OOIR: Observatory of International Research

Papers

(The TQCC of IEEE Design & Test is 2. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-11-01 to 2025-11-01.)

Article	Citations
ISLPED 2021: The 25th Anniversary!	60
IEEE Foundation	53
Top Picks in Hardware and Embedded Security 2022	48
Flexible and Portable Management of Secure Scan Implementations Exploiting P1687.1 Extensions	39
An Energy-Aware Nanoscale Design of Reversible Atomic Silicon Based on Miller Algorithm	32
Special Issue on the 2023 Symposium on Integrated Circuits and Systems Design	30
On Backside Probing Techniques and Their Emerging Security Threats	24
BHT-NoC: Blaming Hardware Trojans in NoC Routers	21
SPOCK: Reverse Packet Traversal for Deadlock Recovery	21
Proceedings of the IEEE	19
ISCA: Intelligent Sense-Compute Adaptive Co-Optimization of Multimodal Machine Learning Kernels for Resilient mHealth Services on Wearables	18
Tipping the Balance: Imbalanced Classes in Deep-Learning Side-Channel Analysis	17
IEEE Connects You to a Universe of Information!	17
Improvement of Functional Safety of the Level-Crossing Barrier Machine by a Noninvasive Angle-Detection Method	17
Report on the 28th Asia and South Pacific Design Automation Conference	17
Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond	15
Front Cover	14
IC Phone Home!	14
An Open-Source 12-bit 10-kS/s Incremental ADC in 130-nm CMOS	14
Soft and Hard Error-Correction Techniques in STT-MRAM	14
On the Impact of Uncertainties in Silicon-Photonic Neural Networks	14
The 2022 International Conference on Computer-Aided Design (ICCAD)	14
Special Issue on Wearable IoT Devices for Reliable Mobile Health Applications	13
edAttack: Hardware Trojan Attack on On-Chip Packet Compression	13
FlooNoC: A Multi-Tb/s Wide NoC for Heterogeneous AXI4 Traffic	13

IEEE Design&Test Publication Information	11
IEEE.tv	10
Table of Contents	10
Blank Page	9
Energy-Efficient and Error-Resilient Cognitive I/O for 3-D-Integrated Manycore Microprocessors	9
Datapath Extension of NPUs to Support Nonconvolutional Layers Efficiently	9
IEEE Design & Test Publication Information	9
The Memory Shuffle	9
Get in the Conversation!	8
Eavesdropping Attack Detection Using Machine Learning in Network-on-Chip Architectures	8
Fault-Tolerant Neuromorphic Computing With Memristors Using Functional ATPG for Efficient Recalibration	8
Hardware/Software Coexploration for Hyperdimensional Computing on Network-on-Chip Architecture	8
Table of Contents	7
IEEE Design & Test Publication Information	7
Analog-to-Digital Converter Design Exploration for Compute-in-Memory Accelerators	7
TTTC News	7
Stochastic Computing for Neuromorphic Applications	7
Remembering Arvind	7
Special Issue on the 2021 Workshop on Top Picks in Hardware and Embedded Security	7
SOC-GPIO-Based Dynamic Power Noise Control for Video Sensor Applications	7
FPGA-Chain: Enabling Holistic Protection of FPGA Supply Chain With Blockchain Technology	6
A Survey on Machine Learning Accelerators and Evolutionary Hardware Platforms	6
Special Issue on Approximate Computing: Challenges, Methodologies, Algorithms, and Architectures for Dependable and Secure Systems	6
Verification Approaches for Learning-Enabled Autonomous Cyber–Physical Systems	6
On the Relation Between Reliability and Entropy in Physical Unclonable Functions	6
CaSA: End-to-End Quantitative Security Analysis of Randomly Mapped Caches	6
Traversal Packets: Opportunistic Bypass Packets for Deadlock Recovery	6
BiomedBench: A Benchmark Suite of TinyML Biomedical Applications for Low-Power Wearables	6
CLEAR Cross-Layer Resilience: A Retrospective	6
Power-Quality Configurable Hardware Design for AV1 Directional Intraframe Prediction	6
IEEE Membership	6
Accuracy-Configurable 2-D Gaussian Filter Architecture for Energy-Efficient Image Processing	5
Embracing Stochasticity to Enable Neuromorphic Computing at the Edge	5
IEEE Membership	5
Special Issue on TinyML	5
Get in the Conversation!	5
Attack of the AI Papers	5
IEEE Design & Test Publication Information	5
Voltage–Resistance-Adaptive MPPT Circuit for Energy Harvesting	5
Robust and Secure Systems	5
Dynamically Reconfigurable Network Protocol for Shape-Changeable Computer System	5
Estimating Code Vulnerability to Timing Errors Via Microarchitecture-Aware Machine Learning	4
Binary Forward-Only Algorithms	4
Computing-In-Memory Using Ferroelectrics: From Single- to Multi-Input Logic	4
ISLPED 2023: International Symposium on Low-Power Electronics and Design	4
IEEE Membership	4
Functional Verification of a RISC-V Vector Accelerator	4
Design for Test With Unreliable Memories by Restoring the Beauty of Randomness	4
Table of Contents	4
Front Cover	4

