SBCCI 2024	0
Threat Detection in NoC-Based Manycores Using Lightweight Machine-Learning Models	0
Efficient Aspect Verification and Debugging of High-Performance Microprocessor Designs	0
Affordable and Comprehensive Testing of 3-D Stacked Die Devices	0
Self-Sustainable Wearable and Internet of Things (IoT) Devices for Health Monitoring: Opportunities and Challenges	0
Graph-Based Circuit Simulator for Switched Capacitor Circuits	0
Design Challenges of Intrachiplet and Interchiplet Interconnection	0
Front Cover	0
Table of Contents	0
Secure Interposer-Based Heterogeneous Integration	0
Time-Bomb HLS Trojan for Performance Degradation Payload	0
Exploring Resilience of LPDRAM Against RowHammer	0
Lynn Conway: Two Remembrances	0
Machine Learning for CAD/EDA: The Road Ahead	0
Front Cover	0
TechRxiv: Share Your Preprint Research With the World!	0
LATTE: Library Attack for Evaluating Hardware IP Protections Against Reverse Engineering	0
Workload-Aware Periodic Interconnect BIST	0
TechRxiv: Share Your Preprint Research With the World!	0
IEEE Design & Test Publication Information	0
Front Cover	0
Erratum to “Ethical Design of Computers: From Semiconductors to IoT and Artificial Intelligence”	0
Linear Algorithmic Checksums for Deep-Neural-Network Error Detection: Fundamentals and Recent Advancements	0
Table of Contents	0
Using Approximate Circuits Against Hardware Trojans	0
SIT: Stochastic Input Transformation to Defend Against Adversarial Attacks on Deep Neural Networks	0
Table of Contents	0
Interview With Yao-Wen Chang	0
Toward Attention-Based TinyML: A Heterogeneous Accelerated Architecture and Automated Deployment Flow	0
API-Based Hardware Fault Simulation for DNN Accelerators	0
Hard-Sign: A Hardware Watermarking Scheme Using Dated Handwritten Signature	0
Standing on the Shoulders of …	0
Efficient Privacy-Aware Federated Learning by Elimination of Downstream Redundancy	0
Our Gated Community	0
HPC-Based Malware Detectors Actually Work: Transition to Practice After a Decade of Research	0
Remote Power Side- Channel Attacks on FPGAs	0
On the Implementation of Fixed-Point Exponential Function for Machine Learning and Signal- Processing Accelerators	0
IEEE Design & Test Publication Information	0
Tree-Based Unidirectional Neural Networks for Low-Power Computer Vision	0
A NoC-Based Spatial DNN Inference Accelerator With Memory-Friendly Dataflow	0
Special Issue on 2021 Top Picks in Hardware and Embedded Security	0
IEEE Membership	0
Front Cover	0
Front Cover	0
IEEE Design & Test Publication Information	0
Get in the Conversation!	0
Get in the Conversation!	0
ELEMENT: Energy-Efficient Multi-NoP Architecture for IMC-Based 2.5-D Accelerator for DNN Training	0
ViT-Reg: Regression-Focused Hardware-Aware Fine-Tuning for ViT on TinyML Platforms	0
Testing for Multiple Faults in Deep Neural Networks	0