OOIR: Observatory of International Research

Papers

(The H4-Index of Advanced Electronic Materials is 41. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2022-06-01 to 2026-06-01.)

Article	Citations
Masthead: (Adv. Electron. Mater. 6/2022)	205
Anomalous Elastic Evolution Induced by Copper Hopping in van der Waals Ferroelectric CuInP₂S₆	192
Masthead: (Adv. Electron. Mater. 12/2023)	140
Poly(2‐vinylpyridine) as an Additive for Enhancing N‐Type Organic Thin‐Film Transistor Stability (Adv. Electron. Mater. 2/2024)	116
Weyl Fermion Manipulation Through Magnetic Transitions in the Ferromagnetic Non‐Centrosymmetric Weyl Semimetal PrAlSi	112
	108
Analog Hf_xZr_1‐xO₂ Memristors with Tunable Linearity for Implementation in a Self‐Organizing Map Neural Network (Adv. Electron. Mater. 4/2024)	99
Unraveling the Mechanism of the Light‐Triggered Synaptic Plasticity in Organic Photoelectric Synaptic Transistors	97
	90
Masthead: (Adv. Electron. Mater. 10/2023)	78
	73
	71
Liquid Metals in Radio Frequency Applications: A Review of Physics, Manufacturing, and Emerging Technologies	70
Performance Enhancement in Hafnium Oxide Through Homogeneous and Heterogeneous co‐Doping Strategies	67
Unveiling the Impact of the Electrolyte's Counter Ions on Organic Electrochemical Transistor Performance	62
Ultralow Electrical Current Driven Field‐Free Spin‐Orbit Torque Switching of Magnetic Tunnel Junctions by Topological Insulators	59
A Near‐Zero Index Metamaterial Lens for Reduced Complexity and High‐Performance Active Electronically Scanned Arrays	56
All‐Solution‐Processed Perovskite Light‐Emitting Transistors Enabled by a Fully Organic Architecture	56
A Deep Study of Resistance Switching Phenomena in TaO_x ReRAM Cells: System‐Theoretic Dynamic Route Map Analysis and Experimental Verification	55
Extraordinarily Weak Temperature Dependence of the Drain Current in Small‐Molecule Schottky‐Contact‐Controlled Transistors through Active‐Layer and Contact Interplay	55
Detection of Ice Formation With the Polymeric Mixed Ionic‐Electronic Conductor PEDOT: PSS for Aeronautics	55
MBE‐Grown ScAlN‐on‐Si Films: Enhancing In‐Plane Crystallinity for Extensional Mode BAW Resonators	55
Enhanced Resistive Switching Uniformity in Tantalum Oxide Memristor Devices via Copper Implantation	53
Aging and Electrical Stability of DNTT Honey‐Gated OFETs	53
Sustainable Soft Electronics Combining Recyclable Metal Nanowire Circuits and Biodegradable Gel Film Substrates	52

Transfer of Micro‐LEDs with Roll‐Based Direct Overlay Alignment for Manufacturing Transparent Displays	50
Oxygen Doping in Ferroelectric Wurtzite‐type Al_0.73Sc_0.27N: Improved Leakage and Polarity Control	49
Carrier Transport and Electrical Bandgaps in Epitaxial CrN Layers	48
Doping in Organic Semiconductors: Fundamentals, Materials, and Applications (Adv. Electron. Mater. 6/2026)	48
A Molecular Precursor‐Based Copper Antimony Sulfide Photodetector with Enhanced Performance by Silver Doping	45
Unraveling Abnormal Thermal Quenching of Sub‐Gap Emission in β‐Ga₂O₃	45
High‐Throughput Production of Electrically Conductive Yarn (E‐Yarn) for Smart Textiles	45
Semiconductor Membrane Exfoliation: Technology and Application	45
Issue Information	44
Wood‐Based Bioelectronics: Lignosulfonate‐Based Conductive Biocomposites for Paper Organic Electrochemical Transistors	44
Composition‐Dependent Ferroelectricity of LuFeO₃ Orthoferrite Thin Films	43
High β‐phase Poly(vinylidene fluoride) Using a Thermally Decomposable Molecular Splint	43
High‐Performance and Energy‐Efficient Sub‐5 nm 2D Double‐Gate MOSFETs Based on Silicon Arsenide Monolayers	43
Investigation of Optimum Deposition Conditions of Radio Frequency Reactive Magnetron Sputtering of Al_0.7Sc_0.3N Film with Thickness down to 20 nm	43
Three‐Terminal Memristor with Tunable Volatility and Set Voltage	43
Prediction and Elucidation of Physical Properties of Polycrystalline Materials Using Multichannel Machine Learning of Electron Backscattering Diffraction	42
Silicon Nitride Resistive Memories	41