Novel Technique for Manufacturing, System-Level, and In-System Testing of Large SoC Using Functional Protocol-Based High-Speed I/O	4
Table of Contents	4
CAFEEN: A Cooperative Approach for Energy-Efficient NoCs With Multiagent Reinforcement Learning	4
The 28th IEEE European Test Symposium	4
Guest Editors’ Introduction: SBCCI 2020	4
Special Issue on Design and Test of Multidie Packages	4
IEEE Design & Test Publication Information	4
Recap of the 61st ACM/IEEE Design Automation Conference (DAC61): The “Chips to Systems Conference”	4
Front Cover	4
Using STLs for Effective In-Field Test of GPUs	4
Table of Contents	3
IEEE Design & Test Publication Information	3
The Future of Design for Test and Silicon Lifecycle Management	3
EAVREF: An Evolutionary Algorithm Based Tool for Low-Power CMOS Voltage Reference Designs	3
SeMAP—A Method to Secure the Communication in NoC-Based Many-Cores	3
Learning Your Lock: Exploiting Structural Vulnerabilities in Logic Locking	3
Heuristic-Based Algorithms for Low-Complexity AV1 Intraprediction	3
IEEE Design&Test Is Going Paperless in 2022!	3
Table of Contents	3
A Global Self-Repair Method for TSV Arrays With Adaptive FNS-CAC Codec	3
Table of Contents	3
IEEE Connects You to a Universe of Information!	3
Special Issue on Top Picks in Test and Reliability	3
Long-Wire Leakage: The Threat of Crosstalk	3
Testing for Electromigration in Sub-5-nm FinFET Memories	3
Special Issue on the 2023 International Symposium on Networks-on-Chip (NOCS 2023)	3
A BIST Approach to Approximate Co-Testing of Embedded Data Converters	3
Table of Contents	3
Edge AI—An Industry View	3
SAFER: Safety Assurances for Emergent Behavior	3
IEEE Design & Test Publication Information	3
Seamless Thermal Optimization of Parallel Workloads	3
Strange Loops in Design and Technology: 59th DAC Keynote Speech	3
Front Cover	3
IEEE App	2
Postquantum Cryptography for Internet of Things	2
Special Issue on NOCS 2022	2
SoCProbe: Compositional Post-Silicon Validation of Heterogeneous NoC-Based SoCs	2
Majority-Logic-Based Self-Checking Adder in Quantum-Dot Cellular Automata	2
Real-Time Requirements for ADAS Platforms Featuring Shared Memory Hierarchies	2
Leveraging RISC-V for HW/SW Codesign of Flexible and Efficient TinyML SoCs	2
TTTC News	2
Analysis and Mitigation of DRAM Faults in Sparse-DNN Accelerators	2
Special Issue on Near-Memory and In-Memory Processing	2
Guest Editors’ Introduction: SBCCI 2023	2
Front Cover	2
SBCCI 2022	2
Shaping Resilient AI Hardware Through DNN Computational Feature Exploitation	2
Ethical Design of Computers: From Semiconductors to IoT and Artificial Intelligence	2
Silicon Lifecycle Management (SLM): Requirements, Trends, and Opportunities	2
GlucoseHD: Predicting Glucose Levels Using Hyperdimensional Computing	2
IEEE Membership	2
VioNet: A Hierarchical Detailed Routing Wire-Short Violation Predictor Based on a Convolutional Neural Network	2
An EMG Denoising Method Based on Flexible Wearable Sensors	2
A Case for PIM Support in General-Purpose Compilers	2
3D Ferroelectric NAND In-Storage Processing Architecture for Mass Spectrometry	2
Is There an Answer?	2
Rethinking SoC Verification for Secure Cross-Layer Interactions	2
Recap of the 29th ACM/IEEE International Symposium on Low Power Electronics and Design (ISLPED’24)	2
Virtualizing USB Kernel Mode Debug (KMD) Class to Guest OS for Native OS-Like Debug Experience	2
This Stuff Is Great—Am I Right?	2
Building an Open-Source DNA Assembler Device	2
Special Issue on the First IEEE Top Picks in VLSI Test and Reliability Workshop	2
IEEE Design & Test Publication Information	2
Special Issue on Wearable IoT Devices for Reliable Mobile Health Applications	2